Inventor · disambiguated record
Prasanti Uppaluri
Also filed as: UPPALURI PRASANTI
15 granted patents·2 pending applications·71 citations·filing 2008–2024
89Inventor score
Top patents by PatentIndex Score
17 records- 0191US10267748B2Optimizing training sets used for setting up inspection-related algorithmsKLA TENCOR CORP·Filed 2017·Granted Apr 23, 2019·12 cites·20 claims
- 0291US8209656B1Pattern decomposition methodWANG XIAOJUN·Filed 2008·Granted Jun 26, 2012·30 cites·38 claims
- 0387US11676264B2System and method for determining defects using physics-based image perturbationsKLA CORP·Filed 2020·Granted Jun 13, 2023·3 cites·24 claims
- 0487US8397194B2Layout versus schematic error system and methodUPPALURI PRASANTI·Filed 2012·Granted Mar 12, 2013·16 cites·30 claims
- 0583US12299848B2Deep learning image denoising for semiconductor-based applicationsKLA CORP·Filed 2022·Granted May 13, 2025·1 cites·18 claims
- 0683US11379967B2Methods and systems for inspection of semiconductor structures with automatically generated defect featuresKLA CORP·Filed 2020·Granted Jul 5, 2022·2 cites·20 claims
- 0769US2025290878A1Dynamic inspection of highly defective wafersKLA CORP·Filed 2024·Application pending·0 cites
- 0865US8181137B2Layout versus schematic error system and methodUPPALURI PRASANTI·Filed 2008·Granted May 15, 2012·6 cites·24 claims
- 0963US10209628B2System and method for defect classification based on electrical design intentKLA TENCOR CORP·Filed 2016·Granted Feb 19, 2019·1 cites·40 claims
- 1059US11379969B2Method for process monitoring with optical inspectionsKLA CORP·Filed 2020·Granted Jul 5, 2022·0 cites·18 claims
- 1157US11410291B2System and method for generation of wafer inspection critical areasKLA CORP·Filed 2020·Granted Aug 9, 2022·0 cites·26 claims
- 1253US2025071419A1Recommender systems and methods for autonomous mode selection in inspection and other toolsKLA CORP·Filed 2024·Application pending·0 cites
- 1351US10670536B2Mode selection for inspectionKLA TENCOR CORP·Filed 2019·Granted Jun 2, 2020·0 cites·22 claims
- 1449US11114324B2Defect candidate generation for inspectionKLA CORP·Filed 2019·Granted Sep 7, 2021·0 cites·22 claims
- 1546US10706522B2System and method for generation of wafer inspection critical areasKLA TENCOR CORP·Filed 2016·Granted Jul 7, 2020·0 cites·32 claims
- 1645US10620134B2Creating defect samples for array regionsKLA TENCOR CORP·Filed 2018·Granted Apr 14, 2020·0 cites·21 claims
- 1737US11237119B2Diagnostic methods for the classifiers and the defects captured by optical toolsKLA TENCOR CORP·Filed 2017·Granted Feb 1, 2022·0 cites·17 claims
Join the waitlist — get patent alerts
Get an alert when Prasanti Uppaluri files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →