Inventor · disambiguated record
Lin-Lin Chih
Also filed as: CHIH LIN-LIN
7 granted patents·6 pending applications·26 citations·filing 2017–2025
78Inventor score
Files withMPI CORP13
Top patents by PatentIndex Score
13 records- 0190US11144198B2Control method of touch display apparatusMPI CORP·Filed 2019·Granted Oct 12, 2021·7 cites·13 claims
- 0288US11353501B2Wafer inspection method and wafer probing systemMPI CORP·Filed 2020·Granted Jun 7, 2022·2 cites·14 claims
- 0375US2025044350A1Method of determining probing parameters for probe system to test device under test, probe system and method of operating the same, non-transitory computer-readable storage media, method of testing unpackaged semiconductor device, tested semiconductor device and method of producing the same, and method of generating virtual mark imageMPI CORP·Filed 2024·Application pending·0 cites
- 0474USD922396SDisplay screen or portion thereof with graphical user interfaceMPI CORP·Filed 2018·Granted Jun 15, 2021·16 cites·1 claims
- 0574US2025044346A1Wafer probe station and method for establishing an evaluation model for calibration of a probe assemblyMPI CORP·Filed 2024·Application pending·0 cites
- 0674US2025044349A1Wafer probe station and method for establishing an evaluation model for calibration of a probe assemblyMPI CORP·Filed 2024·Application pending·0 cites
- 0772US11036390B2Display method of display apparatusMPI CORP·Filed 2019·Granted Jun 15, 2021·1 cites·8 claims
- 0863US2025327862A1Method, system, device, and media related to drift verificationMPI CORP·Filed 2025·Application pending·0 cites
- 0955US2024219427A1Positioning method and probe system for performing the same, method for operating probe system, and method for utilizing probe system to produce a tested semiconductor deviceMPI CORP·Filed 2024·Application pending·0 cites
- 1052US2024402238A1Test system and method for data verification for the sameMPI CORP·Filed 2023·Application pending·0 cites
- 1151US10678370B2Aligning method for use in semiconductor inspection apparatusMPI CORP·Filed 2018·Granted Jun 9, 2020·0 cites·16 claims
- 1249US10096505B2Wafer cassetteMPI CORP·Filed 2017·Granted Oct 9, 2018·0 cites·7 claims
- 1347US10976363B2Wafer inspection method and wafer probing systemMPI CORP·Filed 2018·Granted Apr 13, 2021·0 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →