Inventor · disambiguated record
Marinus Petrus Reijnders
Also filed as: REIJNDERS MARINUS PETRUS
9 granted patents·4 pending applications·11 citations·filing 2015–2024
80Inventor score
Top patents by PatentIndex Score
13 records- 0193US11262661B2Metrology apparatusASML NETHERLANDS BV·Filed 2019·Granted Mar 1, 2022·4 cites·18 claims
- 0290US12306541B2Lithographic apparatus, metrology systems, illumination switches and methods thereofASML HOLDING NV·Filed 2021·Granted May 20, 2025·2 cites·20 claims
- 0389US11940739B2Metrology apparatusASML NETHERLANDS BV·Filed 2021·Granted Mar 26, 2024·1 cites·19 claims
- 0484US10241425B2Level sensor, lithographic apparatus and device manufacturing methodASML NETHERLANDS BV·Filed 2015·Granted Mar 26, 2019·4 cites·20 claims
- 0581US2024231243A1Light sources and methods of controlling; devices and methods for use in measurement applicationsASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0678US2024404036A1Detection apparatus for simultaneous acquisition of multiple diverse images of an objectASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0769US11971663B2Light sources and methods of controlling; devices and methods for use in measurement applicationsASML NETHERLANDS BV·Filed 2020·Granted Apr 30, 2024·0 cites·10 claims
- 0863US12086973B2Detection apparatus for simultaneous acquisition of multiple diverse images of an objectASML NETHERLANDS BV·Filed 2020·Granted Sep 10, 2024·0 cites·14 claims
- 0962US2025251671A1Method of spatially aligning a patterning device and a substrateASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 1060US12124173B2Lithographic apparatus, metrology systems, illumination sources and methods thereofASML NETHERLANDS BV·Filed 2020·Granted Oct 22, 2024·0 cites·26 claims
- 1153US11221565B2Level sensor and lithographic apparatusASML NETHERLANDS BV·Filed 2019·Granted Jan 11, 2022·0 cites·14 claims
- 1250US2024168392A1Assembly for separating radiation in the far fieldASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 1346US11467505B2Height sensor, lithographic apparatus and method for manufacturing devicesASML NETHERLANDS BV·Filed 2017·Granted Oct 11, 2022·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →