Inventor · disambiguated record
Oded Kaminsky
Also filed as: KAMINSKY ODED
2 granted patents·6 citations·filing 2016–2016
49Inventor score
Top patents by PatentIndex Score
2 records- 0181US10831108B2Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrologyKLA CORP·Filed 2016·Granted Nov 10, 2020·5 cites·77 claims
- 0271US10197922B2Focus metrology and targets which utilize transformations based on aerial images of the targetsKLA TENCOR CORP·Filed 2016·Granted Feb 5, 2019·1 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →