Inventor · disambiguated record
Ming-Yu Fan
Also filed as: FAN MING-YU
9 granted patents·1 pending application·119 citations·filing 2003–2017
88Inventor score
Files withMICROSOFT TECHNOLOGY LICENSING LLC2TAIWAN SEMICONDUCTOR MFG2TAIWAN SEMICONDUCTOR MFG CO LTD2TSEN ANDY2CHANG CHUN-LIN1
Top patents by PatentIndex Score
10 records- 0194US8404572B2Multi-zone temperature control for semiconductor waferCHANG CHUN-LIN·Filed 2009·Granted Mar 26, 2013·40 cites·20 claims
- 0292US8229588B2Method and system for tuning advanced process control parametersTSEN ANDY·Filed 2009·Granted Jul 24, 2012·32 cites·17 claims
- 0392US8108060B2System and method for implementing a wafer acceptance test (“WAT”) advanced process control (“APC”) with novel sampling policy and architectureTSEN ANDY·Filed 2009·Granted Jan 31, 2012·25 cites·19 claims
- 0490US10113233B2Multi-zone temperature control for semiconductor waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Oct 30, 2018·6 cites·14 claims
- 0580US9023664B2Multi-zone temperature control for semiconductor waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted May 5, 2015·3 cites·11 claims
- 0665US8392009B2Advanced process control with novel sampling policyFEI WANG JO·Filed 2009·Granted Mar 5, 2013·4 cites·19 claims
- 0762US11250433B2Using semi-supervised label procreation to train a risk determination modelMICROSOFT TECHNOLOGY LICENSING LLC·Filed 2017·Granted Feb 15, 2022·1 cites·20 claims
- 0856US7977655B2Method and system of monitoring E-beam overlay and providing advanced process controlTAIWAN SEMICONDUCTOR MFG·Filed 2009·Granted Jul 12, 2011·0 cites·20 claims
- 0946US6998629B2Reticle position detection systemTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Feb 14, 2006·8 cites·20 claims
- 1040US2019114639A1Anomaly detection in data transactionsMICROSOFT TECHNOLOGY LICENSING LLC·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →