Inventor · disambiguated record
Mohan Mahadevan
Also filed as: MAHADEVAN MOHAN
27 granted patents·3 pending applications·348 citations·filing 2008–2025
96Inventor score
Top patents by PatentIndex Score
30 records- 0196US9772297B2Apparatus and methods for combined brightfield, darkfield, and photothermal inspectionKLA TENCOR CORP·Filed 2015·Granted Sep 26, 2017·12 cites·13 claims
- 0295US8126255B2Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functionsBHASKAR KRIS·Filed 2008·Granted Feb 28, 2012·174 cites·61 claims
- 0394US10360477B2Accelerating semiconductor-related computations using learning based modelsKLA TENCOR CORP·Filed 2017·Granted Jul 23, 2019·22 cites·39 claims
- 0493US10395362B2Contour based defect detectionKLA TENCOR CORP·Filed 2018·Granted Aug 27, 2019·24 cites·27 claims
- 0593US9734568B2Automated inline inspection and metrology using shadow-gram imagesKLA TENCOR CORP·Filed 2015·Granted Aug 15, 2017·15 cites·15 claims
- 0693US8223327B2Systems and methods for detecting defects on a waferCHEN LU·Filed 2009·Granted Jul 17, 2012·24 cites·24 claims
- 0791US9645097B2In-line wafer edge inspection, wafer pre-alignment, and wafer cleaningKLA TENCOR CORP·Filed 2015·Granted May 9, 2017·10 cites·21 claims
- 0890US10733744B2Learning based approach for aligning images acquired with different modalitiesKLA TENCOR CORP·Filed 2018·Granted Aug 4, 2020·13 cites·25 claims
- 0988US11580375B2Accelerated training of a machine learning based model for semiconductor applicationsKLA TENCOR CORP·Filed 2016·Granted Feb 14, 2023·9 cites·37 claims
- 1088US10607119B2Unified neural network for defect detection and classificationKLA TENCOR CORP·Filed 2017·Granted Mar 31, 2020·8 cites·26 claims
- 1187US12205294B2Methods and systems for authentication of a physical documentONFIDO LTD·Filed 2022·Granted Jan 21, 2025·2 cites·52 claims
- 1287US10605744B2Systems and methods for detecting defects on a waferKLA TENCOR CORP·Filed 2018·Granted Mar 31, 2020·3 cites·3 claims
- 1386US11657631B2Scalable, flexible and robust template-based data extraction pipelineONFIDO LTD·Filed 2021·Granted May 23, 2023·10 cites·15 claims
- 1486US10533954B2Apparatus and methods for combined brightfield, darkfield, and photothermal inspectionKLA TENCOR CORP·Filed 2017·Granted Jan 14, 2020·2 cites·9 claims
- 1586US9880107B2Systems and methods for detecting defects on a waferKLA TENCOR CORP·Filed 2013·Granted Jan 30, 2018·5 cites·44 claims
- 1685US9640449B2Automated inline inspection of wafer edge strain profiles using rapid photoreflectance spectroscopyKLA TENCOR CORP·Filed 2015·Granted May 2, 2017·5 cites·21 claims
- 1785US8467047B2Systems and methods for detecting defects on a waferCHEN LU·Filed 2012·Granted Jun 18, 2013·5 cites·17 claims
- 1878US12423788B2Generalized anomaly detectionONFIDO LTD·Filed 2022·Granted Sep 23, 2025·1 cites·17 claims
- 1976US11237872B2Semiconductor inspection and metrology systems for distributing job among the CPUs or GPUs based on logical image processing boundariesKLA TENCOR CORP·Filed 2018·Granted Feb 1, 2022·3 cites·13 claims
- 2073US2025371695A1Generalized anomaly detectionONFIDO LTD·Filed 2025·Application pending·0 cites
- 2162US12499548B2Methods and systems for authentication of a physical documentONFIDO LTD·Filed 2022·Granted Dec 16, 2025·0 cites·59 claims
- 2261US10290088B2Wafer and lot based hierarchical method combining customized metrics with a global classification methodology to monitor process tool condition at extremely high throughputKLA TENCOR CORP·Filed 2014·Granted May 14, 2019·1 cites·19 claims
- 2352US2025246018A1Systems and methods for generating and deploying fraud detection training data for physical identification documentsONFIDO LTD·Filed 2024·Application pending·0 cites
- 2448US10769761B2Generating high resolution images from low resolution images for semiconductor applicationsKLA TENCOR CORP·Filed 2018·Granted Sep 8, 2020·0 cites·24 claims
- 2546US12183107B2Signal-based machine learning fraud detectionONFIDO LTD·Filed 2022·Granted Dec 31, 2024·0 cites·20 claims
- 2643US9569834B2Automated image-based process monitoring and controlKLA TENCOR CORP·Filed 2015·Granted Feb 14, 2017·0 cites·12 claims
- 2738US12067796B2Method for detecting fraud in documentsONFIDO LTD·Filed 2022·Granted Aug 20, 2024·0 cites·29 claims
- 2838US9360863B2Data perturbation for wafer inspection or metrology setup using a model of a differenceTHATTAISUNDARAM GOVIND·Filed 2011·Granted Jun 7, 2016·0 cites·39 claims
- 2937US2021125104A1Machine learning inference systemONFIDO LTD·Filed 2020·Application pending·0 cites
- 3036US9053390B2Automated inspection scenario generationMAHADEVAN MOHAN·Filed 2012·Granted Jun 9, 2015·0 cites·17 claims
Join the waitlist — get patent alerts
Get an alert when Mohan Mahadevan files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →