Inventor · disambiguated record
Peter West
Also filed as: WEST PETER · WEST PETER M
14 granted patents·4 pending applications·302 citations·filing 1979–2021
91Inventor score
Files withPOLAR SEMICONDUCTOR LLC9ADLER MICHAEL J1GOLDIE DAVID J1NORMANDEAU ASSOCIATES INC1OWEN MUMFORD LTD1
Top patents by PatentIndex Score
18 records- 0183US9899343B2High voltage tolerant bonding pad structure for trench-based semiconductor devicesPOLAR SEMICONDUCTOR LLC·Filed 2016·Granted Feb 20, 2018·5 cites·21 claims
- 0283US8379486B2System and method for detecting bats and their impact on wind facilitiesNORMANDEAU ASSOCIATES INC·Filed 2009·Granted Feb 19, 2013·19 cites·33 claims
- 0377US10580861B2Trench semiconductor device layout configurationsPOLAR SEMICONDUCTOR LLC·Filed 2018·Granted Mar 3, 2020·2 cites·9 claims
- 0476US6804809B1System and method for defining a semiconductor device layoutPOLARFAB LLC·Filed 2002·Granted Oct 12, 2004·33 cites·23 claims
- 0573US9818828B2Termination trench structures for high-voltage split-gate MOS devicesPOLAR SEMICONDUCTOR LLC·Filed 2016·Granted Nov 14, 2017·2 cites·26 claims
- 0670US6993167B1System and method for examining, recording and analyzing dermatological conditionsPOLARTECHNICS LTD·Filed 1999·Granted Jan 31, 2006·204 cites·50 claims
- 0765US4683836AAirbrush guidance systemWEST PETER·Filed 1986·Granted Aug 4, 1987·25 cites·11 claims
- 0861US11245006B2Trench semiconductor device layout configurationsPOLAR SEMICONDUCTOR LLC·Filed 2019·Granted Feb 8, 2022·0 cites·20 claims
- 0960USD992729SSyringeOWEN MUMFORD LTD·Filed 2021·Granted Jul 18, 2023·3 cites·1 claims
- 1060US8654612B2System and method for detecting bats and their impact on wind facilitiesADLER MICHAEL J·Filed 2012·Granted Feb 18, 2014·2 cites·33 claims
- 1148US12015079B2Transistor with single termination trench having depth more than 10 micronsPOLAR SEMICONDUCTOR LLC·Filed 2021·Granted Jun 18, 2024·0 cites·17 claims
- 1248US2016247879A1Trench semiconductor device layout configurationsPOLAR SEMICONDUCTOR LLC·Filed 2016·Application pending·0 cites
- 1345US2011037069A1Method and apparatus for visually determining etch depthPOLAR SEMICONDUCTOR INC·Filed 2009·Application pending·0 cites
- 1441US11662417B2Active marker device and method of design thereofOXFORD METRICS PLC·Filed 2019·Granted May 30, 2023·0 cites·7 claims
- 1537US10896885B2High-voltage MOSFET structuresPOLAR SEMICONDUCTOR LLC·Filed 2017·Granted Jan 19, 2021·0 cites·19 claims
- 1634US2017194485A1Split-gate superjunction power transistorPOLAR SEMICONDUCTOR LLC·Filed 2016·Application pending·0 cites
- 1732US2019081147A1Mosfet with vertical variation of gate-pillar separationPOLAR SEMICONDUCTOR LLC·Filed 2017·Application pending·0 cites
- 1831US4251360AMethod and apparatus for the detection of a specific binding proteinGOLDIE DAVID J·Filed 1979·Granted Feb 17, 1981·7 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →