Inventor · disambiguated record
Nilanjan Mukherjee
Also filed as: MUKHERJEE NILANJAN
92 granted patents·11 pending applications·2,466 citations·filing 1998–2021
99Inventor score
Top patents by PatentIndex Score
103 records- 0199US7913137B2On-chip comparison and response collection tools and techniquesMENTOR GRAPHICS CORP·Filed 2007·Granted Mar 22, 2011·60 cites·5 claims
- 0299US6829740B2Method and apparatus for selectively compacting test responsesFiled 2003·Granted Dec 7, 2004·143 cites·23 claims
- 0399US6684358B1Decompressor/PRPG for applying pseudo-random and deterministic test patternsFiled 2000·Granted Jan 27, 2004·212 cites·41 claims
- 0499US6557129B1Method and apparatus for selectively compacting test responsesFiled 2000·Granted Apr 29, 2003·237 cites·68 claims
- 0599US6543020B2Test pattern compression for an integrated circuit test environmentFiled 2001·Granted Apr 1, 2003·143 cites·27 claims
- 0699US6327687B1Test pattern compression for an integrated circuit test environmentFiled 2000·Granted Dec 4, 2001·204 cites·30 claims
- 0798US7509546B2Test pattern compression for an integrated circuit test environmentRAJSKI JANUSZ·Filed 2006·Granted Mar 24, 2009·47 cites·21 claims
- 0898US7506232B2Decompressor/PRPG for applying pseudo-random and deterministic test patternsRAJSKI JANUSZ·Filed 2006·Granted Mar 17, 2009·47 cites·12 claims
- 0998US7111209B2Test pattern compression for an integrated circuit test environmentRAJSKI JANUSZ·Filed 2003·Granted Sep 19, 2006·92 cites·19 claims
- 1098US7093175B2Decompressor/PRPG for applying pseudo-random and deterministic test patternsRAJSKI JANUSZ·Filed 2003·Granted Aug 15, 2006·102 cites·12 claims
- 1197US9116727B2Scalable network overlay virtualization using conventional virtual switchesLENOVO ENTPR SOLUTIONS SINGAPORE PTE LTD·Filed 2013·Granted Aug 25, 2015·50 cites·23 claims
- 1296US8418007B2On-chip comparison and response collection tools and techniquesMUKHERJEE NILANJAN·Filed 2011·Granted Apr 9, 2013·12 cites·12 claims
- 1396US7805649B2Method and apparatus for selectively compacting test responsesMENTOR GRAPHICS CORP·Filed 2009·Granted Sep 28, 2010·26 cites·21 claims
- 1496US7500163B2Method and apparatus for selectively compacting test responsesRAJSKI JANUSZ·Filed 2004·Granted Mar 3, 2009·60 cites·22 claims
- 1596US7260591B2Method for synthesizing linear finite state machinesRAJSKI JANUSZ·Filed 2004·Granted Aug 21, 2007·53 cites·20 claims
- 1696US6353842B1Method for synthesizing linear finite state machinesFiled 2000·Granted Mar 5, 2002·98 cites·35 claims
- 1795US6708192B2Method for synthesizing linear finite state machinesFiled 2003·Granted Mar 16, 2004·78 cites·19 claims
- 1894US8792489B2Communication transport protocol for distributed information technology architecturesANANTHARAM SUSHMA·Filed 2012·Granted Jul 29, 2014·25 cites·5 claims
- 1994US8767722B2Data traffic handling in a distributed fabric protocol (DFP) switching network architectureKAMBLE KESHAV·Filed 2012·Granted Jul 1, 2014·25 cites·28 claims
- 2094US8166359B2Selective per-cycle masking of scan chains for system level testRAJSKI JANUSZ·Filed 2008·Granted Apr 24, 2012·19 cites·17 claims
- 2194US7900104B2Test pattern compression for an integrated circuit test environmentMENTOR GRAPHICS CORP·Filed 2009·Granted Mar 1, 2011·17 cites·21 claims
- 2294US7487419B2Reduced-pin-count-testing architectures for applying test patternsMUKHERJEE NILANJAN·Filed 2005·Granted Feb 3, 2009·62 cites·47 claims
- 2394US7434131B2Flexible memory built-in-self-test (MBIST) method and apparatusMUKHERJEE NILANJAN·Filed 2005·Granted Oct 7, 2008·32 cites·27 claims
- 2494US6539409B2Method for synthesizing linear finite state machinesFiled 2001·Granted Mar 25, 2003·75 cites·18 claims
- 2593US9722922B2Switch routing table utilizing software defined network (SDN) controller programmed route segregation and prioritizationIBM·Filed 2015·Granted Aug 1, 2017·11 cites·20 claims
- 2693US8726112B2Scan test application through high-speed serial input/outputsRAJSKI JANUSZ·Filed 2009·Granted May 13, 2014·28 cites·44 claims
- 2792US8914694B2On-chip comparison and response collection tools and techniquesMENTOR GRAPHICS CORP·Filed 2013·Granted Dec 16, 2014·6 cites·10 claims
- 2892US8108743B2Method and apparatus for selectively compacting test responsesRAJSKI JANUSZ·Filed 2010·Granted Jan 31, 2012·7 cites·17 claims
- 2992US7865794B2Decompressor/PRPG for applying pseudo-random and deterministic test patternsMENTOR GRAPHICS CORP·Filed 2009·Granted Jan 4, 2011·14 cites·18 claims
- 3092US7478296B2Continuous application and decompression of test patterns to a circuit-under-testRAJSKI JANUSZ·Filed 2003·Granted Jan 13, 2009·46 cites·16 claims
- 3192US7426668B2Performing memory built-in-self-test (MBIST)MUKHERJEE NILANJAN·Filed 2005·Granted Sep 16, 2008·27 cites·23 claims
- 3291US9250287B2On-chip comparison and response collection tools and techniquesMENTOR GRAPHICS CORP·Filed 2014·Granted Feb 2, 2016·5 cites·10 claims
- 3391US8499209B2At-speed scan testing with controlled switching activityRAJSKI JANUSZ·Filed 2010·Granted Jul 30, 2013·12 cites·23 claims
- 3491US6148425ABist architecture for detecting path-delay faults in a sequential circuitLUCENT TECHNOLOGIES INC·Filed 1998·Granted Nov 14, 2000·95 cites·8 claims
- 3590US7877656B2Continuous application and decompression of test patterns to a circuit-under-testMENTOR GRAPHICS CORP·Filed 2009·Granted Jan 25, 2011·16 cites·19 claims
- 3689US8867403B2Virtual network overlaysBISWAS AMITABHA·Filed 2011·Granted Oct 21, 2014·9 cites·7 claims
- 3788US11585853B2Trajectory-optimized test pattern generation for built-in self-testSIEMENS IND SOFTWARE INC·Filed 2020·Granted Feb 21, 2023·2 cites·16 claims
- 3888US9225635B2Switch routing table utilizing software defined network (SDN) controller programmed route segregation and prioritizationIBM·Filed 2013·Granted Dec 29, 2015·10 cites·20 claims
- 3988US7428680B2Programmable memory built-in-self-test (MBIST) method and apparatusMUKHERJEE NILANJAN·Filed 2005·Granted Sep 23, 2008·17 cites·21 claims
- 4087US8861401B2Layer 2 packet switching without look-up table for ethernet switchesANANTHARAM SUSHMA·Filed 2012·Granted Oct 14, 2014·8 cites·22 claims
- 4187US8789164B2Scalable virtual appliance cloud (SVAC) and devices usable in an SVACKAMBLE KESHAV G·Filed 2012·Granted Jul 22, 2014·8 cites·25 claims
- 4286US8533547B2Continuous application and decompression of test patterns and selective compaction of test responsesRAJSKI JANUSZ·Filed 2011·Granted Sep 10, 2013·6 cites·11 claims
- 4385US7493540B1Continuous application and decompression of test patterns to a circuit-under-testRAJSKI JANSUZ·Filed 2000·Granted Feb 17, 2009·44 cites·37 claims
- 4485US6934897B2Scheduling the concurrent testing of multiple cores embedded in an integrated circuitFiled 2002·Granted Aug 23, 2005·41 cites·37 claims
- 4584US9450868B2Layer 2 packet switching without look-up table for ethernet switchesIBM·Filed 2013·Granted Sep 20, 2016·5 cites·19 claims
- 4682US9088522B2Test scheduling with pattern-independent test access mechanismRAJSKI JANUSZ·Filed 2012·Granted Jul 21, 2015·5 cites·18 claims
- 4782US8942139B2Support for converged traffic over ethernet link aggregation (LAG)IBM·Filed 2012·Granted Jan 27, 2015·7 cites·14 claims
- 4882US8726113B2Selective per-cycle masking of scan chains for system level testRAJSKI JANUSZ·Filed 2012·Granted May 13, 2014·4 cites·25 claims
- 4982US6363506B1Method for self-testing integrated circuitsAGERE SYST GUARDIAN CORP·Filed 1999·Granted Mar 26, 2002·49 cites·26 claims
- 5081US11232246B2Layout-friendly test pattern decompressorSIEMENS IND SOFTWARE INC·Filed 2020·Granted Jan 25, 2022·1 cites·18 claims
Showing the top 50 of 103 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →