Inventor · disambiguated record
Morgan T. Johnson
Also filed as: JOHNSON JR MORGAN T · JOHNSON MORGAN · JOHNSON MORGAN T
62 granted patents·19 pending applications·587 citations·filing 1986–2025
99Inventor score
Files withADVANCED INQUIRY SYSTEMS INC28JOHNSON MORGAN T13TRANSLARITY INC12MORGAN / WEISS TECH INC3OCTAVIAN SCIENT INC3
Top patents by PatentIndex Score
81 records- 0196US7456643B2Methods for multi-modal wafer testing using edge-extended wafer translatorADVANCED INQUIRY SYSTEMS INC·Filed 2007·Granted Nov 25, 2008·29 cites·9 claims
- 0292US7489148B2Methods for access to a plurality of unsingulated integrated circuits of a wafer using single-sided edge-extended wafer translatorADVANCED INQUIRY SYSTEMS INC·Filed 2007·Granted Feb 10, 2009·18 cites·9 claims
- 0392US7459924B2Apparatus for providing electrical access to one or more pads of the wafer using a wafer translator and a gasketADVANCED INQUIRY SYSTEMS INC·Filed 2007·Granted Dec 2, 2008·18 cites·9 claims
- 0492US7453277B2Apparatus for full-wafer test and burn-in mechanismADVANCED INQUIRY SYSTEMS INC·Filed 2007·Granted Nov 18, 2008·17 cites·10 claims
- 0591US7791174B2Wafer translator having a silicon core isolated from signal paths by a ground planeADVANCED INQUIRY SYSTEMS INC·Filed 2008·Granted Sep 7, 2010·22 cites·15 claims
- 0691US7532022B2Apparatus for fixed-form multi-planar extension of electrical conductors beyond the margins of a substrateADVANCED INQUIRY SYSTEMS INC·Filed 2007·Granted May 12, 2009·15 cites·11 claims
- 0791US7532021B2Apparatus for translated wafer stand-in testerADVANCED INQUIRY SYSTEMS INC·Filed 2007·Granted May 12, 2009·17 cites·5 claims
- 0890US8405414B2Wafer testing systems and associated methods of use and manufactureDURBIN AARON·Filed 2011·Granted Mar 26, 2013·14 cites·10 claims
- 0990US7455915B2Selective application of conductive material to substrates by pick and place of compliant contact arraysJOHNSON MORGAN T·Filed 2006·Granted Nov 25, 2008·16 cites·14 claims
- 1087US8363418B2Above motherboard interposer with peripheral circuitsMORGAN WEISS TECHNOLOGIES INC·Filed 2011·Granted Jan 29, 2013·7 cites·21 claims
- 1186US8872533B2Wafer testing system and associated methods of use and manufactureADVANCED INQUIRY SYSTEMS INC·Filed 2013·Granted Oct 28, 2014·5 cites·11 claims
- 1286US7579852B2Wafer translator having metallization pattern providing high density interdigitated contact pads for componentADVANCED INQUIRY SYSTEMS INC·Filed 2008·Granted Aug 25, 2009·13 cites·12 claims
- 1385US6737879B2Method and apparatus for wafer scale testingMORGAN LABS LLC·Filed 2002·Granted May 18, 2004·32 cites·20 claims
- 1484US8076216B2Methods and apparatus for thinning, testing and singulating a semiconductor waferJOHNSON MORGAN T·Filed 2009·Granted Dec 13, 2011·8 cites·18 claims
- 1584US7724008B2Methods and apparatus for planar extension of electrical conductors beyond the edges of a substrateADVANCED INQUIRY SYSTEMS INC·Filed 2008·Granted May 25, 2010·10 cites·7 claims
- 1684US6991969B2Methods and apparatus for addition of electrical conductors to previously fabricated deviceOCTAVIAN SCIENT INC·Filed 2003·Granted Jan 31, 2006·36 cites·15 claims
- 1782US9052355B2Wafer prober integrated with full-wafer contactorJOHNSON MORGAN T·Filed 2011·Granted Jun 9, 2015·3 cites·14 claims
- 1882US8461024B2Methods and apparatus for thinning, testing and singulating a semiconductor waferJOHNSON MORGAN T·Filed 2011·Granted Jun 11, 2013·4 cites·11 claims
- 1982US7379641B1Fiber-based optical alignment systemADVANCED INQUIRY SYSTEMS INC·Filed 2007·Granted May 27, 2008·8 cites·18 claims
- 2081US9086874B2Above motherboard interposer with quarter wavelength electrical pathsJOHNSON MORGAN·Filed 2012·Granted Jul 21, 2015·4 cites·5 claims
- 2181US6878901B2Laser micromachining and electrical structures formed therebyMORGAN MILLER TECHNOLOGIES LLC·Filed 2004·Granted Apr 12, 2005·23 cites·31 claims
- 2280US7723980B2Fully tested wafers having bond pads undamaged by probing and applications thereofADVANCED INQUIRY SYSTEMS INC·Filed 2008·Granted May 25, 2010·7 cites·7 claims
- 2379US8476630B2Methods of adding pads and one or more interconnect layers to the passivated topside of a wafer including connections to at least a portion of the integrated circuit pads thereonJOHNSON MORGAN T·Filed 2011·Granted Jul 2, 2013·3 cites·12 claims
- 2477US7960986B2Methods and apparatus for multi-modal wafer testingADVANCED INQUIRY SYSTEMS INC·Filed 2008·Granted Jun 14, 2011·6 cites·14 claims
- 2577US7282931B2Full wafer contacter and applications thereofOCTAVIAN SCIENT INC·Filed 2004·Granted Oct 16, 2007·26 cites·12 claims
- 2677US5937515AReconfigurable circuit fabrication methodFiled 1997·Granted Aug 17, 1999·51 cites·10 claims
- 2774US7572132B2Methods and apparatus for flexible extension of electrical conductors beyond the edges of a substrateADVANCED INQUIRY SYSTEMS INC·Filed 2007·Granted Aug 11, 2009·9 cites·12 claims
- 2873US2025390077A1General purpose command system and interface for a live broadcastPGA TOUR ENTPR LLC·Filed 2025·Application pending·0 cites
- 2972US6836130B2Method and apparatus for wafer scale testingFiled 2003·Granted Dec 28, 2004·13 cites·20 claims
- 3071US7875826B2Variable width conductive lines having substantially constant impedanceEFFICERE INC·Filed 2007·Granted Jan 25, 2011·5 cites·13 claims
- 3171US6994918B2Selective application of conductive material to circuit boards by pick and placeJOHNSON MORGAN T·Filed 2004·Granted Feb 7, 2006·12 cites·6 claims
- 3270US12399476B2General purpose command system and interface for a live broadcastPGA TOUR ENTPR LLC·Filed 2024·Granted Aug 26, 2025·0 cites·20 claims
- 3370US8779789B2Translators coupleable to opposing surfaces of microelectronic substrates for testing, and associated systems and methodsADVANCED INQUIRY SYSTEMS INC·Filed 2013·Granted Jul 15, 2014·2 cites·19 claims
- 3469US9357648B2Above motherboard interposer with quarter wavelength electrical pathsMORGAN WEISS TECHNOLOGIES INC·Filed 2015·Granted May 31, 2016·1 cites·5 claims
- 3569US7786745B2Method and apparatus for single-sided extension of electrical conductors beyond the edges of a substrateADVANCED INQUIRY SYSTEMS INC·Filed 2008·Granted Aug 31, 2010·9 cites·10 claims
- 3668US8889526B2Apparatus for thinning, testing and singulating a semiconductor waferADVANCED INQUIRY SYSTEMS INC·Filed 2013·Granted Nov 18, 2014·1 cites·16 claims
- 3768US4720470AMethod of making electrical circuitryLASERPATH CORP·Filed 1986·Granted Jan 19, 1988·38 cites·28 claims
- 3868US4700214AElectrical circuitryLASERPATH CORP·Filed 1987·Granted Oct 13, 1987·36 cites·14 claims
- 3966US7719298B2Full-wafer test and burn-in mechanismADVANCED INQUIRY SYSTEMS INC·Filed 2008·Granted May 18, 2010·3 cites·14 claims
- 4066US6043990AMultiple board package employing solder balis and fabrication method and apparatusPROTOTYPE SOLUTIONS CORP·Filed 1997·Granted Mar 28, 2000·31 cites·31 claims
- 4165US8088634B2Methods of adding pads and one or more interconnect layers to the passivated topside of a wafer including connections to at least a portion of the integrated circuit pads thereonJOHNSON MORGAN T·Filed 2009·Granted Jan 3, 2012·1 cites·14 claims
- 4263US9494618B2Designed asperity contactors, including nanospikes, for semiconductor test using a package, and associated systems and methodsTRANSLARITY INC·Filed 2013·Granted Nov 15, 2016·1 cites·16 claims
- 4361US10884955B2Stacked and folded above motherboard interposerMORGAN/WEISS TECH INC·Filed 2019·Granted Jan 5, 2021·0 cites·5 claims
- 4461US2017219627A1Wafer prober integrated with full-wafer contactorTRANSLARITY INC·Filed 2017·Application pending·0 cites
- 4560US12418705B2Platform to manipulate golf data to enable creation of broadcast production graphicsPGA TOUR ENTPR LLC·Filed 2024·Granted Sep 16, 2025·0 cites·18 claims
- 4660US10571489B2Wafer testing system and associated methods of use and manufactureTRANSLARITY INC·Filed 2017·Granted Feb 25, 2020·0 cites·17 claims
- 4759US10423544B2Interposer with high bandwidth connections between a central processor and memoryMORGAN / WEISS TECH INC·Filed 2019·Granted Sep 24, 2019·0 cites·6 claims
- 4859US7724018B2Methods and apparatus for translated wafer stand-in testerADVANCED INQUIRY SYSTEMS INC·Filed 2009·Granted May 25, 2010·2 cites·10 claims
- 4959US7638366B2Methods and apparatus for addition of electrical conductors to previously fabricated deviceADVANCED INQUIRY SYSTEMS INC·Filed 2006·Granted Dec 29, 2009·1 cites·15 claims
- 5058US9612278B2Wafer prober integrated with full-wafer contacterTRANSLARITY INC·Filed 2015·Granted Apr 4, 2017·0 cites·22 claims
Showing the top 50 of 81 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →