Inventor · disambiguated record
Raghav Babulnath
Also filed as: BABULNATH RAGHAV
9 granted patents·2 pending applications·34 citations·filing 2014–2018
84Inventor score
Files withKLA TENCOR CORP11
Top patents by PatentIndex Score
11 records- 0189US9310320B2Based sampling and binning for yield critical defectsKLA TENCOR CORP·Filed 2014·Granted Apr 12, 2016·8 cites·33 claims
- 0288US10127652B2Defect detection and classification based on attributes determined from a standard reference imageKLA TENCOR CORP·Filed 2015·Granted Nov 13, 2018·9 cites·53 claims
- 0386US9865512B2Dynamic design attributes for wafer inspectionKLA TENCOR CORP·Filed 2014·Granted Jan 9, 2018·10 cites·33 claims
- 0480US9766187B2Repeater detectionKLA TENCOR CORP·Filed 2015·Granted Sep 19, 2017·2 cites·22 claims
- 0574US9996942B2Sub-pixel alignment of inspection to designKLA TENCOR CORP·Filed 2016·Granted Jun 12, 2018·3 cites·22 claims
- 0671US9835566B2Adaptive nuisance filterKLA TENCOR CORP·Filed 2016·Granted Dec 5, 2017·1 cites·27 claims
- 0765US9563943B2Based sampling and binning for yield critical defectsKLA TENCOR CORP·Filed 2016·Granted Feb 7, 2017·1 cites·19 claims
- 0853US2017103517A1Design Based Sampling and Binning for Yield Critical DefectsKLA TENCOR CORP·Filed 2016·Application pending·0 cites
- 0945US10620134B2Creating defect samples for array regionsKLA TENCOR CORP·Filed 2018·Granted Apr 14, 2020·0 cites·21 claims
- 1044US2015120220A1Detecting IC Reliability DefectsKLA TENCOR CORP·Filed 2014·Application pending·0 cites
- 1130US10712289B2Inspection for multiple process steps in a single inspection processKLA TENCOR CORP·Filed 2015·Granted Jul 14, 2020·0 cites·20 claims
Join the waitlist — get patent alerts
Get an alert when Raghav Babulnath files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →