Inventor · disambiguated record
Lawrence Hendler
Also filed as: HENDLER LAWRENCE
9 granted patents·3 pending applications·369 citations·filing 1994–2012
90Inventor score
Files withMKS INSTR INC6HENDLER LAWRENCE2PIXEL SYSTEMS INC2ELECTROGLAS INC1INTEGRATED PHOTOVOLTIC INC1
Top patents by PatentIndex Score
12 records- 0195US5656942AProber and tester with contact interface for integrated circuits-containing wafer held docked in a vertical planeELECTROGLAS INC·Filed 1995·Granted Aug 12, 1997·152 cites·17 claims
- 0291US5506676ADefect detection using fourier optics and a spatial separator for simultaneous optical computing of separated fourier transform componentsPIXEL SYSTEMS INC·Filed 1994·Granted Apr 9, 1996·104 cites·24 claims
- 0390US7622308B2Process control using process data and yield dataMKS INSTR INC·Filed 2008·Granted Nov 24, 2009·22 cites·16 claims
- 0484US8271103B2Automated model building and model updatingHENDLER LAWRENCE·Filed 2008·Granted Sep 18, 2012·29 cites·13 claims
- 0582US7996102B2Process control using process data and yield dataMKS INSTR INC·Filed 2009·Granted Aug 9, 2011·5 cites·8 claims
- 0678US7809450B2Self-correcting multivariate analysis for use in monitoring dynamic parameters in process environmentsMKS INSTR INC·Filed 2006·Granted Oct 5, 2010·6 cites·20 claims
- 0776US7313454B2Method and apparatus for classifying manufacturing outputsMKS INSTR INC·Filed 2005·Granted Dec 25, 2007·9 cites·20 claims
- 0872US5966212AHigh-speed, high-resolution, large area inspection using multiple optical fourier transform cellsPIXEL SYSTEMS INC·Filed 1996·Granted Oct 12, 1999·42 cites·6 claims
- 0947US7630786B2Manufacturing process end point detectionMKS INSTR INC·Filed 2007·Granted Dec 8, 2009·0 cites·15 claims
- 1045US2010304035A1Plasma Spraying and Recrystallization of Thick Film LayerINTEGRATED PHOTOVOLTIC INC·Filed 2010·Application pending·0 cites
- 1144US2012303142A1Automated model building and model updatingHENDLER LAWRENCE·Filed 2012·Application pending·0 cites
- 1242US2008010531A1Classifying faults associated with a manufacturing processMKS INSTR INC·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →