Inventor · disambiguated record
Kosuke Fujihara
Also filed as: FUJIHARA KOSUKE
8 granted patents·2 citations·filing 2014–2017
72Inventor score
Top patents by PatentIndex Score
8 records- 0167US9829509B2Probe guide plate and semiconductor inspection apparatusSHINKO ELECTRIC IND CO·Filed 2014·Granted Nov 28, 2017·2 cites·7 claims
- 0253US10139430B2Probe guide, probe card, and method for probe guide manufacturingJAPAN ELECTRONIC MAT CORPORATION·Filed 2017·Granted Nov 27, 2018·0 cites·7 claims
- 0352US9523716B2Probe guide plate and method for manufacturing the sameSHINKO ELECTRIC IND CO·Filed 2014·Granted Dec 20, 2016·0 cites·11 claims
- 0451US10386387B2Probe guide plate and probe deviceSHINKO ELECTRIC IND CO·Filed 2017·Granted Aug 20, 2019·0 cites·13 claims
- 0551US9459287B2Guide plate for probe cardJAPAN ELECTRONIC MATERIALS·Filed 2014·Granted Oct 4, 2016·0 cites·9 claims
- 0643US10261110B2Probe guide plate having a silicon oxide layer formed on surfaces and on an inner wall of a through hole thereof, and a protective insulating layer formed on the silicon oxide layer, and probe apparatus including the probe guide plateSHINKO ELECTRIC IND CO·Filed 2016·Granted Apr 16, 2019·0 cites·9 claims
- 0739US10309988B2Probe guide plate and probe deviceSHINKO ELECTRIC IND CO·Filed 2017·Granted Jun 4, 2019·0 cites·5 claims
- 0836US9434604B2Cap, semiconductor device including the cap, and manufacturing method thereforSHINKO ELECTRIC IND CO·Filed 2015·Granted Sep 6, 2016·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →