Inventor · disambiguated record
Laurent Karsenti
Also filed as: KARSENTI LAURENT
11 granted patents·1 pending application·134 citations·filing 2004–2025
90Inventor score
Top patents by PatentIndex Score
12 records- 0198US10043261B2Generating simulated output for a specimenKLA TENCOR CORP·Filed 2017·Granted Aug 7, 2018·32 cites·28 claims
- 0294US10360477B2Accelerating semiconductor-related computations using learning based modelsKLA TENCOR CORP·Filed 2017·Granted Jul 23, 2019·22 cites·39 claims
- 0393US10395362B2Contour based defect detectionKLA TENCOR CORP·Filed 2018·Granted Aug 27, 2019·24 cites·27 claims
- 0493US10186026B2Single image detectionKLA TENCOR CORP·Filed 2016·Granted Jan 22, 2019·10 cites·36 claims
- 0590US10599951B2Training a neural network for defect detection in low resolution imagesKLA TENCOR CORP·Filed 2019·Granted Mar 24, 2020·19 cites·31 claims
- 0688US11580375B2Accelerated training of a machine learning based model for semiconductor applicationsKLA TENCOR CORP·Filed 2016·Granted Feb 14, 2023·9 cites·37 claims
- 0787US9183624B2Detecting defects on a wafer with run time use of design dataKLA TENCOR CORP·Filed 2014·Granted Nov 10, 2015·11 cites·94 claims
- 0875US10535131B2Systems and methods for region-adaptive defect detectionKLA TENCOR CORP·Filed 2016·Granted Jan 14, 2020·3 cites·54 claims
- 0963US10402461B2Virtual inspection systems for process window characterizationKLA TENCOR CORP·Filed 2015·Granted Sep 3, 2019·1 cites·27 claims
- 1059US2025363615A1Image reconstruction via manifold learningKLA CORP·Filed 2025·Application pending·0 cites
- 1157US7764824B2Method for defect detection and process monitoring based on SEM imagesAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Jul 27, 2010·3 cites·9 claims
- 1255US11922619B2Context-based defect inspectionKLA CORP·Filed 2023·Granted Mar 5, 2024·0 cites·27 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →