Inventor · disambiguated record
Kenneth R. Smith
Also filed as: SMITH KENNETH · SMITH KENNETH G JR · SMITH KENNETH R · SMITH KENNETH ROBERT
64 granted patents·8 pending applications·2,553 citations·filing 1984–2017
99Inventor score
Top patents by PatentIndex Score
72 records- 0198US6256882B1Membrane probing systemCASCADE MICROTECH INC·Filed 1998·Granted Jul 10, 2001·118 cites·35 claims
- 0298US5914613AMembrane probing system with local contact scrubCASCADE MICROTECH INC·Filed 1996·Granted Jun 22, 1999·200 cites·15 claims
- 0397US7109731B2Membrane probing system with local contact scrubCASCADE MICROTECH INC·Filed 2005·Granted Sep 19, 2006·40 cites·15 claims
- 0497US6335628B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2001·Granted Jan 1, 2002·102 cites·5 claims
- 0597US6064217AFine pitch contact device employing a compliant conductive polymer bumpEPI TECHNOLOGIES INC·Filed 1996·Granted May 16, 2000·181 cites·24 claims
- 0696US6930498B2Membrane probing systemCASCADE MICROTECH INC·Filed 2004·Granted Aug 16, 2005·68 cites·1 claims
- 0796US6578264B1Method for constructing a membrane probe using a depressionCASCADE MICROTECH INC·Filed 2000·Granted Jun 17, 2003·96 cites·40 claims
- 0896US6492822B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2001·Granted Dec 10, 2002·64 cites·8 claims
- 0996US5475317ASingulated bare die tester and method of performing forced temperature electrical tests and burn-inEPI TECHNOLOGIES INC·Filed 1995·Granted Dec 12, 1995·192 cites·15 claims
- 1096US5345170AWafer probe station having integrated guarding, Kelvin connection and shielding systemsCASCADE MICROTECH INC·Filed 1992·Granted Sep 6, 1994·166 cites·7 claims
- 1195US9726626B2Quantum mechanical measurement deviceGEOMETRICS·Filed 2013·Granted Aug 8, 2017·46 cites·17 claims
- 1295US9726733B2Optical magnetometersGEOMETRICS·Filed 2015·Granted Aug 8, 2017·52 cites·17 claims
- 1395US7533462B2Method of constructing a membrane probeCASCADE MICROTECH INC·Filed 2006·Granted May 19, 2009·25 cites·15 claims
- 1495US7148711B2Membrane probing systemCASCADE MICROTECH INC·Filed 2005·Granted Dec 12, 2006·25 cites·1 claims
- 1595US6720782B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2002·Granted Apr 13, 2004·53 cites·8 claims
- 1694US7893704B2Membrane probing structure with laterally scrubbing contactsCASCADE MICROTECH INC·Filed 2009·Granted Feb 22, 2011·18 cites·34 claims
- 1794US7888957B2Probing apparatus with impedance optimized interfaceCASCADE MICROTECH INC·Filed 2008·Granted Feb 15, 2011·28 cites·13 claims
- 1894US7368927B2Probe head having a membrane suspended probeCASCADE MICROTECH INC·Filed 2005·Granted May 6, 2008·73 cites·38 claims
- 1994US6232788B1Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 1997·Granted May 15, 2001·98 cites·8 claims
- 2094US5663653AWafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 1995·Granted Sep 2, 1997·91 cites·15 claims
- 2194US4737028ATarget loop active boresighting deviceUS ARMY·Filed 1986·Granted Apr 12, 1988·81 cites·1 claims
- 2293US8451017B2Membrane probing method using improved contactGLEASON K REED·Filed 2010·Granted May 28, 2013·21 cites·21 claims
- 2393US8410806B2Replaceable coupon for a probing apparatusSMITH KENNETH R·Filed 2009·Granted Apr 2, 2013·20 cites·16 claims
- 2493US7266889B2Membrane probing systemCASCADE MICROTECH INC·Filed 2005·Granted Sep 11, 2007·20 cites·1 claims
- 2592US7589518B2Wafer probe station having a skirting componentCASCADE MICROTECH INC·Filed 2005·Granted Sep 15, 2009·10 cites·5 claims
- 2692US6708386B2Method for probing an electrical device having a layer of oxide thereonCASCADE MICROTECH INC·Filed 2001·Granted Mar 23, 2004·34 cites·9 claims
- 2791US7492147B2Wafer probe station having a skirting componentCASCADE MICROTECH INC·Filed 2007·Granted Feb 17, 2009·8 cites·10 claims
- 2891US7330023B2Wafer probe station having a skirting componentCASCADE MICROTECH INC·Filed 2005·Granted Feb 12, 2008·9 cites·4 claims
- 2991US6437584B1Membrane probing system with local contact scrubCASCADE MICROTECH INC·Filed 2000·Granted Aug 20, 2002·33 cites·83 claims
- 3090US6838890B2Membrane probing systemCASCADE MICROTECH INC·Filed 2000·Granted Jan 4, 2005·34 cites·36 claims
- 3190US5434512AWafer probe station having integrated guarding, Kelvin connection and shielding systemsCASCADE MICROTECH INC·Filed 1994·Granted Jul 18, 1995·73 cites·2 claims
- 3289US6860009B2Probe construction using a recessCASCADE MICROTECH INC·Filed 2001·Granted Mar 1, 2005·26 cites·29 claims
- 3388US7403025B2Membrane probing systemCASCADE MICROTECH INC·Filed 2006·Granted Jul 22, 2008·12 cites·6 claims
- 3487US7514944B2Probe head having a membrane suspended probeCASCADE MICROTECH INC·Filed 2008·Granted Apr 7, 2009·13 cites·38 claims
- 3586US7681312B2Membrane probing systemCASCADE MICROTECH INC·Filed 2007·Granted Mar 23, 2010·8 cites·11 claims
- 3686US7541821B2Membrane probing system with local contact scrubCASCADE MICROTECH INC·Filed 2007·Granted Jun 2, 2009·8 cites·34 claims
- 3786US7492175B2Membrane probing systemCASCADE MICROTECH INC·Filed 2008·Granted Feb 17, 2009·12 cites·6 claims
- 3886US4891585AMultiple lead probe for integrated circuits in wafer formTEKTRONIX INC·Filed 1986·Granted Jan 2, 1990·78 cites·9 claims
- 3983US7178236B2Method for constructing a membrane probe using a depressionCASCADE MICROTECH INC·Filed 2003·Granted Feb 20, 2007·21 cites·32 claims
- 4082US9874585B2Resilient electrical interposers, systems that include the interposers, and methods for using and forming the sameCASCADE MICROTECH INC·Filed 2015·Granted Jan 23, 2018·2 cites·11 claims
- 4181US9099449B2Resilient electrical interposers, systems that include the interposers, and methods for using and forming the sameCASCADE MICROTECH INC·Filed 2015·Granted Aug 4, 2015·2 cites·23 claims
- 4281US7723985B2Altered sweep bell-bloom magnetometerGEOMETRICS·Filed 2007·Granted May 25, 2010·10 cites·21 claims
- 4381US6307387B1Membrane probing system with local contact scrubCASCADE MICROTECH INC·Filed 1998·Granted Oct 23, 2001·28 cites·83 claims
- 4481US4628406AMethod of packaging integrated circuit chips, and integrated circuit packageTEKTRONIX INC·Filed 1985·Granted Dec 9, 1986·75 cites·8 claims
- 4578US4647959AIntegrated circuit package, and method of forming an integrated circuit packageTEKTRONIX INC·Filed 1985·Granted Mar 3, 1987·53 cites·11 claims
- 4677US7761986B2Membrane probing method using improved contactCASCADE MICROTECH INC·Filed 2003·Granted Jul 27, 2010·10 cites·6 claims
- 4777US7355420B2Membrane probing systemCASCADE MICROTECH INC·Filed 2002·Granted Apr 8, 2008·18 cites·6 claims
- 4876US6927585B2Membrane probing system with local contact scrubCASCADE MICROTECH INC·Filed 2002·Granted Aug 9, 2005·11 cites·82 claims
- 4972US6825677B2Membrane probing systemCASCADE MICROTECH INC·Filed 2001·Granted Nov 30, 2004·8 cites·23 claims
- 5071US9372214B2High frequency interconnect structures, electronic assemblies that utilize high frequency interconnect structures, and methods of operating the sameSTRID ERIC W·Filed 2012·Granted Jun 21, 2016·4 cites·35 claims
Showing the top 50 of 72 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →