Inventor · disambiguated record
Ofir Sharoni
Also filed as: SHARONI OFIR
6 granted patents·19 citations·filing 2008–2016
76Inventor score
Top patents by PatentIndex Score
6 records- 0192US10061192B2Method and apparatus for correcting errors on a wafer processed by a photolithographic maskZEISS CARL SMT GMBH·Filed 2016·Granted Aug 28, 2018·6 cites·23 claims
- 0287US9436080B2Method and apparatus for correcting errors on a wafer processed by a photolithographic maskBEYER DIRK·Filed 2011·Granted Sep 6, 2016·9 cites·19 claims
- 0369US9207530B2Analyses of measurement dataDMITRIEV VLADIMIR·Filed 2011·Granted Dec 8, 2015·2 cites·46 claims
- 0462US9134112B2Critical dimension uniformity correction by scanner signature controlSHARONI OFIR·Filed 2011·Granted Sep 15, 2015·2 cites·25 claims
- 0544US8592770B2Method and apparatus for DUV transmission mappingBEN-ZVI GUY·Filed 2008·Granted Nov 26, 2013·0 cites·12 claims
- 0639US8869076B2Global landmark method for critical dimension uniformity reconstructionDMITRIEV VLADIMIR·Filed 2011·Granted Oct 21, 2014·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →