Inventor · disambiguated record
Masaaki Nojiri
Also filed as: NOJIRI MASAAKI
9 granted patents·8 pending applications·78 citations·filing 2004–2024
88Inventor score
Top patents by PatentIndex Score
17 records- 0191US8421010B2Charged particle beam device for scanning a sample using a charged particle beam to inspect the sampleHIROI TAKASHI·Filed 2009·Granted Apr 16, 2013·16 cites·10 claims
- 0284US2025060678A1Pattern Measurement Device and Pattern Measurement MethodHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 0383US11353798B2Pattern measurement device and pattern measurement methodHITACHI HIGH TECH CORP·Filed 2017·Granted Jun 7, 2022·2 cites·19 claims
- 0482US7696487B2Circuit pattern inspection apparatusHITACHI HIGH TECH CORP·Filed 2006·Granted Apr 13, 2010·8 cites·18 claims
- 0582US7532328B2Circuit-pattern inspection apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted May 12, 2009·7 cites·3 claims
- 0680US8036447B2Inspection apparatus for inspecting patterns of a substrateHITACHI HIGH TECH CORP·Filed 2009·Granted Oct 11, 2011·10 cites·3 claims
- 0777US12174551B2Pattern measurement device and pattern measurement methodHITACHI HIGH TECH CORP·Filed 2022·Granted Dec 24, 2024·0 cites·31 claims
- 0877US7292327B2Circuit-pattern inspection apparatusHITACHI HIGH TECH CORP·Filed 2004·Granted Nov 6, 2007·21 cites·12 claims
- 0975US7223975B2Inspection apparatus for circuit patternHITACHI HIGH TECH CORP·Filed 2004·Granted May 29, 2007·10 cites·6 claims
- 1072US8134697B2Inspection apparatus for inspecting patterns of substrateHAYAKAWA KOICHI·Filed 2009·Granted Mar 13, 2012·4 cites·6 claims
- 1159US2010019148A1Inspection apparatus for circuit patternHITACHI HIGH TECH CORP·Filed 2009·Application pending·0 cites
- 1255US2007284526A1Inspection apparatus for circuit patternHITACHI HIGH TECH CORP·Filed 2007·Application pending·0 cites
- 1352US2009261251A1Inspection apparatus and inspection methodHITACHI HIGH TECH CORP·Filed 2009·Application pending·0 cites
- 1444US2006171593A1Inspection apparatus for inspecting patterns of a substrateHITACHI HIGH TECH CORP·Filed 2006·Application pending·0 cites
- 1538US2013271595A1Circuit pattern inspecting device and inspecting method thereofHIROI TAKASHI·Filed 2011·Application pending·0 cites
- 1637US2013082177A1Circuit pattern inspection apparatus and circuit pattern inspection methodHIROI TAKASHI·Filed 2011·Application pending·0 cites
- 1734US2011298915A1Pattern inspecting apparatus and pattern inspecting methodHIROI TAKASHI·Filed 2010·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Masaaki Nojiri files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →