Inventor · disambiguated record
Po-Ching Hsu
Also filed as: HSU PO-CHING
17 granted patents·1 pending application·304 citations·filing 2002–2021
94Inventor score
Top patents by PatentIndex Score
18 records- 0196US7058869B2Method and apparatus for debug, diagnosis, and yield improvement of scan-based integrated circuitsSYNTEST TECHNOLOGIES INC·Filed 2004·Granted Jun 6, 2006·119 cites·34 claims
- 0294US7284175B2Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniquesSYNTEST TECHNOLOGIES INC·Filed 2006·Granted Oct 16, 2007·30 cites·27 claims
- 0393US7007213B2Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-testSYNTEST TECHNOLOGIES INC·Filed 2002·Granted Feb 28, 2006·52 cites·30 claims
- 0491US7191373B2Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniquesSYNTEST TECHNOLOGIES INC·Filed 2002·Granted Mar 13, 2007·48 cites·19 claims
- 0590US9046572B2Computer-aided design (CAD) multiple-capture DFT system for detecting or locating crossing clock-domain faultsSYNTEST TECHNOLOGIES INC·Filed 2013·Granted Jun 2, 2015·6 cites·32 claims
- 0686US7260756B1Multiple-capture DFT system for detecting or locating crossing clock-domain faults during scan-testSYNTEST TECHNOLOGIES INC·Filed 2005·Granted Aug 21, 2007·11 cites·79 claims
- 0783US9678156B2Multiple-capture DFT method for detecting or locating crossing clock-domain faults during self-test or scan-testSYNTEST TECH INC·Filed 2016·Granted Jun 13, 2017·3 cites·20 claims
- 0882US7434126B2Computer-aided design (CAD) multiple-capture DFT system for detecting or locating crossing clock-domain faultsSYNTEST TECHNOLOGIES INC·Filed 2007·Granted Oct 7, 2008·8 cites·7 claims
- 0978US7444567B2Method and apparatus for unifying self-test with scan-test during prototype debug and production testSYNTEST TECHNOLOGIES INC·Filed 2003·Granted Oct 28, 2008·17 cites·18 claims
- 1076US9057763B2Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-testSYNTEST TECHNOLOGIES INC·Filed 2013·Granted Jun 16, 2015·2 cites·98 claims
- 1176US9026875B2Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-testSYNTEST TECHNOLOGIES INC·Filed 2013·Granted May 5, 2015·2 cites·55 claims
- 1275US7779323B2Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-testSYNTEST TECHNOLOGIES INC·Filed 2008·Granted Aug 17, 2010·5 cites·21 claims
- 1368US8769359B2Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-testSYNTEST TECHNOLOGIES INC·Filed 2013·Granted Jul 1, 2014·1 cites·30 claims
- 1459US9316688B2Multiple-capture DFT system for detecting or locating crossing clock-domain faults during scan-testSYNTEST TECHNOLOGIES INC·Filed 2015·Granted Apr 19, 2016·0 cites·36 claims
- 1559US9274168B2Multiple-capture DFT system for detecting or locating crossing clock-domain faults during scan-testSYNTEST TECHNOLOGIES INC·Filed 2015·Granted Mar 1, 2016·0 cites·30 claims
- 1657US9091730B2Multiple-capture DFT system for detecting or locating crossing clock-domain faults during scan-testSYNTEST TECHNOLOGIES INC·Filed 2013·Granted Jul 28, 2015·0 cites·84 claims
- 1746US2022187426A1Distance detection system and distance detection methodPEGATRON CORP·Filed 2021·Application pending·0 cites
- 1832US8329517B2Pixel structure and method for manufacturing the sameHSU PO-CHING·Filed 2010·Granted Dec 11, 2012·0 cites·6 claims
Join the waitlist — get patent alerts
Get an alert when Po-Ching Hsu files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →