Inventor · disambiguated record
Norio Ishitsuka
Also filed as: ISHITSUKA NORIO
36 granted patents·8 pending applications·554 citations·filing 1991–2023
97Inventor score
Files withHITACHI LTD15HITACHI AUTOMOTIVE SYSTEMS LTD10RENESAS TECH CORP8ISHITSUKA NORIO3ELPIDA MEMORY INC1
Top patents by PatentIndex Score
44 records- 0198US6090684AMethod for manufacturing semiconductor deviceHITACHI LTD·Filed 1999·Granted Jul 18, 2000·283 cites·3 claims
- 0288US8035169B2Semiconductor device with suppressed crystal defects in active areasRENESAS ELECTRONICS CORP·Filed 2008·Granted Oct 11, 2011·18 cites·19 claims
- 0383US6559027B2Semiconductor device and process for producing the smeHITACHI LTD·Filed 2001·Granted May 6, 2003·26 cites·7 claims
- 0480US10775215B2Flow meterHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2016·Granted Sep 15, 2020·2 cites·10 claims
- 0577US5229643ASemiconductor apparatus and semiconductor packageHITACHI LTD·Filed 1991·Granted Jul 20, 1993·54 cites·26 claims
- 0676US9523595B2Method of manufacturing thermal flow meterHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2014·Granted Dec 20, 2016·4 cites·4 claims
- 0775US10386216B2Thermal type air flow sensorHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2013·Granted Aug 20, 2019·4 cites·18 claims
- 0874US7279769B2Semiconductor device and manufacturing method thereofRENESAS TECH CORP·Filed 2005·Granted Oct 9, 2007·4 cites·15 claims
- 0972US6881646B2Semiconductor device and process for producing the sameHITACHI ULSI SYS CO LTD·Filed 2003·Granted Apr 19, 2005·13 cites·21 claims
- 1071US7674668B2Method of manufacturing a semiconductor deviceRENESAS TECH CORP·Filed 2007·Granted Mar 9, 2010·3 cites·8 claims
- 1171US6403446B1Method for manufacturing semiconductor deviceHITACHI LTD·Filed 2000·Granted Jun 11, 2002·13 cites·8 claims
- 1270US6242323B1Semiconductor device and process for producing the sameHITACHI LTD·Filed 1998·Granted Jun 5, 2001·28 cites·23 claims
- 1369US6635945B1Semiconductor device having element isolation structureHITACHI LTD·Filed 2000·Granted Oct 21, 2003·14 cites·5 claims
- 1466US7084477B2Semiconductor device and manufacturing method of the sameTRECENTI TECHNOLOGIES INC·Filed 2003·Granted Aug 1, 2006·11 cites·12 claims
- 1564US6348396B1Semiconductor device and production thereofHITACHI LTD·Filed 2000·Granted Feb 19, 2002·12 cites·2 claims
- 1663US11112287B2Physical quantity measurement deviceHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2019·Granted Sep 7, 2021·0 cites·12 claims
- 1762US11892333B2Flow-rate measuring deviceHITACHI ASTEMO LTD·Filed 2020·Granted Feb 6, 2024·0 cites·14 claims
- 1861US7982266B2Dielectric material separated-type, high breakdown voltage semiconductor circuit device, and production method thereofHITACHI LTD·Filed 2007·Granted Jul 19, 2011·3 cites·9 claims
- 1961US7402473B2Semiconductor device and process for producing the sameRENESAS TECH CORP·Filed 2005·Granted Jul 22, 2008·1 cites·6 claims
- 2059US2017322062A1Thermal Air Flow SensorHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2017·Application pending·0 cites
- 2158US7244643B2Semiconductor device and manufacturing method thereofHITACHI LTD·Filed 2002·Granted Jul 17, 2007·8 cites·11 claims
- 2255US6720234B2Semiconductor integrated circuit device and method of manufacturing involving the scale-down width of shallow groove isolation using round processingHITACHI LTD·Filed 2003·Granted Apr 13, 2004·5 cites·28 claims
- 2354US11268841B2Semiconductor element and flow rate measurement device using sameHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2018·Granted Mar 8, 2022·0 cites·18 claims
- 2454US7141840B2Semiconductor device and production method thereforRENESAS TECH CORP·Filed 2003·Granted Nov 28, 2006·4 cites·2 claims
- 2554US6544839B1Semiconductor integrated circuit device and a method of manufacturing the sameHITACHI LTD·Filed 1999·Granted Apr 8, 2003·10 cites·8 claims
- 2652US6858515B2Process for producing semiconductor device and semiconductor device produced therebyRENESAS TECH CORP·Filed 2003·Granted Feb 22, 2005·4 cites·4 claims
- 2752US6326255B1Semiconductor deviceHITACHI LTD·Filed 2000·Granted Dec 4, 2001·4 cites·3 claims
- 2852US2025247011A1Power conversion deviceHITACHI LTD·Filed 2023·Application pending·0 cites
- 2951US6284625B1Method of forming a shallow groove isolation structureHITACHI LTD·Filed 1999·Granted Sep 4, 2001·14 cites·7 claims
- 3050US6562695B1Semiconductor integrated circuit device and method of manufacturing involving the scale-down width of shallow groove isolation using round processingHITACHI LTD·Filed 1999·Granted May 13, 2003·12 cites·35 claims
- 3149US9719824B2Thermal air flow sensorHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2013·Granted Aug 1, 2017·0 cites·5 claims
- 3249US2010140711A1Semiconductor device and manufacturing method thereofRENESAS TECH CORP·Filed 2009·Application pending·0 cites
- 3348US9945706B2Thermal-type air flow meterHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2014·Granted Apr 17, 2018·0 cites·5 claims
- 3448US7524729B2Method of manufacturing a semiconductor integrated circuit device having a trenchRENESAS TECH CORP·Filed 2005·Granted Apr 28, 2009·0 cites·46 claims
- 3547US2009029524A1Method of manufacturing a semiconductor integrated circuit device having a trenchKANAMITSU KENJI·Filed 2008·Application pending·0 cites
- 3645US9766106B2Thermal air flow sensorISHITSUKA NORIO·Filed 2011·Granted Sep 19, 2017·0 cites·4 claims
- 3743US10928232B2Thermal air flow meterHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2015·Granted Feb 23, 2021·0 cites·9 claims
- 3842US8723287B2Thermal airlflow sensorISHITSUKA NORIO·Filed 2011·Granted May 13, 2014·0 cites·7 claims
- 3942US7397104B2Semiconductor integrated circuit device and a method of manufacturing the sameELPIDA MEMORY INC·Filed 2004·Granted Jul 8, 2008·0 cites·13 claims
- 4042US2020248811A1Seal StructureHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2018·Application pending·0 cites
- 4141US6967141B2Method of manufacturing a semiconductor integrated circuit device having a trenchRENESAS TECH CORP·Filed 2004·Granted Nov 22, 2005·0 cites·13 claims
- 4240US2006214254A1Semiconductor device and manufacturing method of the sameISHITSUKA NORIO·Filed 2006·Application pending·0 cites
- 4339US2003119276A1Semiconductor device and process for producing the sameFiled 2002·Application pending·0 cites
- 4438US2003038337A1Semiconductor integrated circuit device and a method of manufacturing the sameFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →