Inventor · disambiguated record
Kenji Terao
Also filed as: TERAO KENJI
23 granted patents·7 pending applications·129 citations·filing 1994–2025
95Inventor score
Top patents by PatentIndex Score
30 records- 0194US7256405B2Sample repairing apparatus, a sample repairing method and a device manufacturing method using the same methodEBARA CORP·Filed 2005·Granted Aug 14, 2007·21 cites·17 claims
- 0287US8624182B2Electro-optical inspection apparatus and method with dust or particle collection functionWATANABE KENJI·Filed 2011·Granted Jan 7, 2014·7 cites·12 claims
- 0386US9966227B2Specimen observation method and device using secondary emission electron and mirror electron detectionEBARA CORP·Filed 2014·Granted May 8, 2018·5 cites·16 claims
- 0481US8937283B2Specimen observation method and device using secondary emission electron and mirror electron detectionHATAKEYAMA MASAHIRO·Filed 2009·Granted Jan 20, 2015·6 cites·6 claims
- 0578US8859984B2Method and apparatus for inspecting sample surfaceNOJI NOBUHARU·Filed 2013·Granted Oct 14, 2014·2 cites·12 claims
- 0678US8525127B2Method and apparatus for inspecting sample surfaceNOJI NOBUHARU·Filed 2012·Granted Sep 3, 2013·3 cites·10 claims
- 0773US7952071B2Apparatus and method for inspecting sample surfaceEBARA CORP·Filed 2007·Granted May 31, 2011·3 cites·4 claims
- 0873US7829853B2Sample surface observation methodEBARA CORP·Filed 2008·Granted Nov 9, 2010·3 cites·10 claims
- 0973US7496163B2AGC system, AGC method, and receiver using the AGC systemNEC CORP·Filed 2004·Granted Feb 24, 2009·13 cites·26 claims
- 1072US8148924B2Electrical motor load controller and control methods thereforOHKUWA YOSHIHIRO·Filed 2007·Granted Apr 3, 2012·16 cites·16 claims
- 1171US8274047B2Substrate surface inspection method and inspection apparatusNAITO YOSHIHIKO·Filed 2009·Granted Sep 25, 2012·4 cites·8 claims
- 1268US2025249239A1Vector Potential Coil Device That Applies Electrical Stimulation To SkinSUMIDA CORP·Filed 2025·Application pending·0 cites
- 1364US7039097B2CDMA receiver, path search method and programNEC CORP·Filed 2002·Granted May 2, 2006·8 cites·8 claims
- 1464US6663710B1Method for continuously pulling up crystalEBARA CORP·Filed 2000·Granted Dec 16, 2003·13 cites·11 claims
- 1560US9194826B2Electron beam apparatus and sample observation method using the sameKAGA TORU·Filed 2008·Granted Nov 24, 2015·1 cites·10 claims
- 1658US2009050802A1Method and apparatus for inspecting sample surfaceEBARA CORP·Filed 2007·Application pending·0 cites
- 1757US2023271006A1Method For Treating Living Body Using Electrical StimulatorSUMIDA CORP·Filed 2023·Application pending·0 cites
- 1856US9105444B2Electro-optical inspection apparatus and method with dust or particle collection functionEBARA CORP·Filed 2013·Granted Aug 11, 2015·0 cites·8 claims
- 1956US7254162B2CDMA receiver performing a path search, path search method, and program thereforNEC CORP·Filed 2002·Granted Aug 7, 2007·4 cites·15 claims
- 2055US7366263B2Radio communication terminal and radio signal receiving methodNEC CORP·Filed 2004·Granted Apr 29, 2008·3 cites·18 claims
- 2154US5539538AFacsimile machine having a single feeding path for document and recording sheetMATSUSHITA GRAPHIC COMMUNIC·Filed 1994·Granted Jul 23, 1996·14 cites·36 claims
- 2253US2025249247A1Electrical Stimulation Vector Potential Coil Device For Use In Ophthalmic TreatmentSUMIDA CORP·Filed 2025·Application pending·0 cites
- 2350US2025214458A1Moving body power supply system and moving body deviceSUMIDA CORP·Filed 2023·Application pending·0 cites
- 2448US10002740B2Inspection deviceEBARA CORP·Filed 2017·Granted Jun 19, 2018·0 cites·13 claims
- 2547US6471768B2Method of and apparatus for growing ribbon of crystalEBARA CORP·Filed 2001·Granted Oct 29, 2002·3 cites·13 claims
- 2646US10734827B2Power supply systemTOYOTA MOTOR CO LTD·Filed 2018·Granted Aug 4, 2020·0 cites·5 claims
- 2746US10446404B2Electron-beam irradiated area adjustment method and adjustment system, electron-beam irradiated region correction method, and electron beam irradiation apparatusEBARA CORP·Filed 2018·Granted Oct 15, 2019·0 cites·7 claims
- 2844US9852878B2Surface processing apparatusEBARA CORP·Filed 2015·Granted Dec 26, 2017·0 cites·8 claims
- 2943US2009152595A1Semiconductor devices and method of testing sameEBARA CORP·Filed 2006·Application pending·0 cites
- 3033US2002129760A1Method of and apparatus for pulling up crystalFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →