Inventor · disambiguated record
Peter Wang
Also filed as: WANG PETER · WANG PETER S · WANG PETER SHUN SHEN
13 granted patents·4 pending applications·638 citations·filing 1993–2023
92Inventor score
Files withANG TECHNOLOGIES INC2INST OF MICROELECTRONICS2SILICONIX INC2WANG PETER SHUN SHEN2APPLIED MATERIALS INC1
Top patents by PatentIndex Score
17 records- 0194US5467271AMapping and analysis system for precision farming applicationsTRW INC·Filed 1993·Granted Nov 14, 1995·423 cites·47 claims
- 0290US6344688B1Very thin multi-chip package and method of mass producing the sameINST OF MICROELECTRONICS·Filed 2000·Granted Feb 5, 2002·55 cites·9 claims
- 0382US7394150B2Semiconductor package including die interposed between cup-shaped lead frame and lead frame having mesas and valleysSILICONIX INC·Filed 2004·Granted Jul 1, 2008·35 cites·17 claims
- 0482US7238551B2Method of fabricating semiconductor package including die interposed between cup-shaped lead frame having mesas and valleysSILICONIX INC·Filed 2004·Granted Jul 3, 2007·37 cites·18 claims
- 0580US8586419B2Semiconductor packages including die and L-shaped lead and method of manufactureJAUNAY SERGE·Filed 2010·Granted Nov 19, 2013·9 cites·16 claims
- 0678US6026564AMethod of making a high density multilayer wiring boardANG TECHNOLOGIES INC·Filed 1998·Granted Feb 22, 2000·50 cites·6 claims
- 0774US11256762B1System and method for efficiently determining and displaying optimal packages of data itemsPALANTIR TECHNOLOGIES INC·Filed 2017·Granted Feb 22, 2022·2 cites·15 claims
- 0865US6437436B2Integrated circuit chip package with test pointsANG TECHNOLOGIES INC·Filed 2001·Granted Aug 20, 2002·15 cites·8 claims
- 0953US8188759B2Dry high potential tester and solar simulator toolWANG PETER·Filed 2009·Granted May 29, 2012·1 cites·7 claims
- 1053US2024405022A1Non-planar transistor structures and methods of manufacturing thereofTOKYO ELECTRON LTD·Filed 2023·Application pending·0 cites
- 1147US12117810B2AI-based determination of action plan for manufacturing component carriersAT & S AUSTRIA TECH & SYSTEMTECHNIK AG·Filed 2021·Granted Oct 15, 2024·0 cites·16 claims
- 1247US2011140726A1Apparatus and Methods for Measuring Solar Cell Module PerformanceAPPLIED MATERIALS INC·Filed 2010·Application pending·0 cites
- 1346US6100113AVery thin multi-chip-package and method of mass producing the sameINST OF MICROELECTRONICS·Filed 1998·Granted Aug 8, 2000·11 cites·13 claims
- 1446US2025209193A1System and method for optimized metric displaySALESFORCE INC·Filed 2023·Application pending·0 cites
- 1544US11293979B2Method of and an arrangement for analyzing manufacturing defects of multi-chip modules made without known good dieWANG PETER SHUN SHEN·Filed 2020·Granted Apr 5, 2022·0 cites·21 claims
- 1641US7336340B2Method of exposure error adjustment in photolithography for multiple productsPROMOS TECHNOLOGIES INC·Filed 2004·Granted Feb 26, 2008·0 cites·17 claims
- 1740US2021333326A1Switch-Mode Based Interposer Enabling Self-Testing Of An MCM Without Known Good DieWANG PETER SHUN SHEN·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →