Inventor · disambiguated record
Moran Zaberchik
Also filed as: ZABERCHIK MORAN
4 granted patents·4 citations·filing 2018–2022
60Inventor score
Top patents by PatentIndex Score
4 records- 0183US10622238B2Overlay measurement using phase and amplitude modelingKLA TENCOR CORP·Filed 2018·Granted Apr 14, 2020·4 cites·17 claims
- 0267US12347706B2Method for measuring and correcting misregistration between layers in a semiconductor device, and misregistration targets useful thereinKLA TENCOR CORP·Filed 2022·Granted Jul 1, 2025·0 cites·14 claims
- 0355US11302544B2Method for measuring and correcting misregistration between layers in a semiconductor device, and misregistration targets useful thereinKLA TENCOR CORP·Filed 2019·Granted Apr 12, 2022·0 cites·13 claims
- 0451US11640117B2Selection of regions of interest for measurement of misregistration and amelioration thereofKLA CORP·Filed 2020·Granted May 2, 2023·0 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →