Inventor · disambiguated record
Phillip D. Burlison
Also filed as: BURLISON PHILLIP · BURLISON PHILLIP D
15 granted patents·516 citations·filing 1991–2008
94Inventor score
Technology areasG01R
Top patents by PatentIndex Score
15 records- 0194US6449741B1Single platform electronic testerLTX CORP·Filed 1998·Granted Sep 10, 2002·127 cites·11 claims
- 0289US5694063AHigh speed IDDQ monitor circuitLTX CORP·Filed 1996·Granted Dec 2, 1997·115 cites·19 claims
- 0388US6675339B1Single platform electronic testerLTX CORP·Filed 2001·Granted Jan 6, 2004·36 cites·5 claims
- 0487US6880137B1Dynamically reconfigurable precision signal delay test system for automatic test equipmentINOVYS·Filed 2002·Granted Apr 12, 2005·38 cites·15 claims
- 0584US7191368B1Single platform electronic testerLTX CORP·Filed 2001·Granted Mar 13, 2007·28 cites·10 claims
- 0680US7092837B1Single platform electronic testerLTX CORP·Filed 2003·Granted Aug 15, 2006·28 cites·4 claims
- 0780US5200696ATest system apparatus with Schottky diodes with programmable voltagesLTX CORP·Filed 1991·Granted Apr 6, 1993·57 cites·6 claims
- 0878US7650547B2Apparatus for locating a defect in a scan chain while testing digital logicVERIGY PTE LTD SINGAPORE·Filed 2007·Granted Jan 19, 2010·9 cites·6 claims
- 0977US7032145B1System for dynamic re-allocation of test pattern data for parallel and serial test data patternsINOVYS CORP·Filed 2002·Granted Apr 18, 2006·21 cites·38 claims
- 1076US7865788B2Dynamic mask memory for serial scan testingVERIGY PTE LTD SINGAPORE·Filed 2007·Granted Jan 4, 2011·8 cites·7 claims
- 1170US7013417B1Dynamically reconfigurable precision signal delay test system for automatic test equipmentINOVYS CORP·Filed 2004·Granted Mar 14, 2006·12 cites·25 claims
- 1267US8006149B2System and method for device performance characterization in physical and logical domains with AC SCAN testingVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Aug 23, 2011·5 cites·12 claims
- 1362US5552744AHigh speed IDDQ monitor circuitLTX CORP·Filed 1995·Granted Sep 3, 1996·26 cites·8 claims
- 1457US7114114B1Dynamically reconfigurable precision signal delay test system for automatic test equipmentINOVYS CORP·Filed 2004·Granted Sep 26, 2006·6 cites·25 claims
- 1536US8127186B2Methods and apparatus for estimating a position of a stuck-at defect in a scan chain of a device under testBURLISON PHILLIP D·Filed 2008·Granted Feb 28, 2012·0 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →