Inventor · disambiguated record
Naoya Watanabe
Also filed as: WATANABE NAOYA
79 granted patents·13 pending applications·1,773 citations·filing 1990–2025
99Inventor score
Files withMITSUBISHI ELECTRIC CORP20CANON KK14RENESAS ELECTRONICS CORP7SII NANOTECHNOLOGY INC7WATANABE NAOYA7
Top patents by PatentIndex Score
92 records- 0198US5404338ASynchronous type semiconductor memory device operating in synchronization with an external clock signalMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Apr 4, 1995·242 cites·71 claims
- 0296US5994934ADelay locked loop circuitMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Nov 30, 1999·142 cites·13 claims
- 0396US5963502AClock-synchronous type semiconductor memory device capable of outputting read clock signal at correct timingMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Oct 5, 1999·175 cites·9 claims
- 0496US5517462ASynchronous type semiconductor memory device operating in synchronization with an external clock signalMITSUBISHI ELECTRIC CORP·Filed 1995·Granted May 14, 1996·81 cites·11 claims
- 0595US6418067B1Semiconductor memory device suitable for merging with logicMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jul 9, 2002·97 cites·28 claims
- 0694US8838364B2Control device of spark-ignition gasoline engineNAGATSU KAZUHIRO·Filed 2012·Granted Sep 16, 2014·20 cites·16 claims
- 0794US8164934B2Content addressable memoryWATANABE NAOYA·Filed 2010·Granted Apr 24, 2012·18 cites·4 claims
- 0893US6292040B1Internal clock signal generating circuit having function of generating internal clock signals which are multiplication of an external clock signalMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Sep 18, 2001·90 cites·11 claims
- 0990US8441828B2Content addressable memoryWATANABE NAOYA·Filed 2012·Granted May 14, 2013·10 cites·8 claims
- 1088US8655572B2Control device of spark-ignition gasoline engineIWAI KOUHEI·Filed 2012·Granted Feb 18, 2014·14 cites·16 claims
- 1187US6101151ASynchronous semiconductor memory device employing temporary data output stop schemeMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Aug 8, 2000·68 cites·5 claims
- 1286US6392897B1Circuit moduleMITSUBISHI ELECTRIC CORP·Filed 1998·Granted May 21, 2002·66 cites·19 claims
- 1385US7113976B2Communication apparatus and control method of the sameCANON KK·Filed 2002·Granted Sep 26, 2006·47 cites·11 claims
- 1484US5956349ASemiconductor memory device for high speed data communication capable of accurate testing of pass/fail and memory system employing the sameMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Sep 21, 1999·55 cites·14 claims
- 1583US6421291B1Semiconductor memory device having high data input/output frequency and capable of efficiently testing circuit associated with data input/outputMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jul 16, 2002·34 cites·27 claims
- 1683US6249476B1Semiconductor memory device suitable for mounting mixed with logic circuit, having short cycle time in reading operationMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jun 19, 2001·35 cites·14 claims
- 1782US8866700B2Mobile electronic deviceINAMI AKIKO·Filed 2012·Granted Oct 21, 2014·6 cites·18 claims
- 1882US8310852B2Content addressable memoryWATANABE NAOYA·Filed 2012·Granted Nov 13, 2012·5 cites·1 claims
- 1981US6378102B1Synchronous semiconductor memory device with multi-bank configurationMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Apr 23, 2002·23 cites·6 claims
- 2080US7107826B2Scanning probe device and processing method by scanning probeSII NANOTECHNOLOGY INC·Filed 2005·Granted Sep 19, 2006·6 cites·23 claims
- 2180US6091659ASynchronous semiconductor memory device with multi-bank configurationMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Jul 18, 2000·36 cites·9 claims
- 2279US5956285ASynchronous semiconductor memory device with multi-bank configurationMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Sep 21, 1999·35 cites·9 claims
- 2379US5798906ACapacitorHONDA MOTOR CO LTD·Filed 1997·Granted Aug 25, 1998·59 cites·13 claims
- 2478US9627347B2Method of manufacturing semiconductor device and semiconductor device manufacturing apparatusNAT INST ADVANCED IND SCIENCE & TECH·Filed 2013·Granted Apr 18, 2017·8 cites·14 claims
- 2578US9620214B2Content addressable memory with reduced power consumption and increased search operation speedRENESAS ELECTRONICS CORP·Filed 2015·Granted Apr 11, 2017·3 cites·2 claims
- 2678US6888776B2Semiconductor memory deviceMITSUBISHI ELECTRIC ENG·Filed 2002·Granted May 3, 2005·22 cites·16 claims
- 2776US9824757B2Semiconductor device including TCAM cell arrays capable of skipping TCAM-cell search in response to control signalRENESAS ELECTRONICS CORP·Filed 2016·Granted Nov 21, 2017·3 cites·17 claims
- 2875US9400522B2Multiple display portable terminal apparatus with position-based display modesINAMI AKIKO·Filed 2012·Granted Jul 26, 2016·4 cites·15 claims
- 2974US8706382B2Control device of spark-ignition gasoline engineOBA SHUJI·Filed 2012·Granted Apr 22, 2014·5 cites·13 claims
- 3074US6473352B2Semiconductor integrated circuit device having efficiently arranged link program circuitryMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Oct 29, 2002·22 cites·13 claims
- 3174US5689289AImage recording apparatusCANON KK·Filed 1994·Granted Nov 18, 1997·32 cites·8 claims
- 3272US9818645B2Through electrode, manufacturing method thereof, and semiconductor device and manufacturing method thereofAIST·Filed 2016·Granted Nov 14, 2017·2 cites·4 claims
- 3371US9547382B2Mobile electronic deviceKYOCERA CORP·Filed 2014·Granted Jan 17, 2017·2 cites·4 claims
- 3469US7285792B2Scratch repairing processing method and scanning probe microscope (SPM) used thereforSII NANOTECHNOLOGY INC·Filed 2005·Granted Oct 23, 2007·4 cites·18 claims
- 3569US6160434ANinety-degree phase shifterMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Dec 12, 2000·23 cites·20 claims
- 3668US7954471B2Spark ignited internal combustion engine and manufacturing the sameMAZDA MOTOR·Filed 2009·Granted Jun 7, 2011·7 cites·21 claims
- 3768US7259372B2Processing method using probe of scanning probe microscopeSII NANOTECHNOLOGY INC·Filed 2005·Granted Aug 21, 2007·4 cites·14 claims
- 3868US6304502B1Semiconductor memory device connected to memory controller and memory system employing the sameMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Oct 16, 2001·26 cites·18 claims
- 3966US8214915B2Cantilever, cantilever system, scanning probe microscope, mass sensor apparatus, viscoelasticity measuring instrument, manipulation apparatus, displacement determination method of cantilever, vibration method of cantilever and deformation method of cantileverSHIGENO MASATSUGU·Filed 2009·Granted Jul 3, 2012·4 cites·32 claims
- 4066US6770188B2Part fabricating methodSEIKO INSTR INC·Filed 2002·Granted Aug 3, 2004·7 cites·24 claims
- 4165US7092305B2Semiconductor memory deviceMITSUBISHI ELECTRIC ENG·Filed 2004·Granted Aug 15, 2006·12 cites·6 claims
- 4264US10121541B2Semiconductor device and information processing systemRENESAS ELECTRONICS CORP·Filed 2016·Granted Nov 6, 2018·2 cites·16 claims
- 4364US7232995B2Method of removing particle of photomask using atomic force microscopeSII NANOTECHNOLOGY INC·Filed 2005·Granted Jun 19, 2007·1 cites·6 claims
- 4463US6968207B1Communication system capable of speech and facsimile communicationCANON KK·Filed 2000·Granted Nov 22, 2005·6 cites·8 claims
- 4563US5832190AImage recording apparatus with reliable, efficient and power-saving stand-by stateCANON KK·Filed 1997·Granted Nov 3, 1998·27 cites·25 claims
- 4663US2025158356A1Optical TransmitterNIPPON TELEGRAPH & TELEPHONE·Filed 2023·Application pending·0 cites
- 4762US10068646B2Semiconductor device including TCAM cell arrays capable of skipping TCAM-cell search in response to control signalRENESAS ELECTRONICS CORP·Filed 2017·Granted Sep 4, 2018·1 cites·7 claims
- 4861US10688957B2Seatbelt moving deviceTOKAI RIKA CO LTD·Filed 2017·Granted Jun 23, 2020·1 cites·4 claims
- 4961US7456400B2Scanning probe microscope and scanning methodSEIKO INSTR INC·Filed 2005·Granted Nov 25, 2008·7 cites·18 claims
- 5061US7372760B2Semiconductor device and entry into test mode without use of unnecessary terminalFUJITSU LTD·Filed 2005·Granted May 13, 2008·5 cites·8 claims
Showing the top 50 of 92 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Naoya Watanabe files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →