Inventor · disambiguated record
Masayuki Kitamura
Also filed as: KITAMURA MASAYUKI
70 granted patents·27 pending applications·1,250 citations·filing 1984–2025
99Inventor score
Top patents by PatentIndex Score
97 records- 0199US9613872B2Method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2015·Granted Apr 4, 2017·156 cites·20 claims
- 0298US9406694B1Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2015·Granted Aug 2, 2016·94 cites·12 claims
- 0397US9570464B1Method for manufacturing semiconductor deviceTOSHIBA KK·Filed 2016·Granted Feb 14, 2017·31 cites·20 claims
- 0497US5958140AOne-by-one type heat-processing apparatusTOKYO ELECTRON LTD·Filed 1996·Granted Sep 28, 1999·297 cites·22 claims
- 0595US5575853AVacuum exhaust system for processing apparatusTOKYO ELECTRON LTD·Filed 1995·Granted Nov 19, 1996·210 cites·8 claims
- 0692US9754793B2Method for manufacturing semiconductor deviceTOSHIBA MEMORY CORP·Filed 2016·Granted Sep 5, 2017·8 cites·20 claims
- 0790US9512541B2Selective growth method and substrate processing apparatusTOKYO ELECTRON LTD·Filed 2015·Granted Dec 6, 2016·6 cites·10 claims
- 0890US6473993B1Thermal treatment method and apparatusTOKYO ELECTRON LTD·Filed 2000·Granted Nov 5, 2002·53 cites·9 claims
- 0989US5581874AMethod of forming a bonding portionTOKYO ELECTRON LTD·Filed 1995·Granted Dec 10, 1996·99 cites·26 claims
- 1088US9673217B1Semiconductor device and method for manufacturing sameTOSHIBA KK·Filed 2016·Granted Jun 6, 2017·6 cites·6 claims
- 1188US4511191AAnticreep device for annular memberKOYO SEIKE COMPANY LIMITED·Filed 1984·Granted Apr 16, 1985·43 cites·8 claims
- 1286US9780111B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2015·Granted Oct 3, 2017·5 cites·13 claims
- 1386US2025365961A1Semiconductor device, semiconductor device manufacturing method, and semiconductor device manufacturing apparatusKIOXIA CORP·Filed 2025·Application pending·0 cites
- 1485US6444262B1Thermal processing unit and thermal processing methodTOKYO ELECTRON LTD·Filed 2000·Granted Sep 3, 2002·53 cites·17 claims
- 1582US7923839B2Semiconductor device and method for fabricating semiconductor deviceTOSHIBA KK·Filed 2009·Granted Apr 12, 2011·7 cites·20 claims
- 1682US7432468B2Plasma processing apparatus and plasma processing methodTOKYO ELECTRON LTD·Filed 2007·Granted Oct 7, 2008·8 cites·14 claims
- 1782US6566630B2Thermal processing apparatus for introducing gas between a target object and a cooling unit for cooling the target objectTOKYO ELECTRON LTD·Filed 2002·Granted May 20, 2003·27 cites·8 claims
- 1881US10566280B2Semiconductor device and method of manufacturing the sameTOSHIBA MEMORY CORP·Filed 2018·Granted Feb 18, 2020·3 cites·20 claims
- 1981US9431345B2Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2013·Granted Aug 30, 2016·5 cites·5 claims
- 2080US8487449B2Carbon nanotube interconnection and manufacturing method thereofWADA MAKOTO·Filed 2011·Granted Jul 16, 2013·6 cites·18 claims
- 2180US6435869B2Quartz window having reinforcing ribsTOKYO ELECTRON LTD·Filed 2001·Granted Aug 20, 2002·23 cites·18 claims
- 2280US2025254871A1Semiconductor device and method for manufacturing semiconductor deviceKIOXIA CORP·Filed 2025·Application pending·0 cites
- 2380US2025029836A1Semiconductor device, manufacturing method thereof, and semiconductor storage deviceKIOXIA CORP·Filed 2024·Application pending·0 cites
- 2479US8648464B2Semiconductor device and manufacturing method thereofKITAMURA MASAYUKI·Filed 2012·Granted Feb 11, 2014·6 cites·4 claims
- 2579US6630991B2Thermal processing apparatusTOKYO ELECTRON LTD·Filed 2001·Granted Oct 7, 2003·25 cites·14 claims
- 2677US12136546B2Semiconductor device, manufacturing method thereof, and semiconductor storage deviceKIOXIA CORP·Filed 2022·Granted Nov 5, 2024·0 cites·5 claims
- 2776US11139173B2Production method of semiconductor deviceTOSHIBA MEMORY CORP·Filed 2018·Granted Oct 5, 2021·2 cites·15 claims
- 2876US10199391B2Semiconductor device and method of manufacturing the sameTOSHIBA MEMORY CORP·Filed 2017·Granted Feb 5, 2019·2 cites·7 claims
- 2975US12507413B2Semiconductor device, semiconductor device manufacturing method, and semiconductor device manufacturing apparatusKIOXIA CORP·Filed 2023·Granted Dec 23, 2025·0 cites·3 claims
- 3075US12205887B2Semiconductor device and method for manufacturing the semiconductor device preliminary classKIOXIA CORP·Filed 2023·Granted Jan 21, 2025·0 cites·17 claims
- 3175US9905462B2Semiconductor device and method for manufacturing the sameTOSHIBA MEMORY CORP·Filed 2015·Granted Feb 27, 2018·2 cites·6 claims
- 3274US10325805B2Method for manufacturing a semiconductor deviceTOSHIBA KK·Filed 2017·Granted Jun 18, 2019·1 cites·16 claims
- 3373US12310017B2Semiconductor device and method for manufacturing semiconductor deviceKIOXIA CORP·Filed 2021·Granted May 20, 2025·0 cites·8 claims
- 3473US9911753B2Semiconductor device and method for manufacturing semiconductor deviceTOSHIBA MEMORY CORP·Filed 2016·Granted Mar 6, 2018·2 cites·9 claims
- 3573US9484206B2Semiconductor device including catalyst layer and graphene layer thereon and method for manufacturing the sameTOSHIBA KK·Filed 2015·Granted Nov 1, 2016·2 cites·19 claims
- 3673US8907484B2Semiconductor device and method for manufacturing sameTOSHIBA KK·Filed 2013·Granted Dec 9, 2014·3 cites·20 claims
- 3772US12406842B2Substrate processing apparatus and method of producing semiconductor deviceKIOXIA CORP·Filed 2022·Granted Sep 2, 2025·0 cites·12 claims
- 3872US11139246B2Semiconductor device with aligned viasTOSHIBA MEMORY CORP·Filed 2019·Granted Oct 5, 2021·1 cites·18 claims
- 3971US8813552B2Detecting apparatusMATSUMOTO SEIICHI·Filed 2009·Granted Aug 26, 2014·3 cites·5 claims
- 4071US8742592B2Semiconductor device including a plug and method for manufacturing the sameWAKATSUKI SATOSHI·Filed 2012·Granted Jun 3, 2014·3 cites·3 claims
- 4168US11705404B2Semiconductor device and method of manufacturing the sameKIOXIA CORP·Filed 2021·Granted Jul 18, 2023·0 cites·5 claims
- 4268US11658110B2Semiconductor device and method for manufacturing the semiconductor deviceKIOXIA CORP·Filed 2021·Granted May 23, 2023·0 cites·18 claims
- 4368US6488407B1Radiation temperature measuring method and radiation temperature measuring systemTOKYO ELECTRON LTD·Filed 2000·Granted Dec 3, 2002·14 cites·4 claims
- 4467US12027367B2Substrate treatment apparatus and manufacturing method of semiconductor deviceKIOXIA CORP·Filed 2021·Granted Jul 2, 2024·0 cites·3 claims
- 4567US6007633ASingle-substrate-processing apparatus in semiconductor processing systemTOKYO ELECTRON LTD·Filed 1998·Granted Dec 28, 1999·29 cites·20 claims
- 4666US12448688B2Film forming method and apparatusKIOXIA CORP·Filed 2022·Granted Oct 21, 2025·0 cites·10 claims
- 4766US12439599B2Semiconductor memory deviceKIOXIA CORP·Filed 2022·Granted Oct 7, 2025·0 cites·20 claims
- 4866US6467952B2Virtual blackbody radiation system and radiation temperature measuring systemTOKYO ELECTRON LTD·Filed 2000·Granted Oct 22, 2002·12 cites·9 claims
- 4966US2022195594A1Semiconductor manufacturing apparatus and method of manufacturing semiconductor deviceKIOXIA CORP·Filed 2022·Application pending·0 cites
- 5065US9991159B2Semiconductor device manufacture methodTOSHIBA MEMORY CORP·Filed 2017·Granted Jun 5, 2018·1 cites·8 claims
Showing the top 50 of 97 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →