Inventor · disambiguated record
Matthias Brunner
Also filed as: BRUNNER MATTHIAS
44 granted patents·8 pending applications·579 citations·filing 1985–2022
98Inventor score
Files withAPPLIED MATERIALS INC16SIEMENS AG12BRUNNER MATTHIAS6APPLIED MATERIALS GMBH3STIWA HOLDING GMBH2
Top patents by PatentIndex Score
52 records- 0189US6465795B1Charge neutralization of electron beam systemsAPPLIED MATERIALS INC·Filed 2000·Granted Oct 15, 2002·40 cites·40 claims
- 0288US7319335B2Configurable prober for TFT LCD array testingAPPLIED MATERIALS INC·Filed 2004·Granted Jan 15, 2008·38 cites·12 claims
- 0388US6730906B2Method and apparatus for testing a substrateAPPLIED MATERIALS INC·Filed 2001·Granted May 4, 2004·29 cites·28 claims
- 0488US4985681AParticle beam measuring method for non-contact testing of interconnect networksSIEMENS AG·Filed 1985·Granted Jan 15, 1991·55 cites·16 claims
- 0587US8115506B2Localization of driver failures within liquid crystal displaysBRUNNER MATTHIAS·Filed 2008·Granted Feb 14, 2012·8 cites·20 claims
- 0687US4954705AMethod for examining a specimen in a particle beam instrumentSIEMENS AG·Filed 1989·Granted Sep 4, 1990·35 cites·13 claims
- 0784US4983833ADevice for the detecting of charged secondary particlesSIEMENS AG·Filed 1989·Granted Jan 8, 1991·38 cites·13 claims
- 0882US7746088B2In-line electron beam test systemAPPLIED MATERIALS INC·Filed 2009·Granted Jun 29, 2010·6 cites·20 claims
- 0981US5414374AMethod for particle beam testing of substrates for liquid crystal displays (LCD)SIEMENS AG·Filed 1993·Granted May 9, 1995·37 cites·5 claims
- 1081US5268638AMethod for particle beam testing of substrates for liquid crystal displays "LCD"SIEMENS AG·Filed 1992·Granted Dec 7, 1993·38 cites·7 claims
- 1179US7535238B2In-line electron beam test systemAPPLIED MATERIALS INC·Filed 2006·Granted May 19, 2009·5 cites·25 claims
- 1277US7129694B2Large substrate test systemAPPLIED MATERIALS INC·Filed 2002·Granted Oct 31, 2006·21 cites·31 claims
- 1376US5371459AMethod for particle beam testing of substrates for liquid crystal displays using parasitic currentsSIEMENS AG·Filed 1993·Granted Dec 6, 1994·36 cites·7 claims
- 1476US5258706AMethod for the recognition of testing errors in the test of microwiringsSIEMENS AG·Filed 1992·Granted Nov 2, 1993·33 cites·6 claims
- 1575US4831267ADetector for charged particlesSIEMENS AG·Filed 1988·Granted May 16, 1989·20 cites·16 claims
- 1670US7786742B2Prober for electronic device testing on large area substratesAPPLIED MATERIALS INC·Filed 2007·Granted Aug 31, 2010·2 cites·18 claims
- 1769US7353929B2Clutch lever arrangementZAHNRADFABRIK FRIEDRICHSHAFEN·Filed 2005·Granted Apr 8, 2008·3 cites·8 claims
- 1869US7355418B2Configurable prober for TFT LCD array testAPPLIED MATERIALS INC·Filed 2004·Granted Apr 8, 2008·14 cites·25 claims
- 1969US5834773AMethod and apparatus for testing the function of microstructure elementsEBETECH ELECTRON BEAM TECHNOLO·Filed 1996·Granted Nov 10, 1998·32 cites·19 claims
- 2069US2019256872A1Methods for the Biomethanation of H2 and CO2BRUNNER MATTHIAS·Filed 2019·Application pending·0 cites
- 2168US7075323B2Large substrate test systemAPPLIED MATERIALS INC·Filed 2004·Granted Jul 11, 2006·7 cites·34 claims
- 2267US8208114B2Drive apparatus with improved testing propertiesBRUNNER MATTHIAS·Filed 2009·Granted Jun 26, 2012·2 cites·10 claims
- 2367US7602199B2Mini-prober for TFT-LCD testingAPPLIED MATERIALS INC·Filed 2007·Granted Oct 13, 2009·1 cites·19 claims
- 2466US10329588B2Device for the biomethanation of H2 and CO2BRUNNER MATTHIAS·Filed 2014·Granted Jun 25, 2019·0 cites·19 claims
- 2566US8220825B2Method and device for fastening an airbag in a motor vehicleBONARENS FRANK·Filed 2007·Granted Jul 17, 2012·10 cites·17 claims
- 2665US7973546B2In-line electron beam test systemAPPLIED MATERIALS INC·Filed 2010·Granted Jul 5, 2011·1 cites·20 claims
- 2760US12448274B2System unit and method for deicing a spigot of a petrol pump of a filling station device having such a system unitBOSCH GMBH ROBERT·Filed 2022·Granted Oct 21, 2025·0 cites·17 claims
- 2860US7372250B2Methods and apparatus for determining a position of a substrate relative to a support stageAPPLIED MATERIALS INC·Filed 2004·Granted May 13, 2008·7 cites·24 claims
- 2960US7317325B2Line short localization in LCD pixel arraysAPPLIED MATERIALS INC·Filed 2005·Granted Jan 8, 2008·5 cites·9 claims
- 3059US5190672AMethod for thermal disposal of sewage sludgePASSAVANT WERKE·Filed 1991·Granted Mar 2, 1993·21 cites·12 claims
- 3159US2023106023A1Mammalian cell culture processesBOEHRINGER INGELHEIM INT·Filed 2021·Application pending·0 cites
- 3258US7847566B2Configurable prober for TFT LCD array testAPPLIED MATERIALS INC·Filed 2007·Granted Dec 7, 2010·0 cites·5 claims
- 3358US7105833B2Deflection system for a particle beam deviceAKT ELECTRON BEAM TECHNOLOGY G·Filed 2002·Granted Sep 12, 2006·5 cites·20 claims
- 3453US2024286100A1Apparatus and Method for the Production of HydrogenXGAS AS·Filed 2022·Application pending·0 cites
- 3552US7135875B2Apparatus and method for contacting of test objectsAPPLIED MATERIALS GMBH·Filed 2003·Granted Nov 14, 2006·3 cites·11 claims
- 3649US2022042960A1Method for determining properties of foodsFLECK CHRISTIAN·Filed 2021·Application pending·0 cites
- 3745US9366696B2Roll to roll tester and method of testing flexible substrates roll to rollBRUNNER MATTHIAS·Filed 2011·Granted Jun 14, 2016·0 cites·18 claims
- 3845US4748407AMethod and apparatus for measuring time dependent signals with a particle probeSIEMENS AG·Filed 1987·Granted May 31, 1988·9 cites·9 claims
- 3944US8222911B2Light-assisted testing of an optoelectronic moduleMUELLER BERNHARD GUNTER·Filed 2007·Granted Jul 17, 2012·0 cites·24 claims
- 4044US4841242AMethod for testing conductor networksSIEMENS AG·Filed 1988·Granted Jun 20, 1989·8 cites·8 claims
- 4143US2008251019A1System and method for transferring a substrate into and out of a reduced volume chamber accommodating multiple substratesKRISHNASWAMI SRIRAM·Filed 2007·Application pending·0 cites
- 4242US8009299B2Method for beam calibration and usage of a calibration bodyAPPLIED MATERIALS GMBH·Filed 2006·Granted Aug 30, 2011·0 cites·22 claims
- 4342US7474108B2Apparatus and method for contacting of test objectsAPPLIED MATERIALS GMBH·Filed 2006·Granted Jan 6, 2009·0 cites·29 claims
- 4442US6845856B2Release mechanism with a device for compensating for inaccuracies in a friction clutch of a motor vehicleZF SACHS AG·Filed 2003·Granted Jan 25, 2005·0 cites·12 claims
- 4539US2005212782A1Control device having improved testing propertiesBRUNNER MATTHIAS·Filed 2003·Application pending·0 cites
- 4637US11161316B2Method for pressing a workpiece with a predetermined pressing forceSTIWA HOLDING GMBH·Filed 2017·Granted Nov 2, 2021·0 cites·13 claims
- 4737US7256606B2Method for testing pixels for LCD TFT displaysAPPLIED MATERIALS INC·Filed 2004·Granted Aug 14, 2007·0 cites·21 claims
- 4836US7375505B2Method and apparatus for testing function of active microstructural elements and method for producing microstructural elements using the test methodAPPLIED MATERIALS INC·Filed 2002·Granted May 20, 2008·0 cites·19 claims
- 4936US5373233AMethod for the recognition of testing errors in the test of microwiringsSIEMENS AG·Filed 1993·Granted Dec 13, 1994·5 cites·9 claims
- 5035US2012113559A1Electrostatic discharge prevention for large area substrate processing systemNGUYEN HUNG T·Filed 2011·Application pending·0 cites
Showing the top 50 of 52 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →