Inventor · disambiguated record
Leon Chen
Also filed as: CHEN LEON · CHEN LEON L · CHEN LEON LEE
12 granted patents·4 pending applications·157 citations·filing 1997–2018
90Inventor score
Top patents by PatentIndex Score
16 records- 0187US10557886B2Test system supporting multiple users using different applicationsADVANTEST CORP·Filed 2017·Granted Feb 11, 2020·6 cites·22 claims
- 0287US8255198B2Method and structure to develop a test program for semiconductor integrated circuitsKRISHNASWAMY RAMACHANDRAN·Filed 2010·Granted Aug 28, 2012·11 cites·12 claims
- 0385US5883906APattern data compression and decompression for semiconductor test systemADVANTEST CORP·Filed 1997·Granted Mar 16, 1999·64 cites·15 claims
- 0483US7210087B2Method and system for simulating a modular test systemADVANTEST AMERICA R & D CT INC·Filed 2004·Granted Apr 24, 2007·32 cites·34 claims
- 0582US8082541B2Method and system for performing installation and configuration management of tester instrument modulesPRAMANICK ANKAN·Filed 2005·Granted Dec 20, 2011·20 cites·22 claims
- 0681US7437261B2Method and apparatus for testing integrated circuitsADVANTEST CORP·Filed 2004·Granted Oct 14, 2008·17 cites·24 claims
- 0775US9785542B2Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testingADVANTEST CORP·Filed 2013·Granted Oct 10, 2017·5 cites·21 claims
- 0863US10451668B2Test program flow controlADVANTEST CORP·Filed 2017·Granted Oct 22, 2019·1 cites·19 claims
- 0953US10677842B2DUT testing with configurable cooling control using DUT internal temperature dataADVANTEST CORP·Filed 2017·Granted Jun 9, 2020·1 cites·19 claims
- 1045US9274911B2Using shared pins in a concurrent test execution environmentADVANTEST CORP·Filed 2013·Granted Mar 1, 2016·0 cites·23 claims
- 1142US11156659B2Optimization and scheduling of the handling of devices in the automation processADVANTEST CORP·Filed 2018·Granted Oct 26, 2021·0 cites·18 claims
- 1242US9785526B2Automated generation of a test class pre-header from an interactive graphical user interfaceADVANTEST CORP·Filed 2013·Granted Oct 10, 2017·0 cites·19 claims
- 1341US2008016396A1Test emulator, test module emulator and record medium storing program thereinADVANTEST CORP·Filed 2007·Application pending·0 cites
- 1441US2008010524A1Test emulator, test module emulator and record medium storing program thereinADVANTEST CORP·Filed 2007·Application pending·0 cites
- 1533US2002157053A1Semiconductor test system with time critical sequence generation using general purpose operating systemFiled 2001·Application pending·0 cites
- 1633US2005039079A1Test emulator, test module emulator, and record medium storing program thereinFiled 2004·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Leon Chen files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →