Inventor · disambiguated record
Megumi Nakamura
Also filed as: NAKAMURA MEGUMI
23 granted patents·6 pending applications·121 citations·filing 2001–2023
94Inventor score
Top patents by PatentIndex Score
29 records- 0184US7952069B2Mass spectrometer and mass spectrometry methodCANON ANELVA CORP·Filed 2009·Granted May 31, 2011·11 cites·13 claims
- 0284US7005634B2Ionization apparatusANELVA CORP·Filed 2002·Granted Feb 28, 2006·21 cites·16 claims
- 0383USD468198SFront surface of packageTOSHIBA BATTERY·Filed 2001·Granted Jan 7, 2003·31 cites·1 claims
- 0478US7202474B2Ion attachment mass spectrometry apparatusANELVA CORP·Filed 2006·Granted Apr 10, 2007·4 cites·6 claims
- 0575US9697998B2Mass spectrometerCANON ANELVA CORP·Filed 2015·Granted Jul 4, 2017·2 cites·10 claims
- 0674US8386211B2Monitoring virtual worlds to detect events and determine their typeIBM·Filed 2008·Granted Feb 26, 2013·4 cites·20 claims
- 0774US6635868B2Mass spectrometry apparatusANELVA CORP·Filed 2001·Granted Oct 21, 2003·11 cites·14 claims
- 0874US6559443B2Ionization apparatus and ionization method for mass spectrometryANELVA CORP·Filed 2001·Granted May 6, 2003·11 cites·9 claims
- 0969US8164051B2Internal standard material, resin composition, and measurement methodSHIOKAWA YOSHIRO·Filed 2009·Granted Apr 24, 2012·1 cites·6 claims
- 1069US7084397B2Ion attachment mass spectrometry apparatusANELVA CORP·Filed 2004·Granted Aug 1, 2006·7 cites·10 claims
- 1169US2024293521A1Combination use of wt1 antigen peptide and immunomodulatorSUMITOMO PHARMA CO LTD·Filed 2023·Application pending·0 cites
- 1265US8049166B2Mass spectrometer system and mass spectrometry methodCANON ANELVA CORP·Filed 2009·Granted Nov 1, 2011·1 cites·8 claims
- 1365US6800848B2Method and apparatus for ion attachment mass spectrometryANELVA CORP·Filed 2001·Granted Oct 5, 2004·6 cites·16 claims
- 1463US6590205B2Ionization method for mass spectrometry and mass spectrometry apparatusANELVA CORP·Filed 2001·Granted Jul 8, 2003·5 cites·19 claims
- 1562US8309917B2Mass spectrometry and mass spectrometer used for the sameSHIOKAWA YOSHIRO·Filed 2009·Granted Nov 13, 2012·1 cites·10 claims
- 1661US6479814B2Ion source for ion attachment mass spectrometry apparatusANELVA CORP·Filed 2001·Granted Nov 12, 2002·4 cites·22 claims
- 1754US8137203B2System and method for virtual space-hazard assessmentNAKAMURA MEGUMI·Filed 2009·Granted Mar 20, 2012·0 cites·29 claims
- 1850US12080511B2Sample holder, method for using sample holder, projection amount adjustment jig, projection amount adjustment method and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 3, 2024·0 cites·14 claims
- 1949US7015461B2Method and apparatus for ion attachment mass spectrometryANELVA CORP·Filed 2001·Granted Mar 21, 2006·1 cites·10 claims
- 2049US2009266979A1Ion attachment mass spectrometer and ion attachment mass spectrometry method thereofCANON ANELVA TECHNIX CORP·Filed 2009·Application pending·0 cites
- 2148US2023183316A1Pharmaceutical composition for treating cancerSUMITOMO PHARMA CO LTD·Filed 2021·Application pending·0 cites
- 2247US2018140691A1Combination use of wt1 antigen peptide and immunomodulatorSUMITOMO DAINIPPON PHARMA CO LTD·Filed 2016·Application pending·0 cites
- 2345US2007168677A1Changing user authentication method by timer and the user contextIBM·Filed 2006·Application pending·0 cites
- 2443US11742178B2Ion milling device and milling processing method using sameHITACHI HIGH TECH CORP·Filed 2019·Granted Aug 29, 2023·0 cites·16 claims
- 2542US8410415B2Ion detector for mass spectrometry, method for detecting ion, and method for manufacturing ion detectorNAKAMURA MEGUMI·Filed 2011·Granted Apr 2, 2013·0 cites·11 claims
- 2642US2008178257A1Method for integrity metrics managementMISHINA TAKUYA·Filed 2007·Application pending·0 cites
- 2740US8324568B2Mass spectrometer and mass spectrometry methodSHIOKAWA YOSHIRO·Filed 2010·Granted Dec 4, 2012·0 cites·8 claims
- 2839US9373491B2Mass spectrometerCANON ANELVA CORP·Filed 2015·Granted Jun 21, 2016·0 cites·4 claims
- 2939US8436295B2Device for measuring mean free path, vacuum gauge, and method for measuring mean free pathSHIOKAWA YOSHIRO·Filed 2012·Granted May 7, 2013·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →