Inventor · disambiguated record
Noriaki Arai
Also filed as: ARAI NORIAKI
31 granted patents·10 pending applications·173 citations·filing 1997–2023
96Inventor score
Files withHITACHI HIGH TECH CORP20ARAI NORIAKI4CALIFORNIA INST OF TECHN4SHICHI HIROYASU4HITACHI LTD3
Top patents by PatentIndex Score
41 records- 0194US8263943B2Ion beam deviceSHICHI HIROYASU·Filed 2010·Granted Sep 11, 2012·16 cites·20 claims
- 0292US7705300B2Charged particle beam adjusting method and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2005·Granted Apr 27, 2010·15 cites·11 claims
- 0390US7282722B2Charged particle beam apparatus and charged particle beam irradiation methodHITACHI HIGH TECH CORP·Filed 2005·Granted Oct 16, 2007·10 cites·10 claims
- 0488US11760698B2Freeze-cast ceramic membrane for size based filtrationCALIFORNIA INST OF TECHN·Filed 2021·Granted Sep 19, 2023·1 cites·44 claims
- 0588US7408172B2Charged particle beam apparatus and charged particle beam irradiation methodHITACHI HIGH TECH CORP·Filed 2007·Granted Aug 5, 2008·8 cites·10 claims
- 0687US11242290B2Freeze-cast ceramic membrane for size based filtrationCALIFORNIA INST OF TECHN·Filed 2019·Granted Feb 8, 2022·2 cites·35 claims
- 0787US8153966B2Electrode unit and charged particle beam deviceARAI NORIAKI·Filed 2009·Granted Apr 10, 2012·11 cites·17 claims
- 0887US7459681B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2005·Granted Dec 2, 2008·8 cites·15 claims
- 0985US10707046B2Electron source and electron beam device using the sameHITACHI HIGH TECH CORP·Filed 2017·Granted Jul 7, 2020·3 cites·13 claims
- 1085US6555819B1Scanning electron microscopeHITACHI LTD·Filed 2000·Granted Apr 29, 2003·19 cites·22 claims
- 1184US6956211B2Charged particle beam apparatus and charged particle beam irradiation methodHITACHI HIGH TECH CORP·Filed 2003·Granted Oct 18, 2005·15 cites·14 claims
- 1281US12157705B2Freeze-cast ceramic membrane for size based filtrationCALIFORNIA INST OF TECHN·Filed 2023·Granted Dec 3, 2024·0 cites·28 claims
- 1379US10522319B2Electron beam apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Dec 31, 2019·2 cites·15 claims
- 1479US8847173B2Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing sameKAWANAMI YOSHIMI·Filed 2011·Granted Sep 30, 2014·5 cites·9 claims
- 1579US8563944B2Ion beam deviceSHICHI HIROYASU·Filed 2012·Granted Oct 22, 2013·3 cites·5 claims
- 1676US10996216B2Method for separating cells, and device thereforTOPPAN PRINTING CO LTD·Filed 2016·Granted May 4, 2021·1 cites·7 claims
- 1776US7381951B2Charged particle beam adjustment method and apparatusHITACHI HIGH TECH CORP·Filed 2005·Granted Jun 3, 2008·4 cites·9 claims
- 1876US5738145AValve assembly for gas cylinderNERIKI KK·Filed 1997·Granted Apr 14, 1998·42 cites·12 claims
- 1975US8835884B2Charged particle beam apparatus with cleaning photo-irradiation apparatusARAI NORIAKI·Filed 2011·Granted Sep 16, 2014·3 cites·20 claims
- 2071US9640360B2Ion source and ion beam device using sameHITACHI HIGH TECH CORP·Filed 2012·Granted May 2, 2017·2 cites·11 claims
- 2166US7566872B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2006·Granted Jul 28, 2009·1 cites·8 claims
- 2264US12400823B2Electron source, method of manufacturing the same, and electron beam apparatus using the sameHITACHI HIGH TECH CORP·Filed 2020·Granted Aug 26, 2025·0 cites·15 claims
- 2363US8779380B2Ion beam deviceSHICHI HIROYASU·Filed 2009·Granted Jul 15, 2014·0 cites·4 claims
- 2461US9508521B2Ion beam deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Nov 29, 2016·0 cites·17 claims
- 2560US8698080B2Scanning electron microscopeARAI NORIAKI·Filed 2008·Granted Apr 15, 2014·0 cites·10 claims
- 2658US12469664B2Charged particle gun and charged particle beam systemHITACHI HIGH TECH CORP·Filed 2020·Granted Nov 11, 2025·0 cites·14 claims
- 2757US12494338B2Electron source, electron beam device, and method for manufacturing electron sourceHITACHI HIGH TECH CORP·Filed 2019·Granted Dec 9, 2025·0 cites·8 claims
- 2857US6979821B2Scanning electron microscopeHITACHI LTD·Filed 2003·Granted Dec 27, 2005·2 cites·4 claims
- 2957US2017076902A1Ion beam deviceHITACHI HIGH TECH CORP·Filed 2016·Application pending·0 cites
- 3055US2025316438A1Field emission electron source, method of producing same, and electron beam device using sameHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 3155US2022234007A1Functional composite membranes for chromatography and catalysisCALIFORNIA INST OF TECHN·Filed 2021·Application pending·0 cites
- 3253US2024203682A1Ion beam device and emitter tip milling methodHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 3351US11322329B2Electron source, method for manufacturing the same, and electron beam device using the sameHITACHI HIGH TECH CORP·Filed 2018·Granted May 3, 2022·0 cites·11 claims
- 3449US2010181478A1Charged particle beam adjusting method and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2010·Application pending·0 cites
- 3548US2019126278A1Method of replacing liquid medium and flow channel device for the methodTOPPAN PRINTING CO LTD·Filed 2018·Application pending·0 cites
- 3647US10586674B2Field emission electron source, method for manufacturing same, and electron beam deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Mar 10, 2020·0 cites·11 claims
- 3746US2019085385A1Method and kit for target molecule detectionTOPPAN PRINTING CO LTD·Filed 2018·Application pending·0 cites
- 3844US2003122074A1Scanning electron microscopeHITACHI LTD·Filed 2003·Application pending·0 cites
- 3940US2012217391A1Charged particle microscopeSHICHI HIROYASU·Filed 2010·Application pending·0 cites
- 4037US8455841B2Ion microscopeSAHO NORIHIDE·Filed 2010·Granted Jun 4, 2013·0 cites·10 claims
- 4137US2012132802A1Gas field ionization ion source apparatus and scanning charged particle microscope equipped with sameARAI NORIAKI·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →