Inventor · disambiguated record
Kyle Brown
Also filed as: BROWN JR KYLE A · BROWN KYLE · BROWN KYLE A · BROWN KYLE ALEXANDER
60 granted patents·13 pending applications·3,511 citations·filing 1996–2025
99Inventor score
Top patents by PatentIndex Score
73 records- 0199US6633831B2Methods and systems for determining a critical dimension and a thin film characteristic of a specimenKLA TENCOR TECHNOLOGIES·Filed 2001·Granted Oct 14, 2003·362 cites·82 claims
- 0298US7156854B2Lens delivery systemALCON INC·Filed 2003·Granted Jan 2, 2007·203 cites·18 claims
- 0398US6891627B1Methods and systems for determining a critical dimension and overlay of a specimenKLA TENCOR TECH CORP·Filed 2001·Granted May 10, 2005·192 cites·100 claims
- 0498US6694284B1Methods and systems for determining at least four properties of a specimenKLA TENCOR TECH CORP·Filed 2001·Granted Feb 17, 2004·211 cites·61 claims
- 0597US8179530B2Methods and systems for determining a critical dimension and overlay of a specimenLEVY ADY·Filed 2010·Granted May 15, 2012·143 cites·24 claims
- 0697US6812045B1Methods and systems for determining a characteristic of a specimen prior to, during, or subsequent to ion implantationKLA TENCOR INC·Filed 2001·Granted Nov 2, 2004·97 cites·52 claims
- 0797US6673637B2Methods and systems for determining a presence of macro defects and overlay of a specimenKLA TENCOR TECHNOLOGIES·Filed 2001·Granted Jan 6, 2004·120 cites·83 claims
- 0896US7751046B2Methods and systems for determining a critical dimension and overlay of a specimenKLA TENCOR TECH CORP·Filed 2003·Granted Jul 6, 2010·79 cites·13 claims
- 0996US7139083B2Methods and systems for determining a composition and a thickness of a specimenKLA TENCOR TECH CORP·Filed 2001·Granted Nov 21, 2006·68 cites·62 claims
- 1096US6987572B2Methods and systems for lithography process controlKLA TENCOR TECH CORP·Filed 2003·Granted Jan 17, 2006·143 cites·26 claims
- 1196US6917433B2Methods and systems for determining a property of a specimen prior to, during, or subsequent to an etch processKLA TENCOR TECH CORP·Filed 2001·Granted Jul 12, 2005·61 cites·56 claims
- 1296US6806951B2Methods and systems for determining at least one characteristic of defects on at least two sides of a specimenKLA TENCOR TECH CORP·Filed 2001·Granted Oct 19, 2004·65 cites·74 claims
- 1395US8502979B2Methods and systems for determining a critical dimension and overlay of a specimenLEVY ADY·Filed 2012·Granted Aug 6, 2013·24 cites·8 claims
- 1495US7196782B2Methods and systems for determining a thin film characteristic and an electrical property of a specimenKLA TENCOR TECH CORP·Filed 2001·Granted Mar 27, 2007·56 cites·71 claims
- 1595US7006235B2Methods and systems for determining overlay and flatness of a specimenKLA TENCOR TECH CORP·Filed 2001·Granted Feb 28, 2006·48 cites·71 claims
- 1695US6950196B2Methods and systems for determining a thickness of a structure on a specimen and at least one additional property of the specimenKLA TENCOR TECH CORP·Filed 2001·Granted Sep 27, 2005·50 cites·73 claims
- 1795US6919957B2Methods and systems for determining a critical dimension, a presence of defects, and a thin film characteristic of a specimenKLA TENCOR TECH CORP·Filed 2001·Granted Jul 19, 2005·110 cites·90 claims
- 1895US6917419B2Methods and systems for determining flatness, a presence of defects, and a thin film characteristic of a specimenKLA TENCOR TECH CORP·Filed 2001·Granted Jul 12, 2005·51 cites·88 claims
- 1995US6891610B2Methods and systems for determining an implant characteristic and a presence of defects on a specimenKLA TENCOR TECH CORP·Filed 2001·Granted May 10, 2005·48 cites·87 claims
- 2095US6829559B2Methods and systems for determining a presence of macro and micro defects on a specimenK L A TENCOR TECHNOLOGIES·Filed 2001·Granted Dec 7, 2004·103 cites·80 claims
- 2194US7106425B1Methods and systems for determining a presence of defects and a thin film characteristic of a specimenKLA TENCOR TECH CORP·Filed 2001·Granted Sep 12, 2006·71 cites·86 claims
- 2294US6946394B2Methods and systems for determining a characteristic of a layer formed on a specimen by a deposition processKLA TENCOR TECHNOLOGIES·Filed 2001·Granted Sep 20, 2005·43 cites·64 claims
- 2394US6782337B2Methods and systems for determining a critical dimension an a presence of defects on a specimenKLA TENCOR TECH CORP·Filed 2001·Granted Aug 24, 2004·85 cites·83 claims
- 2494US6689519B2Methods and systems for lithography process controlKLA TENCOR TECH CORP·Filed 2001·Granted Feb 10, 2004·75 cites·28 claims
- 2592US6280299B1Combined slurry dispenser and rinse armAPPLIED MATERIALS INC·Filed 2000·Granted Aug 28, 2001·54 cites·25 claims
- 2691US6818459B2Methods and systems for determining a presence of macro defects and overlay of a specimenKLA TENCOR TECH CORP·Filed 2003·Granted Nov 16, 2004·48 cites·47 claims
- 2790US10588780B2Intraocular lens injectorNOVARTIS AG·Filed 2016·Granted Mar 17, 2020·12 cites·8 claims
- 2890US6139406ACombined slurry dispenser and rinse arm and method of operationAPPLIED MATERIALS INC·Filed 1997·Granted Oct 31, 2000·103 cites·50 claims
- 2989US9927052B1Sanitary clamp with concealed threadsFELDMEIER EQUIPMENT INC·Filed 2016·Granted Mar 27, 2018·17 cites·12 claims
- 3088US10568735B2Intraocular lens injectorNOVARTIS AG·Filed 2017·Granted Feb 25, 2020·8 cites·16 claims
- 3186US2025366984A1Intraocular lens injectorALCON INC·Filed 2025·Application pending·0 cites
- 3284US7349090B2Methods and systems for determining a property of a specimen prior to, during, or subsequent to lithographyKLA TENCOR TECH CORP·Filed 2001·Granted Mar 25, 2008·24 cites·9 claims
- 3383US11567085B2Photo-cleavable surfactantsWISCONSIN ALUMNI RES FOUND·Filed 2019·Granted Jan 31, 2023·2 cites·20 claims
- 3483US6010510APlungerALCON LAB INC·Filed 1998·Granted Jan 4, 2000·230 cites·2 claims
- 3583US2025339264A1Intraocular lens injectorALCON INC·Filed 2025·Application pending·0 cites
- 3682US7130029B2Methods and systems for determining an adhesion characteristic and a thickness of a specimenKLA TENCOR TECH CORP·Filed 2001·Granted Oct 31, 2006·27 cites·67 claims
- 3781US11413187B2Intraocular lens injectorALCON INC·Filed 2020·Granted Aug 16, 2022·1 cites·7 claims
- 3881US11000367B2Intraocular lens injectorNOVARTIS AG·Filed 2017·Granted May 11, 2021·7 cites·13 claims
- 3980US7460981B2Methods and systems for determining a presence of macro and micro defects on a specimenKLA TENCOR TECH CORP·Filed 2004·Granted Dec 2, 2008·11 cites·79 claims
- 4079US6241588B1Cavitational polishing pad conditionerAPPLIED MATERIALS INC·Filed 2000·Granted Jun 5, 2001·15 cites·17 claims
- 4177US12390325B2Intraocular lens injectorALCON INC·Filed 2023·Granted Aug 19, 2025·0 cites·20 claims
- 4277US12390365B2Intraocular lens injectorALCON INC·Filed 2022·Granted Aug 19, 2025·0 cites·20 claims
- 4374US12304884B2Photo-cleavable surfactantsWISCONSIN ALUMNI RES FOUND·Filed 2022·Granted May 20, 2025·0 cites·6 claims
- 4474US8377076B2Lens delivery systemNOVARTIS AG·Filed 2010·Granted Feb 19, 2013·9 cites·6 claims
- 4574US5947976AAsymmetric intraocular lens injection cartridgeALCON LAB INC·Filed 1998·Granted Sep 7, 1999·120 cites·10 claims
- 4673US6332470B1Aerosol substrate cleanerFiled 1997·Granted Dec 25, 2001·43 cites·26 claims
- 4769US9421092B2Automated intraocular lens injector deviceBROWN KYLE·Filed 2010·Granted Aug 23, 2016·7 cites·14 claims
- 4869US2025026782A1Activating appendages to induce polypharmacology in peptide hormone analogues, including dual glp-1r / gip agonismWISCONSIN ALUMNI RES FOUND·Filed 2024·Application pending·0 cites
- 4967US7433047B1Runout characterizationKLA TENCOR CORP·Filed 2007·Granted Oct 7, 2008·5 cites·41 claims
- 5066US11571294B2Intraocular lens injectorALCON INC·Filed 2020·Granted Feb 7, 2023·0 cites·18 claims
Showing the top 50 of 73 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →