Inventor · disambiguated record
Paul L. Pfaff
Also filed as: PFAFF PAUL · PFAFF PAUL L
19 granted patents·3 pending applications·499 citations·filing 2000–2018
96Inventor score
Top patents by PatentIndex Score
22 records- 0198US8405823B2Optical to optical infrared imaging detection systemPFAFF PAUL L·Filed 2011·Granted Mar 26, 2013·68 cites·11 claims
- 0298US7728958B2Condition assessment method for a structure including a semiconductor materialATTOFEMTO INC·Filed 2007·Granted Jun 1, 2010·40 cites·27 claims
- 0397US7420687B2Condition assessment system for a structure including a semiconductor materialATTOFEMTO INC·Filed 2006·Granted Sep 2, 2008·32 cites·34 claims
- 0497US6803777B2Voltage testing and measurementFiled 2002·Granted Oct 12, 2004·88 cites·8 claims
- 0596US6512385B1Method for testing a device under test including the interference of two beamsPFAFF PAUL·Filed 2000·Granted Jan 28, 2003·93 cites·8 claims
- 0695US8736823B2Methods and processes for optical interferometric or holographic test in the development, evaluation, and manufacture of semiconductor and free-metal devices utilizing anisotropic and isotropic materialsPFAFF PAUL L·Filed 2013·Granted May 27, 2014·10 cites·21 claims
- 0795US8040521B2Holographic condition assessment system for a structure including a semiconductor materialATTOFEMTO INC·Filed 2009·Granted Oct 18, 2011·20 cites·37 claims
- 0895US7323889B2Voltage testing and measurementATTOFEMTO INC·Filed 2005·Granted Jan 29, 2008·24 cites·7 claims
- 0993US8462350B2Optically enhanced holographic interferometric testing methods for the development and evaluation of semiconductor devices, materials, wafers, and for monitoring all phases of development and manufacturePFAFF PAUL L·Filed 2012·Granted Jun 11, 2013·14 cites·34 claims
- 1093US7773230B2Interferometric condition assessment system for a microelectronic structure including a semiconductor or free-metal materialATTOFEMTO INC·Filed 2008·Granted Aug 10, 2010·14 cites·26 claims
- 1192US7400411B2Method for optically testing semiconductor devicesATTOFEMTO INC·Filed 2006·Granted Jul 15, 2008·20 cites·8 claims
- 1290US8139228B2Methods for optically enhanced holographic interferometric testing for test and evaluation of semiconductor devices and materialsPFAFF PAUL L·Filed 2010·Granted Mar 20, 2012·10 cites·32 claims
- 1389US9366719B2Optical to optical methods enhancing the sensitivity and resolution of ultraviolet, electron beam and ion beam devicesATTOFEMTO INC·Filed 2013·Granted Jun 14, 2016·4 cites·22 claims
- 1486US7733499B2Method for optically testing semiconductor devicesATTOFEMTO INC·Filed 2008·Granted Jun 8, 2010·10 cites·16 claims
- 1584US6972577B2Voltage testing and measurementPFAFF PAUL·Filed 2003·Granted Dec 6, 2005·18 cites·1 claims
- 1683US9250064B2Multiple beam transmission interferometric testing methods for the development and evaluation of subwavelength sized features within semiconductor and anisotropic devicesATTOFEMTO INC·Filed 2014·Granted Feb 2, 2016·4 cites·20 claims
- 1783US8879071B2Multiple optical wavelength interferometric testing methods for the development and evaluation of subwavelength sized features within semiconductor devices and materials, wafers, and monitoring all phases of development and manufactureATTOFEMTO INC·Filed 2013·Granted Nov 4, 2014·4 cites·36 claims
- 1879US7206078B2Non-destructive testing system using a laser beamATTOFEMTO INC·Filed 2003·Granted Apr 17, 2007·24 cites·10 claims
- 1978US9952161B2Methods for obtaining and analyzing digital interferometric data for computer testing and developing semiconductor and anisotropic devices and materialsATTOFEMTO INC·Filed 2015·Granted Apr 24, 2018·2 cites·3 claims
- 2066US2016291088A1Advanced 4-dimensional signal and device testing using circuit-state recognitionATTOFEMTO INC·Filed 2016·Application pending·0 cites
- 2152US2018246045A1Optical methods for obtaining digital data to be used in determining, shaping or testing of semiconductor or anisotropic materials, or devices, under test through all stages of manufacture or developmentATTOFEMTO INC·Filed 2018·Application pending·0 cites
- 2237US2003067312A1Voltage testing and measurementFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →