Inventor · disambiguated record
Liqun Han
Also filed as: HAN LIQUN
18 granted patents·4 pending applications·373 citations·filing 2002–2025
94Inventor score
Top patents by PatentIndex Score
22 records- 0198US7315022B1High-speed electron beam inspectionKLA TENCOR TECH CORP·Filed 2005·Granted Jan 1, 2008·59 cites·16 claims
- 0297US8362425B2Multiple-beam system for high-speed electron-beam inspectionKLA TENCOR CORP·Filed 2011·Granted Jan 29, 2013·68 cites·19 claims
- 0396US8664594B1Electron-optical system for high-speed and high-sensitivity inspectionsJIANG XINRONG·Filed 2011·Granted Mar 4, 2014·120 cites·9 claims
- 0496US7821187B1Immersion gun equipped electron beam columnKLA TENCOR CORP·Filed 2008·Granted Oct 26, 2010·38 cites·5 claims
- 0593US10690754B2Scanning apparatuses and methods for a lidar systemCEPTON TECHNOLOGIES INC·Filed 2017·Granted Jun 23, 2020·15 cites·15 claims
- 0691US9443696B2Electron beam imaging with dual Wien-filter monochromatorKLA TENCOR CORP·Filed 2015·Granted Sep 13, 2016·9 cites·22 claims
- 0788US10955530B2Systems for vibration cancellation in a lidar systemCEPTON TECHNOLOGIES INC·Filed 2017·Granted Mar 23, 2021·6 cites·20 claims
- 0888US6774646B1Electron beam inspection system using multiple electron beams and uniform focus and deflection mechanismsKLA TENCOR CORP·Filed 2002·Granted Aug 10, 2004·28 cites·17 claims
- 0983US8859982B2Dual-lens-gun electron beam apparatus and methods for high-resolution imaging with both high and low beam currentsJIANG XINRONG·Filed 2012·Granted Oct 14, 2014·6 cites·7 claims
- 1081US8294125B2High-sensitivity and high-throughput electron beam inspection column enabled by adjustable beam-limiting apertureHAN LIQUN·Filed 2009·Granted Oct 23, 2012·11 cites·18 claims
- 1173US9053900B2Apparatus and methods for high-resolution electron beam imagingJIANG XINRONG·Filed 2012·Granted Jun 9, 2015·3 cites·13 claims
- 1271US8921782B2Tilt-imaging scanning electron microscopeKLA TENCOR CORP·Filed 2013·Granted Dec 30, 2014·2 cites·19 claims
- 1367US10754036B2Scanning illuminated three-dimensional imaging systemsCEPTON TECHNOLOGIES INC·Filed 2016·Granted Aug 25, 2020·1 cites·11 claims
- 1464US8461526B2Electron beam column and methods of using sameMANKOS MARIAN·Filed 2010·Granted Jun 11, 2013·2 cites·15 claims
- 1564US2024212128A13d optical sensor alignmentCEPTON TECHNOLOGIES INC·Filed 2023·Application pending·0 cites
- 1663US2025035886A1Oscillating mirrors for lidarCEPTON TECHNOLOGIES INC·Filed 2024·Application pending·0 cites
- 1762US7919193B1Shielding, particulate reducing high vacuum componentsKLA TENCOR CORP·Filed 2007·Granted Apr 5, 2011·2 cites·2 claims
- 1862US2025231300A1Lidar chip with multiple detector arraysCEPTON TECHNOLOGIES INC·Filed 2025·Application pending·0 cites
- 1960US2024183950A1Scanning lidar with discrete vertical stepsCEPTON TECHNOLOGIES INC·Filed 2023·Application pending·0 cites
- 2058US8614427B1Suspended membrane calibration sampleMCCORD MARK A·Filed 2002·Granted Dec 24, 2013·3 cites·15 claims
- 2147US11592527B2Systems for incorporating LiDAR sensors in a headlamp module of a vehicleCEPTON TECHNOLOGIES INC·Filed 2019·Granted Feb 28, 2023·0 cites·20 claims
- 2247US8092927B2Shielding, particulate reducing high vacuum componentsTAHMASSEBPUR MOHAMMED·Filed 2011·Granted Jan 10, 2012·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →