Inventor · disambiguated record
Kwok Ng
Also filed as: NG KWOK · NG KWOK-CHOI
3 granted patents·1 pending application·9 citations·filing 2014–2016
60Inventor score
Top patents by PatentIndex Score
4 records- 0189US9310320B2Based sampling and binning for yield critical defectsKLA TENCOR CORP·Filed 2014·Granted Apr 12, 2016·8 cites·33 claims
- 0265US9563943B2Based sampling and binning for yield critical defectsKLA TENCOR CORP·Filed 2016·Granted Feb 7, 2017·1 cites·19 claims
- 0353US2017103517A1Design Based Sampling and Binning for Yield Critical DefectsKLA TENCOR CORP·Filed 2016·Application pending·0 cites
- 0436US9772975B2Hybrid table-lookup algorithm for functionsORACLE INT CORP·Filed 2015·Granted Sep 26, 2017·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →