Inventor · disambiguated record
Matthew Moe
Also filed as: MOE MATTHEW · MOE MATTHEW D
7 granted patents·1 pending application·10 citations·filing 2008–2019
77Inventor score
Top patents by PatentIndex Score
8 records- 0196US10978438B1IC with test structures and E-beam pads embedded within a contiguous standard cell areaPDF SOLUTIONS INC·Filed 2019·Granted Apr 13, 2021·9 cites·14 claims
- 0267US11107804B1IC with test structures and e-beam pads embedded within a contiguous standard cell areaPDF SOLUTIONS INC·Filed 2019·Granted Aug 31, 2021·0 cites·14 claims
- 0367US11081476B1IC with test structures and e-beam pads embedded within a contiguous standard cell areaPDF SOLUTIONS INC·Filed 2019·Granted Aug 3, 2021·0 cites·14 claims
- 0467US11081477B1IC with test structures and e-beam pads embedded within a contiguous standard cell areaPDF SOLUTIONS INC·Filed 2019·Granted Aug 3, 2021·0 cites·14 claims
- 0567US11075194B1IC with test structures and E-beam pads embedded within a contiguous standard cell areaPDF SOLUTIONS INC·Filed 2019·Granted Jul 27, 2021·0 cites·14 claims
- 0667US11018126B1IC with test structures and e-beam pads embedded within a contiguous standard cell areaPDF SOLUTIONS INC·Filed 2019·Granted May 25, 2021·0 cites·14 claims
- 0756US7827516B1Method and system for grouping logic in an integrated circuit design to minimize number of transistors and number of unique geometry patternsPDF SOLUTIONS INC·Filed 2008·Granted Nov 2, 2010·1 cites·18 claims
- 0842US2011050281A1Method and system for grouping logic in an integrated circuit design to minimize number of transistors and number of unique geometry patternsMOE MATTHEW D·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →