Inventor · disambiguated record
Kiyoyasu Hiwada
Also filed as: HIWADA KIYOYASU
17 granted patents·2 pending applications·134 citations·filing 1987–2015
92Inventor score
Top patents by PatentIndex Score
19 records- 0180US5289116AApparatus and method for testing electronic devicesHEWLETT PACKARD CO·Filed 1992·Granted Feb 22, 1994·54 cites·17 claims
- 0274US9164149B2Testing device and testing method for quantum battery using semiconductor probeDEWA HARUTADA·Filed 2011·Granted Oct 20, 2015·2 cites·20 claims
- 0371US9778284B2Semiconductor probe, testing device and testing method for testing quantum batteryDEWA HARUTADA·Filed 2012·Granted Oct 3, 2017·3 cites·22 claims
- 0465US10347893B2Secondary batteryNIHON MICRONICS KK·Filed 2013·Granted Jul 9, 2019·1 cites·5 claims
- 0554US5597982AElectrical connection structureHEWLETT PACKARD CO·Filed 1995·Granted Jan 28, 1997·16 cites·15 claims
- 0654US4833403AMethod and apparatus for measuring settling characteristics of a device under test by using a measurement system for measuring an input signal by sampling and digitizing said input signalHEWLETT PACKARD CO·Filed 1987·Granted May 23, 1989·16 cites·15 claims
- 0752US5051689ATest head with improved shieldingHEWLETT PACKARD CO·Filed 1990·Granted Sep 24, 1991·16 cites·6 claims
- 0852US2017131361A1Testing device and testing method for sheet-shaped cellNIHON MICRONICS KK·Filed 2014·Application pending·0 cites
- 0951US9748596B2Single layer secondary battery having a folded structureNIHON MICRONICS KK·Filed 2013·Granted Aug 29, 2017·0 cites·12 claims
- 1051US9735594B2Charging/discharging deviceNIHON MICRONICS KK·Filed 2013·Granted Aug 15, 2017·0 cites·19 claims
- 1150US10090507B2Secondary battery-mounted circuit chip and manufacturing method thereofNIHON MICRONICS KK·Filed 2014·Granted Oct 2, 2018·0 cites·15 claims
- 1248US9972862B2Secondary batteryNIHON MICRONICS KK·Filed 2013·Granted May 15, 2018·0 cites·6 claims
- 1346US9865908B2Electrode structure of solid type secondary batteryKUDOH Takuo·Filed 2012·Granted Jan 9, 2018·0 cites·16 claims
- 1446US5293080AMethod and apparatus for generating test waveforms to be applied to a device under testHEWLETT PACKARD CO·Filed 1992·Granted Mar 8, 1994·12 cites·12 claims
- 1542US5404564AHigh speed data train generating system with no restriction on length of generated data trainHEWLETT PACKARD CO·Filed 1994·Granted Apr 4, 1995·7 cites·12 claims
- 1641US10036780B2Evaluation apparatus and evaluation method of sheet type cellDEWA HARUTADA·Filed 2011·Granted Jul 31, 2018·0 cites·14 claims
- 1739US4975639ATest head with improved shieldingHEWLETT PACKARD CO·Filed 1988·Granted Dec 4, 1990·7 cites·1 claims
- 1831US9799927B2Repair apparatus of sheet type cellHIWADA KIYOYASU·Filed 2011·Granted Oct 24, 2017·0 cites·11 claims
- 1931US2017098870A1BatteryNIHON MICRONICS KK·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →