Inventor · disambiguated record
Masatoshi Hirono
Also filed as: HIRONO MASATOSHI
22 granted patents·12 pending applications·124 citations·filing 1998–2024
93Inventor score
Files withTOSHIBA KK23NUFLARE TECHNOLOGY INC7HIRONO MASATOSHI2ADVANCED MASK INSPECTION TECH1OGAWA RIKI1
Top patents by PatentIndex Score
34 records- 0190US7648256B2Lighting system having lenses for light sources emitting rays at different wavelengthsTOSHIBA KK·Filed 2006·Granted Jan 19, 2010·47 cites·8 claims
- 0289US7403142B2Optical quantizing unit and optical A/D converterTOSHIBA KK·Filed 2006·Granted Jul 22, 2008·9 cites·1 claims
- 0387US7671771B2Optical quantizing unit and optical A/D converterTOSHIBA KK·Filed 2008·Granted Mar 2, 2010·7 cites·1 claims
- 0487US7403143B2Optical quantizing unit and optical A/D converterTOSHIBA KK·Filed 2007·Granted Jul 22, 2008·7 cites·6 claims
- 0584US11387992B2Transmitting device, receiving device, and quantum key distribution systemTOSHIBA KK·Filed 2019·Granted Jul 12, 2022·7 cites·6 claims
- 0680US5946282AOptical recording/reproducing apparatusTOSHIBA KK·Filed 1998·Granted Aug 31, 1999·35 cites·10 claims
- 0778US10197507B2Inspection apparatusNUFLARE TECHNOLOGY INC·Filed 2014·Granted Feb 5, 2019·3 cites·9 claims
- 0873US9683947B2Defect inspection deviceNUFLARE TECHNOLOGY INC·Filed 2016·Granted Jun 20, 2017·1 cites·16 claims
- 0971US12270759B2Gas detection deviceTOSHIBA KK·Filed 2023·Granted Apr 8, 2025·0 cites·20 claims
- 1071US9846928B2Inspection method and inspection apparatusNUFLARE TECHNOLOGY INC·Filed 2014·Granted Dec 19, 2017·2 cites·3 claims
- 1170US10816663B2Distance measuring device and distance measuring methodTOSHIBA KK·Filed 2017·Granted Oct 27, 2020·2 cites·10 claims
- 1268US8004655B2Automatic focus adjusting mechanism and optical image acquisition apparatusTOSHIBA KK·Filed 2010·Granted Aug 23, 2011·2 cites·6 claims
- 1367US2025297951A1Gas detection device and control method for gas detection deviceTOSHIBA KK·Filed 2024·Application pending·0 cites
- 1464US9436001B2Light beam scannerTOSHIBA KK·Filed 2015·Granted Sep 6, 2016·1 cites·10 claims
- 1561US10630392B2Quantum communication system, transmitting apparatus, and receiving apparatusTOSHIBA KK·Filed 2019·Granted Apr 21, 2020·1 cites·8 claims
- 1660US9157870B2Pattern test apparatusNUFLARE TECHNOLOGY INC·Filed 2013·Granted Oct 13, 2015·0 cites·8 claims
- 1760US2023296733A1LiDAR DEVICE AND CONTROL METHOD FOR LiDAR DEVICETOSHIBA KK·Filed 2023·Application pending·0 cites
- 1858US10410335B2Inspection method and inspection apparatusNUFLARE TECHNOLOGY INC·Filed 2018·Granted Sep 10, 2019·0 cites·5 claims
- 1956US10007980B2Inspection method and inspection apparatusNUFLARE TECHNOLOGY INC·Filed 2017·Granted Jun 26, 2018·0 cites·4 claims
- 2055US2022107397A1Lidar systemTOSHIBA KK·Filed 2021·Application pending·0 cites
- 2155US2008266154A1Optical quantizing unit and optical A/D converterTOSHIBA KK·Filed 2008·Application pending·0 cites
- 2254US2015377800A1Pattern test apparatusNUFLARE TECHNOLOGY INC·Filed 2015·Application pending·0 cites
- 2350US9372389B2Projector and portable terminalTOSHIBA KK·Filed 2014·Granted Jun 21, 2016·0 cites·19 claims
- 2450US2022065998A1Distance measurement deviceTOSHIBA KK·Filed 2021·Application pending·0 cites
- 2549US2008204737A1Mask pattern inspection apparatus with koehler illumination system using light source of high spatial coherencyADVANCED MASK INSPECTION TECH·Filed 2008·Application pending·0 cites
- 2648US2007077522A1Optical recording medium, method for reproducing information and optical information reproducing apparatusTOSHIBA KK·Filed 2006·Application pending·0 cites
- 2747US7935460B2Mask blank for EUV exposure and mask for EUV exposureTOSHIBA KK·Filed 2008·Granted May 3, 2011·0 cites·3 claims
- 2847US2007201324A1Optical-pickup head device, and method and apparatus for reproducing optical storage mediumTOSHIBA KK·Filed 2007·Application pending·0 cites
- 2947US2007074230A1Optical disc recording and/or reproducing apparatus and optical pickup cooling method of optical disc recording and/or reproducing apparatusTOSHIBA KK·Filed 2006·Application pending·0 cites
- 3045US7863588B2Lighting optical apparatus and sample inspection apparatusTOSHIBA KK·Filed 2008·Granted Jan 4, 2011·0 cites·5 claims
- 3137US8229206B2Photomask inspection methodHIRONO MASATOSHI·Filed 2009·Granted Jul 24, 2012·0 cites·2 claims
- 3236US2006176799A1Optical information recording method and optical information recording and reproducing apparatus utilizing holographyHIRONO MASATOSHI·Filed 2005·Application pending·0 cites
- 3336US2012081538A1Pattern inspection apparatusOGAWA RIKI·Filed 2011·Application pending·0 cites
- 3435US9746140B2LED lighting deviceTOSHIBA KK·Filed 2015·Granted Aug 29, 2017·0 cites·13 claims
Join the waitlist — get patent alerts
Get an alert when Masatoshi Hirono files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →