Inventor · disambiguated record
Mani Soma
Also filed as: SOMA MANI
37 granted patents·4 pending applications·948 citations·filing 1996–2011
98Inventor score
Top patents by PatentIndex Score
41 records- 0197US6795496B1Jitter measuring device and methodADVANTEST CORP·Filed 2000·Granted Sep 21, 2004·117 cites·19 claims
- 0291US6598004B1Jitter measurement apparatus and its methodADVANTEST CORP·Filed 2000·Granted Jul 22, 2003·51 cites·20 claims
- 0389US6922439B2Apparatus for and method of measuring jitterADVANTEST CORP·Filed 2001·Granted Jul 26, 2005·42 cites·14 claims
- 0489US6423558B1Method for fabricating integrated circuit (IC) dies with multi-layered interconnect structuresADVANTEST CORP·Filed 2000·Granted Jul 23, 2002·46 cites·4 claims
- 0588US6460001B1Apparatus for and method of measuring a peak jitterADVANTEST CORP·Filed 2000·Granted Oct 1, 2002·32 cites·13 claims
- 0688US5980246AOrthodontics headgear compliance monitorUNIV WASHINGTON·Filed 1996·Granted Nov 9, 1999·156 cites·20 claims
- 0785US7313496B2Test apparatus and test method for testing a device under testADVANTEST CORP·Filed 2005·Granted Dec 25, 2007·13 cites·21 claims
- 0884US6621860B1Apparatus for and method of measuring a jitterADVANTEST CORP·Filed 1999·Granted Sep 16, 2003·44 cites·36 claims
- 0983US7496137B2Apparatus for measuring jitter and method of measuring jitterADVANTEST CORP·Filed 2005·Granted Feb 24, 2009·12 cites·20 claims
- 1083US7253443B2Electronic device with integrally formed light emitting device and supporting memberADVANTEST CORP·Filed 2002·Granted Aug 7, 2007·30 cites·21 claims
- 1183US6400129B1Apparatus for and method of detecting a delay fault in a phase-locked loop circuitADVANTEST CORP·Filed 2000·Granted Jun 4, 2002·28 cites·10 claims
- 1281US6885700B1Charge-based frequency measurement bistUNIV WASHINGTON·Filed 2000·Granted Apr 26, 2005·25 cites·17 claims
- 1381US6775321B1Apparatus for and method of measuring a jitterADVANTEST CORP·Filed 2000·Granted Aug 10, 2004·25 cites·28 claims
- 1480US7054358B2Measuring apparatus and measuring methodADVANTEST CORP·Filed 2002·Granted May 30, 2006·24 cites·40 claims
- 1580US6687629B1Apparatus for and method of measuring a jitterADVANTEST CORP·Filed 1999·Granted Feb 3, 2004·38 cites·22 claims
- 1679US7636387B2Measuring apparatus and measuring methodADVANTEST CORP·Filed 2004·Granted Dec 22, 2009·22 cites·53 claims
- 1779US7305025B2Measurement instrument and measurement methodADVANTEST CORP·Filed 2004·Granted Dec 4, 2007·22 cites·13 claims
- 1879US7203229B1Apparatus for and method of measuring jitterADVANTEST CORP·Filed 2001·Granted Apr 10, 2007·23 cites·31 claims
- 1978US6525523B1Jitter measurement apparatus and its methodADVANTEST CORP·Filed 2000·Granted Feb 25, 2003·26 cites·24 claims
- 2077US7127018B2Apparatus for and method of measuring clock skewADVANTEST CORP·Filed 2001·Granted Oct 24, 2006·17 cites·47 claims
- 2175US7317309B2Wideband signal analyzing apparatus, wideband period jitter analyzing apparatus, and wideband skew analyzing apparatusADVANTEST CORP·Filed 2004·Granted Jan 8, 2008·17 cites·43 claims
- 2274US6594595B2Apparatus for and method of measuring cross-correlation coefficient between signalsADVANTEST CORP·Filed 2001·Granted Jul 15, 2003·19 cites·19 claims
- 2373US7596173B2Test apparatus, clock generator and electronic deviceADVANTEST CORP·Filed 2005·Granted Sep 29, 2009·8 cites·16 claims
- 2472US7397847B2Testing device for testing electronic device and testing method thereofADVANTEST CORP·Filed 2004·Granted Jul 8, 2008·13 cites·17 claims
- 2571US6735538B1Apparatus and method for measuring quality measure of phase noise waveformADVANTEST CORP·Filed 2000·Granted May 11, 2004·15 cites·23 claims
- 2667US7957458B2Jitter measurement apparatus, jitter measurement method, test apparatus and electronic deviceADVANTEST CORP·Filed 2006·Granted Jun 7, 2011·3 cites·18 claims
- 2766US7193728B2Processing apparatus, processing method and position detecting deviceADVANTEST CORP·Filed 2002·Granted Mar 20, 2007·13 cites·13 claims
- 2863US6990417B2Jitter estimating apparatus and estimating methodMANI SOMA·Filed 2002·Granted Jan 24, 2006·10 cites·42 claims
- 2962US7136773B2Testing apparatus and testing methodADVANTEST CORP·Filed 2003·Granted Nov 14, 2006·8 cites·10 claims
- 3061US7263150B2Probability estimating apparatus and method for peak-to-peak clock skewsADVANTEST CORP·Filed 2002·Granted Aug 28, 2007·9 cites·37 claims
- 3159US6737852B2Clock skew measuring apparatus and methodADVANTEST CORP·Filed 2001·Granted May 18, 2004·8 cites·21 claims
- 3257US7778785B2Signal-to-noise ratio measurement for discrete waveformADVANTEST CORP·Filed 2008·Granted Aug 17, 2010·1 cites·17 claims
- 3357US7564897B2Jitter measuring apparatus, jitter measuring method and PLL circuitADVANTEST CORP·Filed 2004·Granted Jul 21, 2009·7 cites·15 claims
- 3457US7340381B2Characterization of radio frequency (RF) signals using wavelet-based parameter extractionUNIV WASHINGTON·Filed 2003·Granted Mar 4, 2008·7 cites·30 claims
- 3554US7356109B2Apparatus for and method of measuring clock skewADVANTEST CORP·Filed 2002·Granted Apr 8, 2008·2 cites·45 claims
- 3651US7460592B2Apparatus for measuring jitter and method of measuring jitterADVANTEST CORP·Filed 2005·Granted Dec 2, 2008·1 cites·9 claims
- 3751US6291979B1Apparatus for and method of detecting a delay faultADVANTEST CORP·Filed 1999·Granted Sep 18, 2001·14 cites·5 claims
- 3842US2004062301A1Jitter measurement apparatus and jitter measurement methodFiled 2002·Application pending·0 cites
- 3939US2012102353A1Data processing apparatus, data processing system, measurement system, data processing method, measurement method, electronic device and recording mediumYAMAGUCHI TAKAHIRO·Filed 2011·Application pending·0 cites
- 4037US2005185708A1Apparatus for measuring jitter, method of measuring jitter and computer-readable medium storing a program thereofADVANTEST CORP·Filed 2005·Application pending·0 cites
- 4135US2006087346A1Phase difference detecting apparatusADVANTEST CORP·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →