Inventor · disambiguated record
Noam Knoll
Also filed as: KNOLL NOAM
2 granted patents·304 citations·filing 1993–2004
74Inventor score
Technology areasG03F
Top patents by PatentIndex Score
2 records- 0197US7242477B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2004·Granted Jul 10, 2007·124 cites·20 claims
- 0296US5438413AProcess for measuring overlay misregistration during semiconductor wafer fabricationKLA INSTR CORP·Filed 1993·Granted Aug 1, 1995·180 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →