Inventor · disambiguated record
Minoru Harada
Also filed as: HARADA MINORU
53 granted patents·13 pending applications·460 citations·filing 1984–2024
98Inventor score
Top patents by PatentIndex Score
66 records- 0190US9401015B2Defect classification method, and defect classification systemMINEKAWA YOHEI·Filed 2012·Granted Jul 26, 2016·12 cites·14 claims
- 0287US12260545B2Sample observation device and methodHITACHI HIGH TECH CORP·Filed 2022·Granted Mar 25, 2025·1 cites·16 claims
- 0386US7932493B2Method and system for observing a specimen using a scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2008·Granted Apr 26, 2011·11 cites·14 claims
- 0484US9390490B2Method and device for testing defect using SEMTAKAGI YUJI·Filed 2010·Granted Jul 12, 2016·7 cites·5 claims
- 0583US5965834AElectronic cymbal instrumentYAMAHA CORP·Filed 1998·Granted Oct 12, 1999·28 cites·5 claims
- 0683US5549874ADischarge reactorEBARA CORP·Filed 1993·Granted Aug 27, 1996·59 cites·5 claims
- 0782US10810733B2Defect classification apparatus and defect classification methodHITACHI HIGH TECH CORP·Filed 2016·Granted Oct 20, 2020·5 cites·6 claims
- 0882US9311697B2Inspection method and device thereforHARADA MINORU·Filed 2011·Granted Apr 12, 2016·6 cites·17 claims
- 0981US9569836B2Defect observation method and defect observation deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 14, 2017·5 cites·13 claims
- 1081US8355559B2Method and apparatus for reviewing defectsHITACHI HIGH TECH CORP·Filed 2009·Granted Jan 15, 2013·9 cites·16 claims
- 1180US5538695AOzonizerEBARA CORP·Filed 1993·Granted Jul 23, 1996·34 cites·8 claims
- 1279US9922414B2Defect inspection method and defect inspection deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Mar 20, 2018·4 cites·30 claims
- 1379US9165356B2Defect inspection method and defect inspection deviceHARADA MINORU·Filed 2012·Granted Oct 20, 2015·4 cites·20 claims
- 1478US8121397B2Method and its apparatus for reviewing defectsHARADA MINORU·Filed 2009·Granted Feb 21, 2012·9 cites·12 claims
- 1577US10559074B2Sample observation device and sample observation methodHITACHI HIGH TECH CORP·Filed 2018·Granted Feb 11, 2020·2 cites·16 claims
- 1677US6753467B2Simple electronic musical instrument, player's console and signal processing system incorporated thereinYAMAHA CORP·Filed 2002·Granted Jun 22, 2004·19 cites·29 claims
- 1776US8526710B2Defect review method and apparatusNAKAGAKI RYO·Filed 2008·Granted Sep 3, 2013·7 cites·16 claims
- 1876US5409775AVapor-grown and graphitized carbon fibers, process for preparing same, molded members thereof, and composite members thereofNIKKISO CO LTD·Filed 1993·Granted Apr 25, 1995·37 cites·12 claims
- 1973US11170483B2Sample observation device and sample observation methodHITACHI HIGH TECH CORP·Filed 2019·Granted Nov 9, 2021·1 cites·13 claims
- 2073US10971325B2Defect observation system and defect observation method for semiconductor waferHITACHI HIGH TECH CORP·Filed 2019·Granted Apr 6, 2021·1 cites·16 claims
- 2173US4591454AApparatus and method for melting and treating metal wastesDORYOKURO KAKUNENRYO·Filed 1984·Granted May 27, 1986·18 cites·1 claims
- 2272US10783625B2Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUIHITACHI HIGH TECH CORP·Filed 2017·Granted Sep 22, 2020·1 cites·8 claims
- 2371US9811897B2Defect observation method and defect observation deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Nov 7, 2017·3 cites·12 claims
- 2471US9342879B2Method and apparatus for reviewing defectMINEKAWA YOHEI·Filed 2012·Granted May 17, 2016·3 cites·17 claims
- 2571US7058480B1Power supply control device, apparatus equipped therewith and recording mediumFUJITSU LTD·Filed 2000·Granted Jun 6, 2006·24 cites·14 claims
- 2670US7569758B2Electronic percussion system and electronic percussion instrument incorporated thereinYAMAHA CORP·Filed 2003·Granted Aug 4, 2009·15 cites·20 claims
- 2768US11087454B2Defect observation device and defect observation methodHITACHI HIGH TECH CORP·Filed 2017·Granted Aug 10, 2021·1 cites·9 claims
- 2868US2025124566A1Defect Inspection System and Defect Inspection MethodHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 2967US5632868AMethod and apparatus for generating ozone and methods of its useEBARA CORP·Filed 1995·Granted May 27, 1997·24 cites·1 claims
- 3065US9799112B2Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUIHITACHI HIGH TECH CORP·Filed 2013·Granted Oct 24, 2017·1 cites·19 claims
- 3165US6921063B2Gas dissolved water producing apparatus and method thereof and ultrasonic cleaning equipment and method thereofEBARA CORP·Filed 2002·Granted Jul 26, 2005·10 cites·14 claims
- 3264US6072112AElectronic percussion instrumentYAMAHA CORP·Filed 1998·Granted Jun 6, 2000·24 cites·4 claims
- 3362US8731275B2Method and apparatus for reviewing defectsHARADA MINORU·Filed 2012·Granted May 20, 2014·1 cites·5 claims
- 3458US11260493B2Substrate processing apparatus and control methodEBARA CORP·Filed 2019·Granted Mar 1, 2022·0 cites·9 claims
- 3558US8034924B2Process for production of crystal of purine nucleoside compoundAJINOMOTO KK·Filed 2009·Granted Oct 11, 2011·0 cites·20 claims
- 3657US6932946B2Ozone generatorEBARA CORP·Filed 2001·Granted Aug 23, 2005·3 cites·11 claims
- 3756US5792326AMethod and apparatus for generating ozone and methods of its useFiled 1997·Granted Aug 11, 1998·14 cites·5 claims
- 3852US4731050AAcupressure type moxibustion caseHARADA MINORU·Filed 1986·Granted Mar 15, 1988·29 cites·20 claims
- 3952US2014037188A1Defect review method and apparatusHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 4051US12333695B2Sample observation system and image processing methodHITACHI HIGH TECH CORP·Filed 2021·Granted Jun 17, 2025·0 cites·19 claims
- 4151US11177111B2Defect observation deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Nov 16, 2021·0 cites·15 claims
- 4251US7865935B2Electronic apparatus having security functionFUJITSU TEN LTD·Filed 2007·Granted Jan 4, 2011·0 cites·14 claims
- 4351US5396024AElectric percussion instrument equipped with vibration sensor supported by retainer of vibration-transmissive substanceYAMAHA CORP·Filed 1993·Granted Mar 7, 1995·13 cites·14 claims
- 4449US8634634B2Defect observation method and defect observation apparatusHARADA MINORU·Filed 2009·Granted Jan 21, 2014·0 cites·10 claims
- 4549US2011261190A1Defect observation device and defect observation methodNAKAGAKI RYO·Filed 2009·Application pending·0 cites
- 4649US2010333009A1Operation support apparatus, operation support method and computer programOSHITA ISAO·Filed 2009·Application pending·0 cites
- 4748US12154264B2Defect inspecting system and defect inspecting methodHITACHI HIGH TECH CORP·Filed 2019·Granted Nov 26, 2024·0 cites·9 claims
- 4848USRE47779ESimple electronic musical instrument, player's console and signal processing system incorporated thereinYAMAHA CORP·Filed 2015·Granted Dec 24, 2019·0 cites·45 claims
- 4947US2009139541A1Gas dissolved water producing apparatus and method thereof and ultrasonic cleaning equipment and method thereofOZAWA SUGURU·Filed 2008·Application pending·0 cites
- 5047US2005258960A1Electronic apparatus having security functionHARADA MINORU·Filed 2005·Application pending·0 cites
Showing the top 50 of 66 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →