Inventor · disambiguated record
Michael Faeyrman
Also filed as: FAEYRMAN MICHAEL
10 granted patents·8 pending applications·266 citations·filing 1997–2017
91Inventor score
Top patents by PatentIndex Score
18 records- 0197US9476698B2Periodic patterns and technique to control misalignment between two layersKLA TENCOR CORP·Filed 2015·Granted Oct 25, 2016·22 cites·13 claims
- 0297US7656528B2Periodic patterns and technique to control misalignment between two layersKLA TENCOR CORP·Filed 2007·Granted Feb 2, 2010·60 cites·21 claims
- 0393US8525994B2Periodic patterns and technique to control misaligment between two layersABDULHALIM IBRAHIM·Filed 2009·Granted Sep 3, 2013·12 cites·8 claims
- 0491US6172349B1Autofocusing apparatus and method for high resolution microscope systemKLA TENCOR CORP·Filed 1997·Granted Jan 9, 2001·150 cites·30 claims
- 0587US8570515B2Periodic patterns and technique to control misalignment between two layersABDULHALIM IBRAHIM·Filed 2009·Granted Oct 29, 2013·5 cites·61 claims
- 0669US10151584B2Periodic patterns and technique to control misalignment between two layersKLA TENCOR CORP·Filed 2017·Granted Dec 11, 2018·0 cites·9 claims
- 0765US9835447B2Periodic patterns and technique to control misalignment between two layersKLA TENCOR CORP·Filed 2016·Granted Dec 5, 2017·0 cites·10 claims
- 0863US9234745B2Periodic patterns and techniques to control misalignment between two layersKLA TENCOR CORP·Filed 2015·Granted Jan 12, 2016·0 cites·12 claims
- 0963US9103662B2Periodic patterns and technique to control misalignment between two layersKLA TENCOR CORP·Filed 2013·Granted Aug 11, 2015·0 cites·3 claims
- 1059US7430898B1Methods and systems for analyzing a specimen using atomic force microscopy profiling in combination with an optical techniqueKLA TENCOR TECH CORP·Filed 2004·Granted Oct 7, 2008·17 cites·16 claims
- 1156US2006262326A1Periodic patterns and technique to control misalignment between two layersABDULHALIM IBRAHIM·Filed 2006·Application pending·0 cites
- 1255US2006065625A1Periodic patterns and technique to control misalignment between two layersABDULHALIM IBRAHIM·Filed 2005·Application pending·0 cites
- 1355US2006132807A1Periodic patterns and technique to control misalignment between two layersABDULHALIM IBRAHIM·Filed 2006·Application pending·0 cites
- 1454US2005208685A1Periodic patterns and technique to control misalignmentABDULHALIM IBRAHIM·Filed 2005·Application pending·0 cites
- 1554US2005157297A1Periodic patterns and technique to control misalignment between two layersFiled 2005·Application pending·0 cites
- 1645US2004061857A1Periodic patterns and technique to control misalignment between two layersFiled 2003·Application pending·0 cites
- 1745US2004229471A1Periodic patterns and technique to control misalignment between two layersFiled 2003·Application pending·0 cites
- 1842US2003002043A1Periodic patterns and technique to control misalignmentKLA TENCOR CORP·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →