Inventor · disambiguated record
Pei Cheng Fan
Also filed as: FAN PEI · FAN PEI CHENG
12 granted patents·2 pending applications·4 citations·filing 2008–2024
82Inventor score
Top patents by PatentIndex Score
14 records- 0194US11881446B2Semiconductor device with composite middle interconnectorsNANYA TECHNOLOGY CORP·Filed 2021·Granted Jan 23, 2024·4 cites·9 claims
- 0280US12381137B2Semiconductor device with composite middle interconnectorsNANYA TECHNOLOGY CORP·Filed 2024·Granted Aug 5, 2025·0 cites·7 claims
- 0376US12113003B2Semiconductor device with composite middle interconnectorsNANYA TECHNOLOGY CORP·Filed 2023·Granted Oct 8, 2024·0 cites·4 claims
- 0473US2025006767A1Optical semiconductor device with integrated vias implementing inter-die connectionNANYA TECHNOLOGY CORP·Filed 2024·Application pending·0 cites
- 0565US11764108B2Method for preparing semiconductor die structure with air gapsNANYA TECHNOLOGY CORP·Filed 2021·Granted Sep 19, 2023·0 cites·6 claims
- 0664US11605540B2Method for preparing semiconductor device structure with fine boron nitride spacer patternsNANYA TECHNOLOGY CORP·Filed 2022·Granted Mar 14, 2023·0 cites·8 claims
- 0763US11462406B2Semiconductor device structure with fine boron nitride spacer patterns and method for forming the sameNANYA TECHNOLOGY CORP·Filed 2020·Granted Oct 4, 2022·0 cites·11 claims
- 0862US12119365B2Optical semiconductor device with integrated vias implementing inter-die connectionNANYA TECHNOLOGY CORP·Filed 2021·Granted Oct 15, 2024·0 cites·15 claims
- 0961US11270908B2Semiconductor die structure with air gaps and method for preparing the sameNANYA TECHNOLOGY CORP·Filed 2020·Granted Mar 8, 2022·0 cites·14 claims
- 1048US9069253B2Mask structureNANYA TECHNOLOGY CORP·Filed 2013·Granted Jun 30, 2015·0 cites·8 claims
- 1146US11413608B2Method for preparing bi-component, multi-network nanofibrous aerogel-supported heterojunction photocatalyst and application thereofNANJING UNIVERSITY OF TECHNOLOGY·Filed 2020·Granted Aug 16, 2022·0 cites·18 claims
- 1244US7651824B1Method for compensating critical dimension variations in photomasksNANYA TECHNOLOGY CORP·Filed 2008·Granted Jan 26, 2010·0 cites·7 claims
- 1335US2012244459A1Method for evaluating overlay error and mask for the sameCHOU KUAN TING·Filed 2011·Application pending·0 cites
- 1426US8430219B2Power acquisition equipment for a gantry craneXIANG AIGUO·Filed 2009·Granted Apr 30, 2013·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →