Inventor · disambiguated record
Marcel Trimpl
Also filed as: TRIMPL MARCEL
5 granted patents·2 pending applications·21 citations·filing 2015–2024
73Inventor score
Top patents by PatentIndex Score
7 records- 0195US9767986B2Scanning electron microscope and methods of inspecting and reviewing samplesKLA TENCOR CORP·Filed 2015·Granted Sep 19, 2017·13 cites·21 claims
- 0291US10466212B2Scanning electron microscope and methods of inspecting and reviewing samplesKLA TENCOR CORP·Filed 2017·Granted Nov 5, 2019·7 cites·14 claims
- 0386US11699607B2Segmented multi-channel, backside illuminated, solid state detector with a through-hole for detecting secondary and backscattered electronsKLA CORP·Filed 2021·Granted Jul 11, 2023·1 cites·20 claims
- 0472US2023230800A1Sensor module for scanning electron microscopy applicationsKLA CORP·Filed 2023·Application pending·0 cites
- 0569US12484316B2CVD boron uniformity overcoming loading effectsKLA CORP·Filed 2024·Granted Nov 25, 2025·0 cites·29 claims
- 0662US11610757B2Sensor module for scanning electron microscopy applicationsKLA CORP·Filed 2020·Granted Mar 21, 2023·0 cites·24 claims
- 0762US2025072139A1Biasing and readout methods for high-speed resistive gate sensorKLA CORP·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →