Inventor · disambiguated record
Peter Andrews
Also filed as: ANDREWS PETER · ANDREWS PETER D · ANDREWS PETER DOUGLAS
12 granted patents·2 pending applications·401 citations·filing 1992–2025
92Inventor score
Top patents by PatentIndex Score
14 records- 0196US7187188B2Chuck with integrated wafer supportCASCADE MICROTECH INC·Filed 2004·Granted Mar 6, 2007·90 cites·19 claims
- 0296US5345170AWafer probe station having integrated guarding, Kelvin connection and shielding systemsCASCADE MICROTECH INC·Filed 1992·Granted Sep 6, 1994·166 cites·7 claims
- 0392US7362115B2Chuck with integrated wafer supportCASCADE MICROTECH INC·Filed 2007·Granted Apr 22, 2008·20 cites·19 claims
- 0490US5434512AWafer probe station having integrated guarding, Kelvin connection and shielding systemsCASCADE MICROTECH INC·Filed 1994·Granted Jul 18, 1995·73 cites·2 claims
- 0588US7656172B2System for testing semiconductorsCASCADE MICROTECH INC·Filed 2006·Granted Feb 2, 2010·17 cites·12 claims
- 0682US7940069B2System for testing semiconductorsCASCADE MICROTECH INC·Filed 2009·Granted May 10, 2011·10 cites·10 claims
- 0782US7535247B2Interface for testing semiconductorsCASCADE MICROTECH INC·Filed 2006·Granted May 19, 2009·11 cites·14 claims
- 0882US2025327836A1Probes, probe blades, tools for probe blades, blade holders, and probe systems for electrically testing a device under testFORMFACTOR INC·Filed 2025·Application pending·0 cites
- 0977US12379395B2Probes, probe blades, tools for probe blades, blade holders, and probe systems for electrically testing a device under testFORMFACTOR INC·Filed 2024·Granted Aug 5, 2025·0 cites·24 claims
- 1077US7898281B2Interface for testing semiconductorsCASCADE MIRCOTECH INC·Filed 2008·Granted Mar 1, 2011·10 cites·12 claims
- 1176US10365323B2Probe systems and methods for automatically maintaining alignment between a probe and a device under test during a temperature changeCASCADE MICROTECH INC·Filed 2016·Granted Jul 30, 2019·2 cites·20 claims
- 1260US7688091B2Chuck with integrated wafer supportCASCADE MICROTECH INC·Filed 2008·Granted Mar 30, 2010·2 cites·19 claims
- 1338US2006169897A1Microscope system for testing semiconductorsCASCADE MICROTECH INC·Filed 2006·Application pending·0 cites
- 1437US9435858B2Focusing optical systems and methods for testing semiconductorsANDREWS PETER·Filed 2011·Granted Sep 6, 2016·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →