Inventor · disambiguated record
Noam Dotan
Also filed as: DOTAN NOAM
25 granted patents·1 pending application·950 citations·filing 1991–2021
97Inventor score
Files withAPPLIED MATERIALS INC7NEGEVTECH LTD7APPLIED MATERIALS SOUTH EAST A3COMET-ME LTD3APPLIED MATERIALS SEA PTE LTD2
Top patents by PatentIndex Score
26 records- 0197US6407373B1Apparatus and method for reviewing defects on an objectAPPLIED MATERIALS INC·Filed 1999·Granted Jun 18, 2002·206 cites·26 claims
- 0296US6353222B1Determining defect depth and contour information in wafer structures using multiple SEM imagesAPPLIED MATERIALS INC·Filed 1998·Granted Mar 5, 2002·127 cites·5 claims
- 0396US5659172AReliable defect detection using multiple perspective scanning electron microscope imagesOPAL TECHNOLOGIES LTD·Filed 1996·Granted Aug 19, 1997·157 cites·17 claims
- 0493US7633041B2Apparatus for determining optimum position of focus of an imaging systemAPPLIED MATERIALS SOUTH EAST A·Filed 2006·Granted Dec 15, 2009·20 cites·10 claims
- 0592US7274444B2Multi mode inspection method and apparatusNEGEVTECH LTD·Filed 2005·Granted Sep 25, 2007·17 cites·32 claims
- 0691US7961763B2System for detection of wafer defectsAPPLIED MATERIALS SEA PTE LTD·Filed 2006·Granted Jun 14, 2011·14 cites·6 claims
- 0789US7180586B2System for detection of wafer defectsNEGEVTECH LTD·Filed 2004·Granted Feb 20, 2007·29 cites·12 claims
- 0888US6521891B1Focusing method and systemAPPLIED MATERIALS INC·Filed 1999·Granted Feb 18, 2003·59 cites·30 claims
- 0987US6892013B2Fiber optical illumination systemNEGEVTECH LTD·Filed 2003·Granted May 10, 2005·32 cites·14 claims
- 1085US7843559B2System for detection of wafer defectsAPPLIED MATERIALS SEA PTE LTD·Filed 2006·Granted Nov 30, 2010·7 cites·16 claims
- 1185US6201240B1SEM image enhancement using narrow band detection and color assignmentAPPLIED MATERIALS INC·Filed 1998·Granted Mar 13, 2001·62 cites·24 claims
- 1281US7477383B2System for detection of wafer defectsNEGEVTECH LTD·Filed 2006·Granted Jan 13, 2009·5 cites·15 claims
- 1381US6407386B1System and method for automatic analysis of defect material on semiconductorsAPPLIED MATERIALS INC·Filed 1999·Granted Jun 18, 2002·59 cites·16 claims
- 1478US5216479AOptical inspection system for distinguishing between first and second components in a laminateOPTROTECH LTD·Filed 1991·Granted Jun 1, 1993·48 cites·18 claims
- 1576US7525659B2System for detection of water defectsNEGEVTECH LTD·Filed 2003·Granted Apr 28, 2009·13 cites·3 claims
- 1674US7813541B2Method and apparatus for detecting defects in wafersAPPLIED MATERIALS SOUTH EAST A·Filed 2005·Granted Oct 12, 2010·9 cites·15 claims
- 1773US6627886B1Secondary electron spectroscopy method and systemAPPLIED MATERIALS INC·Filed 1999·Granted Sep 30, 2003·24 cites·11 claims
- 1870US6194718B1Method for reducing aliasing effects in scanning beam microscopyAPPLIED MATERIALS INC·Filed 1998·Granted Feb 27, 2001·20 cites·17 claims
- 1965US10753355B2Borehole pump and method of using the sameCOMET-ME LTD·Filed 2018·Granted Aug 25, 2020·1 cites·22 claims
- 2064US5771068AApparatus and method for display panel inspectionORBOTECH LTD·Filed 1995·Granted Jun 23, 1998·27 cites·14 claims
- 2161US7804590B2Multi mode inspection method and apparatusAPPLIED MATERIALS SOUTH EAST A·Filed 2008·Granted Sep 28, 2010·0 cites·12 claims
- 2258US7480039B2Multi mode inspection method and apparatusNEGEVTECH LTD·Filed 2007·Granted Jan 20, 2009·0 cites·12 claims
- 2353US11289973B2Borehole pump and method of using the sameCOMET ME LTD·Filed 2020·Granted Mar 29, 2022·0 cites·19 claims
- 2450US6215895B1Apparatus and method for display panel inspectionORBOTECH LTD·Filed 1998·Granted Apr 10, 2001·14 cites·12 claims
- 2542US2006012781A1Programmable spatial filter for wafer inspectionNEGEVTECH LTD·Filed 2004·Application pending·0 cites
- 2640US11692537B2Method and system for damping flow pulsationCOMET ME LTD·Filed 2021·Granted Jul 4, 2023·0 cites·15 claims
Join the waitlist — get patent alerts
Get an alert when Noam Dotan files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →