Inventor · disambiguated record
Kourosh Nafisi
Also filed as: NAFISI KOUROSH
7 granted patents·2 pending applications·70 citations·filing 2004–2024
81Inventor score
Files withAPPLIED MATERIALS INC2IBM2SIEG STUART A2APPLIED MATERIALS ISRAEL LTD1KLA TENCOR TECH CORP1
Top patents by PatentIndex Score
9 records- 0193US8111900B2Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticleWU KENONG·Filed 2010·Granted Feb 7, 2012·27 cites·17 claims
- 0289US7729529B2Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticleKLA TENCOR TECH CORP·Filed 2004·Granted Jun 1, 2010·39 cites·19 claims
- 0374US10347462B2Imaging of crystalline defectsAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Jul 9, 2019·2 cites·20 claims
- 0468US7397556B2Method, apparatus, and computer program product for optimizing inspection recipes using programmed defectsIBM·Filed 2006·Granted Jul 8, 2008·2 cites·6 claims
- 0567US2025003742A1Enhanced cross sectional features measurement methodologyAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 0658US12123708B2Enhanced cross sectional features measurement methodologyAPPLIED MATERIALS INC·Filed 2020·Granted Oct 22, 2024·0 cites·20 claims
- 0755US2008225284A1Method, apparatus, and computer program product for optimizing inspection recipes using programmed defectsIBM·Filed 2008·Application pending·0 cites
- 0844US8450120B2SEM repair for sub-optimal featuresSIEG STUART A·Filed 2012·Granted May 28, 2013·0 cites·11 claims
- 0944US8211717B1SEM repair for sub-optimal featuresSIEG STUART A·Filed 2011·Granted Jul 3, 2012·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →