Inventor · disambiguated record
Matthew Weldon
Also filed as: WELDON MATTHEW
8 granted patents·2 pending applications·108 citations·filing 1998–2009
87Inventor score
Top patents by PatentIndex Score
10 records- 0194US7342235B1Contamination monitoring and control techniques for use with an optical metrology instrumentMETROSOL INC·Filed 2006·Granted Mar 11, 2008·32 cites·42 claims
- 0278US6960115B2Multiprobe detection system for chemical-mechanical planarization toolSPEEDFAM IPEC CORP·Filed 2003·Granted Nov 1, 2005·19 cites·24 claims
- 0378US6447370B1Inline metrology deviceSPEEDFAM IPEC CORP·Filed 2001·Granted Sep 10, 2002·24 cites·20 claims
- 0476US6805613B1Multiprobe detection system for chemical-mechanical planarization toolSPEEDFAM IPEC CORP·Filed 2000·Granted Oct 19, 2004·17 cites·29 claims
- 0568US7663747B2Contamination monitoring and control techniques for use with an optical metrology instrumentMETROSOL INC·Filed 2006·Granted Feb 16, 2010·2 cites·14 claims
- 0668US7622310B2Contamination monitoring and control techniques for use with an optical metrology instrumentMETROSOL INC·Filed 2006·Granted Nov 24, 2009·2 cites·67 claims
- 0767US8153987B2Automated calibration methodology for VUV metrology systemHURST JEFFREY B·Filed 2009·Granted Apr 10, 2012·4 cites·18 claims
- 0839US5942704ABrush plectrum for stringed instrumentsFiled 1998·Granted Aug 24, 1999·8 cites·6 claims
- 0930US2003045008A1Method and apparatus for monitoring changes in the surface of a workpiece during processingFiled 2001·Application pending·0 cites
- 1030US2001039462A1System and method for predicting software models using material-centric process instrumentationFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →