Inventor · disambiguated record
Manoocher Birang
Also filed as: BIRANG MANOOCHER
167 granted patents·25 pending applications·7,526 citations·filing 1988–2025
99Inventor score
Files withAPPLIED MATERIALS INC166KATEEVA INC6ZAP SURGICAL SYSTEMS INC6BIRANG MANOOCHER5HANAWA HIROJI2
Top patents by PatentIndex Score
192 records- 0199US9656491B1Apparatus and method for control of print gapKATEEVA INC·Filed 2017·Granted May 23, 2017·17 cites·15 claims
- 0299US9550383B2Apparatus and method for control of print gapKATEEVA INC·Filed 2016·Granted Jan 24, 2017·18 cites·20 claims
- 0399US6280290B1Method of forming a transparent window in a polishing padAPPLIED MATERIALS INC·Filed 2000·Granted Aug 28, 2001·165 cites·15 claims
- 0499US6045439AForming a transparent window in a polishing pad for a chemical mechanical polishing apparatusAPPLIED MATERIALS INC·Filed 1999·Granted Apr 4, 2000·228 cites·20 claims
- 0599US5893796AForming a transparent window in a polishing pad for a chemical mechanical polishing apparatusAPPLIED MATERIALS INC·Filed 1996·Granted Apr 13, 1999·739 cites·18 claims
- 0698US6776692B1Closed-loop control of wafer polishing in a chemical mechanical polishing systemAPPLIED MATERIALS INC·Filed 2000·Granted Aug 17, 2004·92 cites·22 claims
- 0798US6537133B1Method for in-situ endpoint detection for chemical mechanical polishing operationsAPPLIED MATERIALS INC·Filed 2000·Granted Mar 25, 2003·161 cites·5 claims
- 0898US6183354B1Carrier head with a flexible membrane for a chemical mechanical polishing systemAPPLIED MATERIALS INC·Filed 1997·Granted Feb 6, 2001·276 cites·92 claims
- 0997US7255629B2Polishing assembly with a windowAPPLIED MATERIALS INC·Filed 2006·Granted Aug 14, 2007·24 cites·15 claims
- 1097US7097537B1Determination of position of sensor measurements during polishingAPPLIED MATERIALS INC·Filed 2004·Granted Aug 29, 2006·81 cites·35 claims
- 1197US6924641B1Method and apparatus for monitoring a metal layer during chemical mechanical polishingAPPLIED MATERIALS INC·Filed 2000·Granted Aug 2, 2005·63 cites·28 claims
- 1297US6179709B1In-situ monitoring of linear substrate polishing operationsAPPLIED MATERIALS INC·Filed 1999·Granted Jan 30, 2001·181 cites·15 claims
- 1397US5964643AApparatus and method for in-situ monitoring of chemical mechanical polishing operationsAPPLIED MATERIALS INC·Filed 1996·Granted Oct 12, 1999·458 cites·15 claims
- 1496US7935240B2Electroplating apparatus and method based on an array of anodesAPPLIED MATERIALS INC·Filed 2006·Granted May 3, 2011·37 cites·11 claims
- 1596US7118450B2Polishing pad with window and method of fabricating a window in a polishing padAPPLIED MATERIALS INC·Filed 2005·Granted Oct 10, 2006·19 cites·17 claims
- 1696US7118457B2Method of forming a polishing pad for endpoint detectionAPPLIED MATERIALS INC·Filed 2005·Granted Oct 10, 2006·19 cites·21 claims
- 1796US6676717B1Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operationsAPPLIED MATERIALS INC·Filed 2000·Granted Jan 13, 2004·58 cites·27 claims
- 1896US6296548B1Method and apparatus for optical monitoring in chemical mechanical polishingAPPLIED MATERIALS INC·Filed 2000·Granted Oct 2, 2001·132 cites·15 claims
- 1996US6244935B1Apparatus and methods for chemical mechanical polishing with an advanceable polishing sheetAPPLIED MATERIALS INC·Filed 1999·Granted Jun 12, 2001·178 cites·42 claims
- 2096US6159079ACarrier head for chemical mechanical polishing a substrateAPPLIED MATERIALS INC·Filed 1998·Granted Dec 12, 2000·152 cites·26 claims
- 2195US7229340B2Monitoring a metal layer during chemical mechanical polishingAPPLIED MATERIALS INC·Filed 2006·Granted Jun 12, 2007·15 cites·23 claims
- 2295US6975107B2Eddy current sensing of metal removal for chemical mechanical polishingAPPLIED MATERIALS INC·Filed 2003·Granted Dec 13, 2005·35 cites·14 claims
- 2395US6939198B1Polishing system with in-line and in-situ metrologyAPPLIED MATERIALS INC·Filed 2002·Granted Sep 6, 2005·70 cites·32 claims
- 2495US5745331AElectrostatic chuck with conformal insulator filmAPPLIED MATERIALS INC·Filed 1995·Granted Apr 28, 1998·166 cites·42 claims
- 2595US5708506AApparatus and method for detecting surface roughness in a chemical polishing pad conditioning processAPPLIED MATERIALS INC·Filed 1995·Granted Jan 13, 1998·131 cites·53 claims
- 2694US9302513B2Apparatus and method for control of print gapKATEEVA INC·Filed 2015·Granted Apr 5, 2016·4 cites·23 claims
- 2794US8858298B2Polishing pad with two-section window having recessAPPLIED MATERIALS INC·Filed 2013·Granted Oct 14, 2014·7 cites·12 claims
- 2894US7112960B2Eddy current system for in-situ profile measurementAPPLIED MATERIALS INC·Filed 2003·Granted Sep 26, 2006·87 cites·28 claims
- 2994US6623334B1Chemical mechanical polishing with friction-based controlAPPLIED MATERIALS INC·Filed 2000·Granted Sep 23, 2003·41 cites·23 claims
- 3094US6413873B1System for chemical mechanical planarizationAPPLIED MATERIALS INC·Filed 2000·Granted Jul 2, 2002·85 cites·3 claims
- 3194US6247998B1Method and apparatus for determining substrate layer thickness during chemical mechanical polishingAPPLIED MATERIALS INC·Filed 1999·Granted Jun 19, 2001·124 cites·50 claims
- 3293US7294039B2Polishing system with in-line and in-situ metrologyAPPLIED MATERIALS INC·Filed 2006·Granted Nov 13, 2007·15 cites·4 claims
- 3393US7101251B2Polishing system with in-line and in-situ metrologyAPPLIED MATERIALS INC·Filed 2005·Granted Sep 5, 2006·15 cites·8 claims
- 3493US7008295B2Substrate monitoring during chemical mechanical polishingAPPLIED MATERIALS INC·Filed 2003·Granted Mar 7, 2006·43 cites·53 claims
- 3593US6910944B2Method of forming a transparent window in a polishing padAPPLIED MATERIALS INC·Filed 2001·Granted Jun 28, 2005·28 cites·45 claims
- 3693US6878038B2Combined eddy current sensing and optical monitoring for chemical mechanical polishingAPPLIED MATERIALS INC·Filed 2001·Granted Apr 12, 2005·40 cites·7 claims
- 3793US6572446B1Chemical mechanical polishing pad conditioning element with discrete points and compliant membraneAPPLIED MATERIALS INC·Filed 2000·Granted Jun 3, 2003·46 cites·42 claims
- 3892US7727364B2Auxiliary electrode encased in cation exchange membrane tube for electroplating cellAPPLIED MATERIALS INC·Filed 2006·Granted Jun 1, 2010·17 cites·27 claims
- 3992US7513818B2Polishing endpoint detection system and method using friction sensorAPPLIED MATERIALS INC·Filed 2004·Granted Apr 7, 2009·41 cites·24 claims
- 4092US6841057B2Method and apparatus for substrate polishingAPPLIED MATERIALS INC·Filed 2002·Granted Jan 11, 2005·21 cites·38 claims
- 4192US6796880B2Linear polishing sheet with windowAPPLIED MATERIALS INC·Filed 2003·Granted Sep 28, 2004·42 cites·22 claims
- 4292US6383058B1Adaptive endpoint detection for chemical mechanical polishingAPPLIED MATERIALS INC·Filed 2000·Granted May 7, 2002·63 cites·33 claims
- 4392US6146259ACarrier head with local pressure control for a chemical mechanical polishing apparatusAPPLIED MATERIALS INC·Filed 1997·Granted Nov 14, 2000·81 cites·28 claims
- 4492US5846882AEndpoint detector for a chemical mechanical polishing systemAPPLIED MATERIALS INC·Filed 1996·Granted Dec 8, 1998·152 cites·15 claims
- 4592US5743784AApparatus and method to determine the coefficient of friction of a chemical mechanical polishing pad during a pad conditioning process and to use it to control the processAPPLIED MATERIALS INC·Filed 1995·Granted Apr 28, 1998·122 cites·31 claims
- 4691US7074109B1Chemical mechanical polishing control system and methodAPPLIED MATERIALS INC·Filed 2004·Granted Jul 11, 2006·50 cites·24 claims
- 4791US7001242B2Method and apparatus of eddy current monitoring for chemical mechanical polishingAPPLIED MATERIALS INC·Filed 2002·Granted Feb 21, 2006·28 cites·18 claims
- 4891US6966816B2Integrated endpoint detection system with optical and eddy current monitoringAPPLIED MATERIALS INC·Filed 2001·Granted Nov 22, 2005·45 cites·12 claims
- 4990US7841926B2Substrate polishing metrology using interference signalsAPPLIED MATERIALS INC·Filed 2010·Granted Nov 30, 2010·8 cites·12 claims
- 5090US7682221B2Integrated endpoint detection system with optical and eddy current monitoringAPPLIED MATERIALS INC·Filed 2007·Granted Mar 23, 2010·12 cites·6 claims
Showing the top 50 of 192 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Manoocher Birang files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →