Inventor · disambiguated record
Nagesh Tamarapalli
Also filed as: TAMARAPALLI NAGESH
18 granted patents·2 pending applications·630 citations·filing 1996–2013
96Inventor score
Top patents by PatentIndex Score
20 records- 0198US7523372B2Phase shifter with reduced linear dependencyRAJSKI JANUSZ·Filed 2007·Granted Apr 21, 2009·42 cites·21 claims
- 0297US7653851B2Phase shifter with reduced linear dependencyRAJSKI JANUSZ·Filed 2009·Granted Jan 26, 2010·32 cites·18 claims
- 0397US7512508B2Determining and analyzing integrated circuit yield and qualityRAJSKI JANUSZ·Filed 2005·Granted Mar 31, 2009·54 cites·57 claims
- 0497US6874109B1Phase shifter with reduced linear dependencyFiled 2000·Granted Mar 29, 2005·108 cites·47 claims
- 0596US7987442B2Fault dictionaries for integrated circuit yield and quality analysis methods and systemsMENTOR GRAPHICS CORP·Filed 2005·Granted Jul 26, 2011·38 cites·42 claims
- 0694US7263641B2Phase shifter with reduced linear dependencyRAJSKI JANUSZ·Filed 2004·Granted Aug 28, 2007·51 cites·19 claims
- 0794US6966021B2Method and apparatus for at-speed testing of digital circuitsRAJSKI JANUSZ·Filed 2002·Granted Nov 15, 2005·84 cites·23 claims
- 0887US7239978B2Compactor independent fault diagnosisCHENG WU-TUNG·Filed 2004·Granted Jul 3, 2007·45 cites·46 claims
- 0985US6452426B1Circuit for switching between multiple clocksFiled 2001·Granted Sep 17, 2002·54 cites·41 claims
- 1082US7437636B2Method and apparatus for at-speed testing of digital circuitsRAJSKI JANUSZ·Filed 2005·Granted Oct 14, 2008·10 cites·24 claims
- 1181US7805651B2Phase shifter with reduced linear dependencyMENTOR GRAPHICS CORP·Filed 2009·Granted Sep 28, 2010·6 cites·14 claims
- 1278US8438438B2Enhanced diagnosis with limited failure cyclesHUANG YU·Filed 2010·Granted May 7, 2013·3 cites·20 claims
- 1378US7840862B2Enhanced diagnosis with limited failure cyclesMENTOR GRAPHICS CORP·Filed 2006·Granted Nov 23, 2010·7 cites·39 claims
- 1473US8301414B2Compactor independent fault diagnosisCHENG WU-TUNG·Filed 2007·Granted Oct 30, 2012·5 cites·29 claims
- 1567US6070261AMulti-phase test point insertion for built-in self test of integrated circuitsMENTOR GRAPHICS CORP·Filed 1998·Granted May 30, 2000·42 cites·19 claims
- 1666US8595574B2Enhanced diagnosis with limited failure cyclesMENTOR GRAPHICS CORP·Filed 2013·Granted Nov 26, 2013·1 cites·14 claims
- 1765US5737340AMulti-phase test point insertion for built-in self test of integrated circuitsMENTOR GRAPHICS CORP·Filed 1996·Granted Apr 7, 1998·39 cites·28 claims
- 1858US6920597B2Uniform testing of tristate nets in logic BISTFiled 2002·Granted Jul 19, 2005·9 cites·31 claims
- 1947US2009210183A1Determining and analyzing integrated circuit yield and qualityRAJSKI JANUSZ·Filed 2009·Application pending·0 cites
- 2042US2003084390A1At-speed test using on-chip controllerMENTOR GRAPHICS CORP·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →