Inventor · disambiguated record
Martin Jacobus Johan Jak
Also filed as: JAK MARTIN · JAK MARTIN J J · JAK MARTIN JACOBUS J · JAK MARTIN JACOBUS JOHAN
51 granted patents·27 pending applications·225 citations·filing 2003–2022
98Inventor score
Files withASML NETHERLANDS BV40KONINKL PHILIPS ELECTRONICS NV15SOER WOUTER ANTHON7JAK MARTIN JACOBUS JOHAN5JAK MARTIN J J2
Top patents by PatentIndex Score
78 records- 0198US11204239B2Metrology method, target and substrateASML NETHERLANDS BV·Filed 2020·Granted Dec 21, 2021·7 cites·36 claims
- 0298US10379445B2Metrology method, target and substrateASML NETHERLANDS BV·Filed 2018·Granted Aug 13, 2019·13 cites·20 claims
- 0398US10133188B2Metrology method, target and substrateASML NETHERLANDS BV·Filed 2016·Granted Nov 20, 2018·10 cites·25 claims
- 0497US11428521B2Metrology method, target and substrateASML NETHERLANDS BV·Filed 2021·Granted Aug 30, 2022·3 cites·29 claims
- 0597US10718604B2Metrology method, target and substrateASML NETHERLANDS BV·Filed 2019·Granted Jul 21, 2020·6 cites·22 claims
- 0695US10527953B2Metrology recipe selectionASML NETHERLANDS BV·Filed 2017·Granted Jan 7, 2020·5 cites·24 claims
- 0795US10289008B2Methods and apparatus for predicting performance of a measurement method, measurement method and apparatusASML NETHERLANDS BV·Filed 2017·Granted May 14, 2019·6 cites·23 claims
- 0894US10481506B2Method of measuring a structure, inspection apparatus, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2018·Granted Nov 19, 2019·7 cites·24 claims
- 0994US10386176B2Metrology method, target and substrateASML NETHERLANDS BV·Filed 2015·Granted Aug 20, 2019·5 cites·20 claims
- 1093US7626643B2Waveguide for autostereoscopic display having a plurality of switchable portions of diffusive material within the waveguide for providing either scattering or light-transmissive light to the displayKONINKL PHILIPS ELECTRONICS NV·Filed 2004·Granted Dec 1, 2009·60 cites·23 claims
- 1192US11385552B2Method of measuring a structure, inspection apparatus, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2020·Granted Jul 12, 2022·2 cites·11 claims
- 1290US10831109B2Method of measuring a structure, inspection apparatus, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2017·Granted Nov 10, 2020·5 cites·14 claims
- 1390US9811003B2Metrology method and apparatus, substrate, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2016·Granted Nov 7, 2017·5 cites·19 claims
- 1487US10042268B2Method, apparatus and substrates for lithographic metrologyASML NETHERLANDS BV·Filed 2014·Granted Aug 7, 2018·5 cites·20 claims
- 1584US11549651B2Eye-safe laser-based lightingKRIJN MARCELLINUS PETRUS CAROLUS MICHAEL·Filed 2015·Granted Jan 10, 2023·4 cites·11 claims
- 1684US9940703B2Method of measuring a property of a target structure, inspection apparatus, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2017·Granted Apr 10, 2018·4 cites·18 claims
- 1784US8742381B2Radiation source with cleaning apparatusASML NETHERLANDS BV·Filed 2013·Granted Jun 3, 2014·3 cites·8 claims
- 1884US7742034B2Color displayKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Granted Jun 22, 2010·6 cites·11 claims
- 1984US7430022B2Color display deviceKONINKL PHILIPS ELECTRONICS NV·Filed 2003·Granted Sep 30, 2008·25 cites·16 claims
- 2083US9041912B2Spectral purity filters for use in a lithographic apparatusSOER WOUTER ANTHON·Filed 2012·Granted May 26, 2015·3 cites·13 claims
- 2182US12429328B2Metrology method, target and substrateASML NETHERLANDS BV·Filed 2022·Granted Sep 30, 2025·0 cites·20 claims
- 2281US10656534B2Method of measuring, device manufacturing method, metrology apparatus, and lithographic systemASML NETHERLANDS BV·Filed 2019·Granted May 19, 2020·2 cites·20 claims
- 2381US10162272B2Metrology method and apparatus, substrates for use in such methods, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2016·Granted Dec 25, 2018·2 cites·23 claims
- 2480US11009343B2Metrology apparatus and method for determining a characteristic of one or more structures on a substrateASML NETHERLANDS BV·Filed 2019·Granted May 18, 2021·2 cites·15 claims
- 2580US10635004B2Correction using stack differenceASML NETHERLANDS BV·Filed 2017·Granted Apr 28, 2020·3 cites·27 claims
- 2678US10338401B2Illumination system, inspection apparatus including such an illumination system, inspection method and manufacturing methodASML NETHERLANDS BV·Filed 2017·Granted Jul 2, 2019·2 cites·21 claims
- 2778US10310389B2Method of measuring, device manufacturing method, metrology apparatus, and lithographic systemASML NETHERLANDS BV·Filed 2018·Granted Jun 4, 2019·1 cites·20 claims
- 2878US9535338B2Metrology method and apparatus, substrate, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2013·Granted Jan 3, 2017·3 cites·11 claims
- 2977US10551308B2Focus control arrangement and methodASML NETHERLANDS BV·Filed 2016·Granted Feb 4, 2020·1 cites·20 claims
- 3076US9633427B2Method of measuring a property of a target structure, inspection apparatus, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2015·Granted Apr 25, 2017·2 cites·20 claims
- 3175US11650047B2Metrology apparatus and method for determining a characteristic of one or more structures on a substrateASML NETHERLANDS BV·Filed 2021·Granted May 16, 2023·0 cites·20 claims
- 3274US10656533B2Metrology in lithographic processesASML NETHERLANDS BV·Filed 2018·Granted May 19, 2020·1 cites·19 claims
- 3372US9753296B2Illumination system, inspection apparatus including such an illumination system, inspection method and manufacturing methodASML NETHERLANDS BV·Filed 2015·Granted Sep 5, 2017·1 cites·20 claims
- 3471US8405051B2Method for removing a deposition on an uncapped multilayer mirror of a lithographic apparatus, lithographic apparatus and device manufacturing methodBANINE VADIM YEVGENYEVICH·Filed 2009·Granted Mar 26, 2013·2 cites·10 claims
- 3571US8189011B2System and method for controlling lighting systemsVAN DE SLUIS BARTEL MARINUS·Filed 2006·Granted May 29, 2012·4 cites·20 claims
- 3670US11106142B2Metrology recipe selectionASML NETHERLANDS BV·Filed 2020·Granted Aug 31, 2021·0 cites·20 claims
- 3770US7952084B2Radiation source and lithographic apparatusASML NETHERLANDS BV·Filed 2009·Granted May 31, 2011·2 cites·15 claims
- 3869US9195152B2Spectral purity filter, lithographic apparatus, and method for manufacturing a spectral purity filterSOER WOUTER ANTHON·Filed 2009·Granted Nov 24, 2015·3 cites·6 claims
- 3969US8400627B2Photo-detector and method of measuring lightJAK MARTIN JACOBUS JOHAN·Filed 2009·Granted Mar 19, 2013·6 cites·15 claims
- 4066US2020050114A1Method of Measuring a Structure, Inspection Apparatus, Lithographic System and Device Manufacturing MethodASML NETHERLANDS BV·Filed 2019·Application pending·0 cites
- 4165US8263950B2Radiation sourceSOER WOUTER ANTHON·Filed 2010·Granted Sep 11, 2012·2 cites·15 claims
- 4263US2019165543A1Eye-safe laser-based lightingSIGNIFY HOLDING BV·Filed 2019·Application pending·0 cites
- 4358US9195144B2Spectral purity filter, radiation source, lithographic apparatus, and device manufacturing methodJAK MARTIN JACOBUS JOHAN·Filed 2009·Granted Nov 24, 2015·0 cites·17 claims
- 4457US10620550B2Metrology method and apparatusASML NETHERLANDS BV·Filed 2018·Granted Apr 14, 2020·0 cites·17 claims
- 4557US8248393B2Spectrum sequential display having reduced cross talkHEKSTRA GERBEN JOHAN·Filed 2006·Granted Aug 21, 2012·2 cites·19 claims
- 4654US10634490B2Determining edge roughness parametersASML NETHERLANDS BV·Filed 2018·Granted Apr 28, 2020·0 cites·18 claims
- 4753US2011116520A1Eye-safe laser-based lightingKONINKL PHILIPS ELECTRONICS NV·Filed 2008·Application pending·0 cites
- 4852US11300883B2Method to determine a patterning process parameterASML NETHERLANDS BV·Filed 2018·Granted Apr 12, 2022·0 cites·15 claims
- 4952US2010002027A1Display device and methodKONINKL PHILIPS ELECTRONICS NV·Filed 2008·Application pending·0 cites
- 5051US8390788B2Spectral purity filters for use in a lithographic apparatusSOER WOUTER ANTHON·Filed 2009·Granted Mar 5, 2013·0 cites·13 claims
Showing the top 50 of 78 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Martin Jacobus Johan Jak files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →