Inventor · disambiguated record
Michael Kund
Also filed as: KUND MICHAEL
28 granted patents·14 pending applications·440 citations·filing 1999–2011
97Inventor score
Top patents by PatentIndex Score
42 records- 0198US7215568B2Resistive memory arrangementINFINEON TECHNOLOGIES AG·Filed 2005·Granted May 8, 2007·85 cites·15 claims
- 0297US7405418B2Memory device electrode with a surface structureINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jul 29, 2008·81 cites·18 claims
- 0396US7751163B2Electric device protection circuit and method for protecting an electric deviceQIMONDA AG·Filed 2006·Granted Jul 6, 2010·59 cites·31 claims
- 0492US7894253B2Carbon filament memory and fabrication methodQIMONDA AG·Filed 2007·Granted Feb 22, 2011·24 cites·44 claims
- 0582US7436694B2Nonvolatile memory cellINFINEON TECHNOLOGIES AG·Filed 2006·Granted Oct 14, 2008·14 cites·36 claims
- 0682US7372716B2Memory having CBRAM memory cells and methodINFINEON TECHNOLOGIES AG·Filed 2005·Granted May 13, 2008·13 cites·14 claims
- 0781US7561460B2Resistive memory arrangementINFINEON TECHNOLOGIES AG·Filed 2007·Granted Jul 14, 2009·11 cites·20 claims
- 0881US6674627B1Needle-card adjusting device for planarizing needle sets on a needle cardINFINEON TECHNOLOGIES AG·Filed 2000·Granted Jan 6, 2004·25 cites·10 claims
- 0980US7514362B2Integrated circuit including sub-lithographic structuresINFINEON TECHNOLOGIES AG·Filed 2005·Granted Apr 7, 2009·7 cites·11 claims
- 1079US8063394B2Integrated circuitANDRES DIETER·Filed 2008·Granted Nov 22, 2011·12 cites·9 claims
- 1179US7457145B2Write/delete process for resistive switching memory componentsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Nov 25, 2008·12 cites·16 claims
- 1278US7400528B2Intergrated circuit for programming resistive memory cellsQIMONDA AG·Filed 2006·Granted Jul 15, 2008·11 cites·20 claims
- 1373US8595449B2Memory scheduler for managing maintenance operations in a resistive memory in response to a trigger conditionKUND MICHAEL·Filed 2008·Granted Nov 26, 2013·12 cites·24 claims
- 1467US7997791B2Temperature sensor, integrated circuit, memory module, and method of collecting temperature treatment dataQIMONDA AG·Filed 2007·Granted Aug 16, 2011·6 cites·17 claims
- 1565US7337282B2Memory system and process for controlling a memory component to achieve different kinds of memory characteristics on one and the same memory componentINFINEON TECHNOLOGIES AG·Filed 2003·Granted Feb 26, 2008·13 cites·17 claims
- 1665US6256243B1Test circuit for testing a digital semiconductor circuit configurationINFINEON TECHNOLOGIES AG·Filed 2000·Granted Jul 3, 2001·17 cites·21 claims
- 1763US7583527B2Tunable resistor and method for operating a tunable resistorINFINEON TECHNOLOGIES AG·Filed 2006·Granted Sep 1, 2009·3 cites·26 claims
- 1862US7384002B2Chip card and chip card security deviceINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jun 10, 2008·2 cites·18 claims
- 1954US6970006B2Apparatus for the automated testing, calibration and characterization of test adaptersINFINEON TECHNOLOGIES AG·Filed 2004·Granted Nov 29, 2005·7 cites·1 claims
- 2053US9443583B2Resistive memory and methodPACHA CHRISTIAN·Filed 2011·Granted Sep 13, 2016·1 cites·11 claims
- 2153US8063448B2Resistive memory and methodPACHA CHRISTIAN·Filed 2007·Granted Nov 22, 2011·2 cites·21 claims
- 2253US7400526B2Memory element, memory read-out element and memory cellINFINEON TECHNOLOGIES AG·Filed 2006·Granted Jul 15, 2008·3 cites·33 claims
- 2343US2007008863A1Memory comprising a memory device and a write unit configured as a probeLIAW CORVIN·Filed 2005·Application pending·0 cites
- 2442US7230442B2Semi-conductor component testing process and system for testing semi-conductor componentsINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jun 12, 2007·3 cites·4 claims
- 2541US6359457B1Method of holding a wafer and testing the integrated circuits on the waferSIEMENS AG·Filed 1999·Granted Mar 19, 2002·8 cites·4 claims
- 2640US7178071B2Device for and method of examining the signal performance of semiconductor circuitsINFINEON TECHNOLOGIES AG·Filed 2002·Granted Feb 13, 2007·1 cites·36 claims
- 2740US2009073743A1Method of Manufacturing a Memory Cell, Memory Cell, Integrated Circuit, and Memory ModuleKASKO IGOR·Filed 2007·Application pending·0 cites
- 2839US6661694B2Configuration and method for increasing the retention time and the storage security in a ferroelectric or ferromagnetic semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2001·Granted Dec 9, 2003·5 cites·10 claims
- 2939US2008102278A1Carbon filament memory and method for fabricationKREUPL FRANZ·Filed 2006·Application pending·0 cites
- 3036US2007276623A1Semiconductor Component Test Process and a System for Testing Semiconductor ComponentsKUND MICHAEL·Filed 2007·Application pending·0 cites
- 3136US2007166924A1Memory cell and method for fabricating a memory deviceINFINEON TECHNOLOGIES AG·Filed 2004·Application pending·0 cites
- 3235US2007018278A1Semiconductor memory deviceKUND MICHAEL·Filed 2005·Application pending·0 cites
- 3335US2006120138A1Semiconductor memory with volatile and non-volatile memory cellsINFINEON TECHNOLOGIES AG·Filed 2005·Application pending·0 cites
- 3434US7265568B2Semi-conductor component test process and a system for testing semi-conductor componentsINFINEON TECHNOLOGIES AG·Filed 2004·Granted Sep 4, 2007·0 cites·3 claims
- 3534US7127650B2Test method and test device for electronic memoriesINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 24, 2006·3 cites·31 claims
- 3634US2008263415A1Integrated Circuit, Memory Module, Method of Operating an Integrated Circuit, Method of Fabricating an Integrated Circuit, Computer Program Product, and Computing SystemRUF BERNHARD·Filed 2007·Application pending·0 cites
- 3734US2008259676A1Integrated Circuit, Memory Module, Method of Operating an Integrated Circuit, Method of Manufacturing an Integrated Circuit, and Computer Program ProductRUF BERNHARD·Filed 2007·Application pending·0 cites
- 3834US2007274120A1CBRAM cell with a reversible conductive bridging mechanismINFINEON TECHNOLOGIES AG·Filed 2005·Application pending·0 cites
- 3932US2007002619A1Bistable multivibrator with non-volatile state storageSCHOENAUER TIM·Filed 2006·Application pending·0 cites
- 4032US2009103350A1Method of Testing an Integrated Circuit, Method of Manufacturing an Integrated Circuit, and Integrated CircuitKUND MICHAEL·Filed 2007·Application pending·0 cites
- 4130US2002030480A1Apparatus for the automated testing, calibration and characterization of test adaptersFiled 2001·Application pending·0 cites
- 4229US2008049531A1Memory arrangement and method for operating such a memory arrangementKUND MICHAEL·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →