Inventor · disambiguated record
Lawrence Kraus
Also filed as: KRAUS LAWRENCE · KRAUS LAWRENCE A
9 granted patents·1 pending application·515 citations·filing 1996–2003
92Inventor score
Files withCREDENCE SYSTEMS CORP10
Top patents by PatentIndex Score
10 records- 0192US6587979B1Partitionable embedded circuit test system for integrated circuitCREDENCE SYSTEMS CORP·Filed 2000·Granted Jul 1, 2003·130 cites·16 claims
- 0287US5974579AEfficient built-in self test for embedded memories with differing address spacesCREDENCE SYSTEMS CORP·Filed 1996·Granted Oct 26, 1999·74 cites·22 claims
- 0386US6304989B1Built-in spare row and column replacement analysis system for embedded memoriesCREDENCE SYSTEMS CORP·Filed 1999·Granted Oct 16, 2001·76 cites·18 claims
- 0485US6085346AMethod and apparatus for built-in self test of integrated circuitsCREDENCE SYSTEMS CORP·Filed 1996·Granted Jul 4, 2000·71 cites·18 claims
- 0575US6011748AMethod and apparatus for built-in self test of integrated circuits providing for separate row and column addressesCREDENCE SYSTEMS CORP·Filed 1997·Granted Jan 4, 2000·40 cites·10 claims
- 0669US6092030ATiming delay generator and method including compensation for environmental variationCREDENCE SYSTEMS CORP·Filed 1997·Granted Jul 18, 2000·31 cites·15 claims
- 0764US6351814B1Field programmable gate array with program encryptionCREDENCE SYSTEMS CORP·Filed 1999·Granted Feb 26, 2002·48 cites·18 claims
- 0864US5930814AComputer system and method for synthesizing a filter circuit for filtering out addresses greater than a maximum addressCREDENCE SYSTEMS CORP·Filed 1996·Granted Jul 27, 1999·25 cites·5 claims
- 0959US5983009AAutomatic generation of user definable memory BIST circuitryCREDENCE SYSTEMS CORP·Filed 1997·Granted Nov 9, 1999·20 cites·15 claims
- 1030US2003167427A1Partitionable embedded circuit test system for integrated circuitCREDENCE SYSTEMS CORP·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →